A study on failure diagnosis technique of transformer based on acoustic features

2015 ◽  
pp. 279-284
Keyword(s):  
Failure Diagnosis ◽  
Acoustic Features ◽  
Diagnosis Technique

589 Quality of heart failure diagnosis in hospitalized patients

2003 ◽  
Vol 2 (1) ◽  
pp. 128-129
Author(s):  
P SARMENTO ◽  
C FONSECA ◽  
F MARQUES ◽  
J NUNES ◽  
F CEIA
Keyword(s):  
Heart Failure ◽  
Hospitalized Patients ◽  
Failure Diagnosis ◽  
Heart Failure Diagnosis

Accuracy of a heart failure diagnosis in administrative registers

2008 ◽  
Vol 7 ◽  
pp. 155-156
Author(s):  
T KUMLER ◽  
G GISLASON ◽  
V KIRK ◽  
M BAY ◽  
O NIELSEN ◽  
...  
Keyword(s):  
Heart Failure ◽  
Failure Diagnosis ◽  
Heart Failure Diagnosis

An Error Diagnosis Technique Based on Location Sets to Rectify Subcircuits

2009 ◽  
Vol E92-A (12) ◽  
pp. 3136-3142
Author(s):  
Kosuke SHIOKI ◽  
Narumi OKADA ◽  
Toshiro ISHIHARA ◽  
Tetsuya HIROSE ◽  
Nobutaka KUROKI ◽  
...  
Keyword(s):  
Error Diagnosis ◽  
Diagnosis Technique

A New Technique for Scan Chain Failure Diagnosis

2002 ◽  
Author(s):  
Ruifeng Guo ◽  
Srikanth Venkataraman
Keyword(s):  
Hold Time ◽  
Failure Diagnosis ◽  
Second Step ◽  
Fault Type ◽  
Transition Faults ◽  
Input Side ◽  
Output Side ◽  
A New Technique ◽  
Scan Chain ◽  
Diagnostic Resolution

Abstract In this paper, we present a scan chain fault diagnosis procedure. The diagnosis for a single scan chain failure is performed in three steps. The first step uses special chain test patterns to determine both the faulty chain and the fault type in the faulty chain. The second step uses a novel procedure to generate special test patterns to identify the suspect scan cell within a range of scan cells. Unlike previously proposed methods that restrict the location of the faulty scan cell only from the scan chain output side, our method restricts the location of the faulty scan cell from both the scan chain output side and the scan chain input side. Hence the number of suspect scan cells is reduced significantly in this step. The final step further improves the diagnostic resolution by ranking the suspect scan cells inside this range. The proposed technique handles both stuck-at and timing failures (transition faults and hold time faults). The experimental results based on simulation and silicon units for several products show the effectiveness of the proposed method.

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