scholarly journals Determination of the Vapor Pressures of Cesium Fluoride and Cesium Chloride by Means of Surface Ionization

1984 ◽  
Vol 57 (2) ◽  
pp. 581-582 ◽  
Author(s):  
Hiroyuki Kawano ◽  
Tsutomu Kenp\={o} ◽  
Yoshiaki Hidaka
Keyword(s):  
Cesium Chloride ◽  
Surface Ionization ◽  
Vapor Pressures ◽  
Cesium Fluoride

Determination of nitrogen compounds in gasoline by gas chromatography-surface ionization detector

2011 ◽  
Vol 29 (2) ◽  
pp. 141-145
Author(s):  
Weiwei LI ◽  
Kun DING ◽  
Hua WANG ◽  
Shiheng CHEN ◽  
Zheng SHEN ◽  
...  
Keyword(s):  
Gas Chromatography ◽  
Nitrogen Compounds ◽  
Surface Ionization ◽  
Ionization Detector

Determination of the vapor pressures of select polychlorinated dibenzo-p-dioxins and dibenzofurans at 75–275°C

2005 ◽  
Vol 60 (3) ◽  
pp. 787-796 ◽  
Author(s):  
Shawn P. Ryan ◽  
Brian K. Gullett ◽  
Dennis Tabor ◽  
Lukas Oudejans ◽  
Abderrahmane Touati
Keyword(s):  
Vapor Pressures

Drei Verfahren zur Messung der Änderung der Austrittsarbeit mit Hilfe der Oberflächenionisation

1972 ◽  
Vol 27 (5) ◽  
pp. 794-803 ◽  
Author(s):  
R Müller ◽  
W Walcher ◽  
H.-W Wassmuth
Keyword(s):  
Work Function ◽  
Mass Spectrometer ◽  
Reference Electrode ◽  
Surface Ionization ◽  
Contact Potential ◽  
External Voltage ◽  
The Third ◽  
Metal Atoms ◽  
Ion Emission

AbstractThree methods for the measurement of the change ΔΦ of the work function Φ of a metal surface due to the presence of adsorbed particles (e. g. oxygen) have been developed utilizing the surface ionization of a beam of metal atoms (e. g. In, Sr) as a probe. The experiments have been performed with a mass spectrometer at ultrahigh vacuum.In the first method the temperature dependency of the ion emission current is used for the determination of the work function Φ considering certain limiting conditions. The two other methods which may be applied simultaneously with the first one, involve a direct measurement of ΔΦ by compensating the change of the contact potential by an external voltage: In the second method the contact potential between the ionizing surface and a surrounding reference electrode is used to control the ion optical conditions for the ion emission, whereas in the third method the change in the kinetic energy of the ions caused by a change of the contact potential between the ionizing surface and the entrance slit of the mass spectrometer is used as a measure of ΔΦ

Direct Determination of Low Vapor Pressures

1937 ◽  
Vol 9 (6) ◽  
pp. 264-267 ◽  
Author(s):  
K. C. D. Hickman ◽  
J. C. Heckler ◽  
N. D. Embree
Keyword(s):  
Direct Determination ◽  
Vapor Pressures
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