Compositional Segregation in a Cross Section of Wet Nafion Thin Film on a Platinum Surface

2019 ◽  
Vol 48 (1) ◽  
pp. 51-54 ◽  
Author(s):  
Masashi Harada ◽  
Kenji Kudo ◽  
Norifumi L. Yamada
Keyword(s):  
Thin Film ◽  
Cross Section ◽  
Platinum Surface ◽  
Compositional Segregation

The impact cross section of ErF3 centers in ZnS thin film

1988 ◽  
Vol 40-41 ◽  
pp. 786-787
Author(s):  
Baozhu Luo ◽  
Jiaqi Yu ◽  
Guozhu Zhong
Keyword(s):  
Thin Film ◽  
Cross Section ◽  
The Impact

Non-Destructive Assessment of Thin Film Stresses and Crystal Qualify of Silicon on Insulator Materials with Raman Spectroscopy

1990 ◽  
Vol 188 ◽  
Author(s):  
Ingrid De Wolf ◽  
Jan Vanhellemont ◽  
Herman E. Maes
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Raman Spectroscopy ◽  
Cross Section ◽  
Silicon Layer ◽  
Silicon On Insulator ◽  
Micro Raman Spectroscopy ◽  
Transmission Electron ◽  
Non Destructive ◽  
Zone Melt

ABSTRACTMicro Raman spectroscopy (RS) is used to study the crystalline quality and the stresses in the thin superficial silicon layer of Silicon-On-Insulator (SO) materials. Results are presented for SIMOX (Separation by IMplanted OXygen) and ZMR (Zone Melt Recrystallized) substrates. Both as implanted and annealed SIMOX structures are investigated. The results from the as implanted structures are correlated with spectroscopic ellipsometry (SE) and cross-section transmission electron microscopy (TEM) analyses on the same material. Residual stress in ZMR substrates is studied in low- and high temperature gradient regions.

Combined analysis of spatially resolved electronic structure and composition on a cross-section of a thin film Cu(In1-x Ga x )S2 solar cell

2009 ◽  
Vol 206 (5) ◽  
pp. 1017-1020 ◽  
Author(s):  
R. Mainz ◽  
F. Streicher ◽  
D. Abou-Ras ◽  
S. Sadewasser ◽  
R. Klenk ◽  
...  
Keyword(s):  
Thin Film ◽  
Electronic Structure ◽  
Solar Cell ◽  
Cross Section ◽  
Combined Analysis ◽  
Spatially Resolved

Nanosecond Imaging of Bubble Nucleation on a Microheater

2006 ◽  
Vol 128 (8) ◽  
pp. 734-734 ◽  
Author(s):  
C. Thomas Avedisian ◽  
Richard E. Cavicchi ◽  
Michael J. Tarlov
Keyword(s):  
Thin Film ◽  
Nd:Yag Laser ◽  
Nucleation And Growth ◽  
Bubble Nucleation ◽  
Frame Rate ◽  
Vapor Film ◽  
Platinum Surface ◽  
Local Reduction ◽  
Four Corners ◽  
Collapse Phase

These images show bubble nucleation and growth of a thin film heater (a platinum film 15 μm wide, 30 μm long and 0.2 μm thick) that is heated by an 11.8 volt pulse of 0.50 μs duration in subcooled water. Imaging is by illumination from a Nd:Yag laser (hence the green colored photographs) that produces an effective frame rate of 1.3×108 frames/s (the method is described in Avedisian et al. (2006) and Balss et al. (2005)). Time is relative to the first appearance of bubbles. In the early phase, bubbles are visible at the four corners of the platinum surface (58 ns) which grow laterally into a vapor film (142 ns) that covers the surface by 178 ns after which the bubble thickens and grows into the bulk (246 ns and beyond). The collapse phase (e.g., 3.5 μs to 3.8 μs) continues well after the heater pulse is turned off. Vapor completely disappears (3.65 μs) but then bubbles reappear (3.8 μs) well after the power-off phase. Reappearance of bubbles is speculated to be the result of a stagnation-like flow induced by the rapid collapse and inward motion of liquid that jets upward to cause a local reduction of pressure to cavitate a bubble at 3.8 μs. [Avedisian, C.T., Cavicchi, R.E., Tarlov, M.J., Rev. Sci. Instruments, 2006, in press; Balss, K.M., Avedisian, C.T., Cavicchi, R.E., Tarlov, M.J., Langmuir, 21, 10459–10467 (2005)]

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