Study of Thermal-Protective Multilayer Films on Flexible Substrate by ToF-SIMS and Rf-GDOES Depth Profiling

2019 ◽  
Vol 09 (01) ◽  
pp. 45-53
Author(s):  
凯 吕
Keyword(s):  
Flexible Substrate ◽  
Depth Profiling ◽  
Multilayer Films ◽  
Tof Sims

scholarly journals 3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling

2015 ◽  
Vol 7 (4) ◽  
pp. 2654-2659 ◽  
Author(s):  
James Bailey ◽  
Rasmus Havelund ◽  
Alexander G. Shard ◽  
Ian S. Gilmore ◽  
Morgan R. Alexander ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Multilayer Films ◽  
Tof Sims

scholarly journals Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling

2021 ◽  
Vol 27 (S1) ◽  
pp. 1564-1565
Author(s):  
Vincent Smentkowski ◽  
Shubhodeep Goswami ◽  
Felix Kollmer ◽  
Julia Zakel ◽  
Henrik Arlinghaus ◽  
...  
Keyword(s):  
Thin Film ◽  
Depth Profiling ◽  
Tof Sims

ToF-SIMS study of growth behavior in all-nanoparticle multilayer films using a novel indicator layer

2008 ◽  
Vol 255 (4) ◽  
pp. 977-980 ◽  
Author(s):  
Bo-Jung Chen ◽  
Yu-Sheng Yin ◽  
Yong-Chien Ling
Keyword(s):  
Multilayer Films ◽  
Growth Behavior ◽  
Tof Sims

Round-robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling

2017 ◽  
Vol 49 (11) ◽  
pp. 1057-1063 ◽  
Author(s):  
Kyung Joong Kim ◽  
Jong Shik Jang ◽  
Joe Bennett ◽  
David Simons ◽  
Mario Barozzi ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Layer Thickness ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Multilayer Films ◽  
Round Robin ◽  
Round Robin Test ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Depth Profiling of Organic Light-Emitting Diodes by ToF-SIMS Coupled with Wavelet–Principal Component Analysis

2019 ◽  
Vol 1 (7) ◽  
pp. 1821-1828 ◽  
Author(s):  
Céline Noël ◽  
Nunzio Tuccitto ◽  
Yan Busby ◽  
Manuel Auer-Berger ◽  
Antonino Licciardello ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Light Emitting Diodes ◽  
Depth Profiling ◽  
Principal Component ◽  
Component Analysis ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Tof Sims ◽  
Organic Light

TOF-SIMS depth profiling of SIMON

2003 ◽  
Vol 203-204 ◽  
pp. 441-444
Author(s):  
Ge Xin ◽  
Gui Dong ◽  
Chen Xu ◽  
Cha Liangzhen ◽  
O. Brox ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Tof Sims ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 190-193 ◽  
Author(s):  
Nimer Wehbe ◽  
Laurent Houssiau
Keyword(s):  
Vitamin C ◽  
Depth Profiling ◽  
Ion Beams ◽  
Tof Sims ◽  
Sims Depth Profiling

TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

2008 ◽  
Vol 393 (8) ◽  
pp. 1857-1861 ◽  
Author(s):  
J. Schnöller ◽  
R. Franz ◽  
C. Mitterer ◽  
H. Hutter
Keyword(s):  
Depth Profiling ◽  
Hard Coatings ◽  
Tof Sims ◽  
Sims Depth Profiling ◽  
Element Mapping
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