Practical Considerations for Benefit–Risk Assessment and Implementation: Vorapaxar TRA-2°P TIMI 50 Case Study

Author(s):  
Weili He ◽  
Daniel Bloomfield ◽  
Yabing Mai ◽  
Scott Evans
2014 ◽  
Vol 23 (9) ◽  
pp. 974-983 ◽  
Author(s):  
Christine E. Hallgreen ◽  
Hendrika A. van den Ham ◽  
Shahrul Mt-Isa ◽  
Simon Ashworth ◽  
Richard Hermann ◽  
...  

2015 ◽  
Vol 58 (1) ◽  
pp. 8-27 ◽  
Author(s):  
Richard Nixon ◽  
Christoph Dierig ◽  
Shahrul Mt-Isa ◽  
Isabelle Stöckert ◽  
Thaison Tong ◽  
...  

2013 ◽  
Vol 54 ◽  
pp. 35-42 ◽  
Author(s):  
Jeljer Hoekstra ◽  
Heidi P. Fransen ◽  
Jan C.H. van Eijkeren ◽  
Janneke Verkaik-Kloosterman ◽  
Nynke de Jong ◽  
...  

2018 ◽  
Author(s):  
Michael H. Azarian

Abstract As counterfeiting techniques and processes grow in sophistication, the methods needed to detect these parts must keep pace. This has the unfortunate effect of raising the costs associated with managing this risk. In order to ensure that the resources devoted to counterfeit detection are commensurate with the potential effects and likelihood of counterfeit part usage in a particular application, a risk based methodology has been adopted for testing of electrical, electronic, and electromechanical (EEE) parts by the SAE AS6171 set of standards. This paper provides an overview of the risk assessment methodology employed within AS6171 to determine the testing that should be utilized to manage the risk associated with the use of a part. A scenario is constructed as a case study to illustrate how multiple solutions exist to address the risk for a particular situation, and the choice of any specific test plan can be made on the basis of practical considerations, such as cost, time, or the availability of particular test equipment.


2000 ◽  
Vol 14 (5) ◽  
pp. 1264-1270 ◽  
Author(s):  
Elisabeth Slooten ◽  
David Fletcher ◽  
Barbara L. Taylor
Keyword(s):  

2020 ◽  
Vol 34 (5) ◽  
pp. 627-640 ◽  
Author(s):  
Shi Xianwu ◽  
Qiu Jufei ◽  
Chen Bingrui ◽  
Zhang Xiaojie ◽  
Guo Haoshuang ◽  
...  

IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Amir Farmahini Farahani ◽  
Kaveh Khalili-Damghani ◽  
Hosein Didehkhani ◽  
Amir Homayoun Sarfaraz ◽  
Mehdi Hajirezaie

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