Quantitative Analysis of Trace Heavy Elements in Geological Samples Utilizing High-energy (116 keV) Synchrotron Radiation X-ray Fluorescence Analysis for Forensic Investigation

2011 ◽  
Vol 40 (11) ◽  
pp. 1310-1312 ◽  
Author(s):  
Willy Shun Kai Bong ◽  
Izumi Nakai ◽  
Shunsuke Furuya ◽  
Hiroko Suzuki ◽  
Yoshinari Abe ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Heavy Elements ◽  
Forensic Investigation ◽  
Geological Samples ◽  
X Ray

Micro-X-Ray Fluorescence Analysis on a Synchrotron Radiation Wiggler Beam Line

1991 ◽  
Vol 35 (B) ◽  
pp. 995-1000
Author(s):  
J.V. Gilfrich ◽  
E.F. Skelton ◽  
S.B. Qadri ◽  
N.E. Moulton ◽  
D.J. Nagel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
National Laboratory ◽  
Incident Beam ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Brookhaven National Laboratory ◽  
Beam Line ◽  
X Rays ◽  
X Ray ◽  
Electron Orbit

AbstractIt has been well established over recent years that synchrotron radiation possesses some unique features as a source of primary x-rays for x-ray fluorescence analysis. Advantage has been taken of the high intensity emanating from the bending magnets of storage rings to develop x-ray microprobes utilizing apertures or focussing optics, or both, to provide a beam spot at the specimen of the order of micrometers. The use of insertion devices wigglers and undulatora, can further increase the available intensity, especially for the high energy photons. Beam Line X-17C at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory, accepts the unmodified continuum radiation from a superconducting wiggler in the storage ring. Some initial XRF measurements have been made on this beam line using apertures in the 10 to 100 micrometer range. The fluorescent radiation was measured by an intrinsic Ge detector having an energy resolution of 300 eV at 15 kev, and located at 90° to the incident beam in the plane of the electron orbit. In samples containing many elements, detection limits of a few ppm were achieved with 100 μm beams.

Comparison of Dilution Strategies for Dealing with Unanalyzed Elements in X-Ray Fluorescence Analysis

1986 ◽  
Vol 30 ◽  
pp. 175-182
Author(s):  
Peter B. DeGroot
Keyword(s):  
Heavy Element ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Heavy Elements ◽  
Light Elements ◽  
Dilution Factor ◽  
High Dilution ◽  
X Ray ◽  
Correction Program ◽  
Theoretical Intensity

AbstractOne method of dealing with unanalyzed light elements in x-ray fluorescence analyses is to add a relatively large quantity of a diluent to the sample. The interelement effects on the measured radiation are then essentially all due to the diluent, and the effects of the unanalyzed elements are ignored. The general practice has been to use a diluent compound composed of light elements. The rationale for this is that light elements absorb the analyte radiation less strongly than heavy ones, leaving higher net intensity available after dilution. However, since absorption effects are greater with heavy elements, a smaller dilution factor can be used to reach the analyte concentration at which the effects of unanalyzed elements on the analyte radiation are negligible compared to diluent effects. In many cases, the smaller dilution factor almost exactly compensates for the increased absorption. There is essentially no intensity penalty for using a heavy element diluent. In fact, there are some advantages to doing so. The lower dilution factor with heavy elements can avoid problems with multiple dilutions or accurate weighing and homogeneous blending of very small quantities necessary to achieve high dilution factors. Significantly less continuum radiation is scattered from heavy element matrices, and signal-to-background ratio can be higher in some parts of the spectrum. With high energy analyte lines, heavy element dilution results in infinitely thick samples, simplifying sample preparation. Theoretical intensity calculations using the XRFll matrix correction program are used to predict the appropriate dilution factor for a range of analyte x-ray emission wavelengths with a variety of diluents. The results are verified experimentally.

Synchrotron Radiation X-Ray Fluorescence Analysis with a Crystal Spectrometer

1991 ◽  
Vol 35 (B) ◽  
pp. 1027-1033 ◽  
Author(s):  
Kazutaka Ohashi ◽  
Mamoru Takahashl ◽  
Yohichi Gohshi ◽  
Atsuo Iida ◽  
Shunji Eishimoto
Keyword(s):  
Synchrotron Radiation ◽  
High Efficiency ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Small Samples ◽  
High Energy Resolution ◽  
Present System ◽  
High Brightness ◽  
X Ray ◽  
Position Sensitive

AbstractA wavelength dispersive spectrometer which consists of a flat crystal analyser and a position sensitive proportional counter has been developed for X-ray fluorescence analysis using synchrotron radiation. The advantages of this spectrometer are high energy resolution, multielemental nature, and high efficiency, and these match well "with the high brightness synchrotron X-ray source. The minimum detection limits are of the order of ppm or pg. An application to elemental mapping has also been demonstrated. The present system is useful for practical analysis of small samples or small regions.

Quantitative Analysis Of X-Ray Images From Geological Materials

1990 ◽  
Vol 48 (2) ◽  
pp. 244-245
Author(s):  
J. M. Paque ◽  
R. Browning ◽  
P. L. King ◽  
P. Pianetta
Keyword(s):  
Quantitative Analysis ◽  
Bulk Composition ◽  
Principal Component ◽  
Analytical Description ◽  
Bulk Sample ◽  
Geological Samples ◽  
X Ray ◽  
Software And Hardware ◽  
And Storage ◽  
Insight Into

Geological samples typically contain many minerals (phases) with multiple element compositions. A complete analytical description should give the number of phases present, the volume occupied by each phase in the bulk sample, the average and range of composition of each phase, and the bulk composition of the sample. A practical approach to providing such a complete description is from quantitative analysis of multi-elemental x-ray images.With the advances in recent years in the speed and storage capabilities of laboratory computers, large quantities of data can be efficiently manipulated. Commercial software and hardware presently available allow simultaneous collection of multiple x-ray images from a sample (up to 16 for the Kevex Delta system). Thus, high resolution x-ray images of the majority of the detectable elements in a sample can be collected. The use of statistical techniques, including principal component analysis (PCA), can provide insight into mineral phase composition and the distribution of minerals within a sample.

X‐ray determination of the Debye temperature at high pressure using high‐energy synchrotron radiation

1990 ◽  
Vol 68 (6) ◽  
pp. 2719-2722 ◽  
Author(s):  
A. Matsumuro ◽  
M. Kobayashi ◽  
T. Kikegawa ◽  
M. Senoo
Keyword(s):  
High Pressure ◽  
Synchrotron Radiation ◽  
Debye Temperature ◽  
High Energy ◽  
X Ray
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