An Analysis of the Surface Composition of Passive Film on Cu–Ni Alloys by means of Auger Electron Spectroscopy and X-Ray Photoelectron Specroscopy

Yoshio Takasu; Shun-ichi Maru; Yoshiharu Matsuda; Hazime Shimizu

doi:10.1246/bcsj.48.219

An Analysis of the Surface Composition of Passive Film on Cu–Ni Alloys by means of Auger Electron Spectroscopy and X-Ray Photoelectron Specroscopy

Bulletin of the Chemical Society of Japan ◽

10.1246/bcsj.48.219 ◽

1975 ◽

Vol 48 (1) ◽

pp. 219-221 ◽

Cited By ~ 10

Author(s):

Yoshio Takasu ◽

Shun-ichi Maru ◽

Yoshiharu Matsuda ◽

Hazime Shimizu

Keyword(s):

Auger Electron Spectroscopy ◽

Passive Film ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

X Ray ◽

Ni Alloys

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ChemInform Abstract: AN ANALYSIS OF THE SURFACE COMPOSITION OF PASSIVE FILM ON CU-NI ALLOYS BY MEANS OF AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY

Chemischer Informationsdienst ◽

10.1002/chin.197515019 ◽

1975 ◽

Vol 6 (15) ◽

pp. no-no

Author(s):

YOSHIO TAKASU ◽

SHUN-ICHI MARU ◽

YOSHIHARU MATSUDA ◽

HAZIME SHIMIZU

Keyword(s):

Auger Electron Spectroscopy ◽

Passive Film ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

X Ray ◽

Ni Alloys

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Surface composition and chemistry of evaporated Permalloy films observed by x−ray photoemission spectroscopy and by Auger electron spectroscopy

Journal of Applied Physics ◽

10.1063/1.321736 ◽

1975 ◽

Vol 46 (3) ◽

pp. 1382-1388 ◽

Cited By ~ 21

Author(s):

R. A. Pollak ◽

C. H. Bajorek

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Photoemission Spectroscopy ◽

X Ray

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Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2017.04.008 ◽

2017 ◽

Vol 218 ◽

pp. 1-12 ◽

Cited By ~ 10

Author(s):

A. Jablonski ◽

C.J. Powell

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

X Ray

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1282. Surface composition and chemistry of evaporated Permalloy films observed by X-ray photoemission spectroscopy and by Auger electron spectroscopy

Vacuum ◽

10.1016/0042-207x(75)90549-7 ◽

1975 ◽

Vol 25 (9-10) ◽

pp. 456

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Photoemission Spectroscopy ◽

X Ray

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Surface composition of AlN powders studied by x‐ray photoelectron spectroscopy and bremsstrahlung‐excited Auger electron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578626 ◽

1993 ◽

Vol 11 (5) ◽

pp. 2681-2686 ◽

Cited By ~ 103

Author(s):

H. M. Liao ◽

R. N. S. Sodhi ◽

T. W. Coyle

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

X Ray

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

10.3403/30242215 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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Study of amorphous and crystallised Fe75B25 by Auger electron spectroscopy and X-ray photoelectron spectroscopy

Applied Surface Science ◽

10.1016/0169-4332(91)90396-2 ◽

1991 ◽

Vol 51 (3-4) ◽

pp. 139-155 ◽

Cited By ~ 19

Author(s):

S.K. Sharma ◽

S. Hofmann

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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X-ray photoemission and Auger electron spectroscopy analysis of fast responding activated metal oxide silicon carbide gas sensors

Thin Solid Films ◽

10.1016/s0040-6090(96)09407-2 ◽

1997 ◽

Vol 299 (1-2) ◽

pp. 183-189 ◽

Cited By ~ 14

Author(s):

A Lloyd Spetz ◽

D Schmeißer ◽

A Baranzahi ◽

B Wälivaara ◽

W Göpel ◽

...

Keyword(s):

Silicon Carbide ◽

Metal Oxide ◽

Auger Electron Spectroscopy ◽

Gas Sensors ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

X Ray ◽

Metal Oxide Silicon

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International Standardization of Quantitative Surface Analysis by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Shinku ◽

10.3131/jvsj.48.261 ◽

2005 ◽

Vol 48 (4) ◽

pp. 261-264

Author(s):

Shigeo TANUMA

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis ◽

International Standardization

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