Basic Physics and Recent Developments of Organic Random Lasers

2018 ◽  
pp. 151-192
Author(s):  
Ilenia Viola ◽  
Luca Leuzzi ◽  
Claudio Conti ◽  
Neda Ghofraniha
Domain Walls ◽  
2020 ◽  
pp. 1-22
Author(s):  
G. Catalan ◽  
N. Domingo

This chapter explains that the field of domain wall (DW) nanoelectronics is predicated on the premise that the distinct physical properties of domain walls offer new conceptual possibilities for devices. It first deals with basic physics of domain wall properties, and in particular the cross-coupling that allows domain walls to display properties and order parameters different from those of the parent bulk material. The chapter then turns to scanning probe techniques for measuring some of these domain wall properties, and specifically atomic force microscopy (AFM). Together with transmission electron microscopy, AFM is one of the most important tools currently available to probe and manipulate the individual position and physical properties of domain walls. Finally, the chapter focuses on two recent developments that allow investigating hitherto overlooked properties of domain walls: their magnetotransport and their mechanical response.


2001 ◽  
Vol 7 (2) ◽  
pp. 124-141 ◽  
Author(s):  
David B. Wittry ◽  
Nicholas C. Barbi

Abstract Castaing’s successful implementation and application of the electron probe microanalyzer in 1950 stimulated a flurry of development activity around the world. The later versions of this instrument represented a truly international effort, with significant contributions by scientists from Europe, Asia, and North America. If the probe-forming system of the instrument was its heart, the X-ray wavelength spectrometer was its soul. This article reviews some of the history of spectrometer developments—lthrough the “golden years” of microprobe development, namely the dozen or so years following the publication of Castaing’s thesis, to the present. The basic physics of spectrometer and crystal design is reviewed. Early experimental devices, such as those developed by Castaing, Borovskii, Wittry, Duncumb, and Ogilvie are reported. Examples of commercial spectrometers such as those by ARL, MAC, Microspec, and Peak are described. Recent developments such as the combination of grazing-incidence optics with flat crystal spectrometers are noted, and the properties and uses of doubly curved crystals are discussed. Finally, the continued development of doubly curved crystal configurations, such as the “Wittry geometry” for scanning monochromators, and point-to-point focusing diffractors for producing small monochromatic X-ray probes to provide improved detection limits for microanalysis are considered.


2010 ◽  
Vol 12 (2) ◽  
pp. 024001 ◽  
Author(s):  
Oleg Zaitsev ◽  
Lev Deych

Author(s):  
C. Colliex ◽  
P. Trebbia

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.


Author(s):  
Kent McDonald

At the light microscope level the recent developments and interest in antibody technology have permitted the localization of certain non-microtubule proteins within the mitotic spindle, e.g., calmodulin, actin, intermediate filaments, protein kinases and various microtubule associated proteins. Also, the use of fluorescent probes like chlorotetracycline suggest the presence of membranes in the spindle. Localization of non-microtubule structures in the spindle at the EM level has been less rewarding. Some mitosis researchers, e.g., Rarer, have maintained that actin is involved in mitosis movements though the bulk of evidence argues against this interpretation. Others suggest that a microtrabecular network such as found in chromatophore granule movement might be a possible force generator but there is little evidence for or against this view. At the level of regulation of spindle function, Harris and more recently Hepler have argued for the importance of studying spindle membranes. Hepler also believes that membranes might play a structural or mechanical role in moving chromosomes.


Author(s):  
J W Steeds

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.


Author(s):  
G.Y. Fan ◽  
J.M. Cowley

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.


Author(s):  
T. A. Dodson ◽  
E. Völkl ◽  
L. F. Allard ◽  
T. A. Nolan

The process of moving to a fully digital microscopy laboratory requires changes in instrumentation, computing hardware, computing software, data storage systems, and data networks, as well as in the operating procedures of each facility. Moving from analog to digital systems in the microscopy laboratory is similar to the instrumentation projects being undertaken in many scientific labs. A central problem of any of these projects is to create the best combination of hardware and software to effectively control the parameters of data collection and then to actually acquire data from the instrument. This problem is particularly acute for the microscopist who wishes to "digitize" the operation of a transmission or scanning electron microscope. Although the basic physics of each type of instrument and the type of data (images & spectra) generated by each are very similar, each manufacturer approaches automation differently. The communications interfaces vary as well as the command language used to control the instrument.


Author(s):  
William Krakow ◽  
David A. Smith

Recent developments in specimen preparation, imaging and image analysis together permit the experimental determination of the atomic structure of certain, simple grain boundaries in metals such as gold. Single crystal, ∼125Å thick, (110) oriented gold films are vapor deposited onto ∼3000Å of epitaxial silver on (110) oriented cut and polished rock salt substrates. Bicrystal gold films are then made by first removing the silver coated substrate and placing in contact two suitably misoriented pieces of the gold film on a gold grid. Controlled heating in a hot stage first produces twist boundaries which then migrate, so reducing the grain boundary area, to give mixed boundaries and finally tilt boundaries perpendicular to the foil. These specimens are well suited to investigation by high resolution transmission electron microscopy.


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