In-Situ Scanning Tunneling Microscopy of Semiconductor(n-TiO2)/Liquid Interfaces. A Role of Band Bending in Semiconductors
Keyword(s):
2005 ◽
Vol 109
(31)
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pp. 14917-14924
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2006 ◽
Vol 110
(7)
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pp. 3444-3446
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Keyword(s):
2002 ◽
Vol 106
(43)
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pp. 11264-11271
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1995 ◽
Vol 394
(1-2)
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pp. 177-185
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1991 ◽
Vol 316
(1-2)
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pp. 361-368
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