Epitaxial Growth of Baddeleyite NbON Thin Films on Yttria-stabilized Zirconia by Pulsed Laser Deposition

2018 ◽  
Vol 47 (1) ◽  
pp. 65-67 ◽  
Author(s):  
Vitchaphol Motaneeyachart ◽  
Yasushi Hirose ◽  
Atsushi Suzuki ◽  
Shoichiro Nakao ◽  
Isao Harayama ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Epitaxial Growth ◽  
Pulsed Laser ◽  
Yttria Stabilized Zirconia ◽  
Laser Deposition ◽  
Stabilized Zirconia

Crystallization and grain growth characteristics of yttria-stabilized zirconia thin films grown by pulsed laser deposition

2011 ◽  
Vol 191 (1) ◽  
pp. 12-23 ◽  
Author(s):  
Sebastian Heiroth ◽  
Ruggero Frison ◽  
Jennifer L.M. Rupp ◽  
Thomas Lippert ◽  
Eszter J. Barthazy Meier ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Grain Growth ◽  
Pulsed Laser ◽  
Growth Characteristics ◽  
Yttria Stabilized Zirconia ◽  
Laser Deposition ◽  
Stabilized Zirconia

Structural Properties of Yttria-stabilized Zirconia Thin Films Grown by Pulsed Laser Deposition

1999 ◽  
Vol 14 (4) ◽  
pp. 1329-1336 ◽  
Author(s):  
J. Y. Dai ◽  
H. C. Ong ◽  
R. P. H. Chang
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Oxygen Pressure ◽  
Pulsed Laser ◽  
Growth Direction ◽  
Yttria Stabilized Zirconia ◽  
Laser Deposition ◽  
Low Oxygen ◽  
Stabilized Zirconia

Yttria-stabilized zirconia (YSZ) thin films grown by the pulsed laser deposition method on (0001) sapphire substrates have been studied by x-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), and scanning electron microscopy (SEM). It was found that the crystal orientation of the YSZ films changes as a function of oxygen pressure during deposition. At low oxygen pressure (50 mTorr), well-defined (111) oriented YSZ films are grown. High oxygen pressure favors the nucleation of (001) oriented YSZ grains. A model to explain the preferred growth direction of (001) YSZ is presented. Utilizing the experimental data, we have developed a two-step process to epitaxially grow high-quality (001) oriented YSZ on (0001) sapphire substrate.

scholarly journals Bilayer Electrolyte Thin Films Gadolinia Doped Ceria /Yttria Stabilized Zirconia Prepared by Pulsed Laser Deposition for Electrochemichal Devices

2020 ◽  
Vol 70 (12) ◽  
pp. 4181-4186
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Fluorite Structure ◽  
Yttria Stabilized Zirconia ◽  
Laser Deposition ◽  
Lorentz Model ◽  
Stabilized Zirconia ◽  
Force Microscopy ◽  
Xrd Patterns

In this paper bilayer thin films of 10CGO/8YSZ electrolyte with enhanced O2- conductivity composed of gadolinia doped CeO2 (Ce0,9Gd0,1O2-) and yttria stabilized zirconia 8 mol% Y2O3 doped ZrO2 layers were deposited by Pulsed Laser Deposition (PLD) using various numbers of pulses. This composite has supplementary function in electrochemical devices because 10 CGO can act as interdiffusion barrier with cathode materials. The structure and morphology of these thin films, having thicknesses smaller than 1µm, were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The XRD patterns exhibit cubic fluorite structure with a sharp (111) peak. The grain size was found to depend on the thickness. Optical characterization was carried out by spectroscopic ellipsometry (SE) using the Tauc-Lorentz model. Keywords: Laser ablation, Electrolytes, Bilayer Thin Films, Tauc - Lorentz Model, Electrochemical Fuel Cells Devices

Sign in / Sign up

Export Citation Format

Share Document