scholarly journals SLIP-LINE ANALYSIS FOR POWDER COMPRESSION

1969 ◽  
Vol 2 (2) ◽  
pp. 235-238
Author(s):  
RYUICHI AOKI ◽  
MASAYUKI SUZUKI
Keyword(s):  
Slip Line ◽  
Powder Compression ◽  
Line Analysis

Slip line analysis in Ni3Al by atomic force microscopy

1999 ◽  
Vol 41 (9) ◽  
pp. 945-950 ◽  
Author(s):  
C. Coupeau ◽  
J. Bonneville ◽  
B. Matterstock ◽  
J. Grilhé ◽  
J.-L. Martin
Keyword(s):  
Atomic Force Microscopy ◽  
Slip Line ◽  
Force Microscopy ◽  
Atomic Force ◽  
Line Analysis

scholarly journals Experimental and numerical slip line analysis of welded single-edge notched tension specimens

2016 ◽  
Vol 2 ◽  
pp. 1763-1770 ◽  
Author(s):  
Stijn Hertelé ◽  
Filip Van Gerven ◽  
Sameera Naib ◽  
Nenad Gubeljak ◽  
Wim De Waele
Keyword(s):  
Slip Line ◽  
Single Edge ◽  
Line Analysis

Thrust and slip line analysis of one track shoe

1982 ◽  
Vol 19 (3) ◽  
pp. 183-194 ◽  
Author(s):  
Tomio Ito ◽  
Mamoru Aoyama
Keyword(s):  
Slip Line ◽  
Line Analysis

Thrust and slip line analysis on a swamp shoe

1983 ◽  
Vol 20 (2) ◽  
pp. 75-86
Author(s):  
Mamoru Aoyama ◽  
Tomio Ito
Keyword(s):  
Slip Line ◽  
Line Analysis

A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

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