Assessment based on Monte Carlo for sample rotation under stratified cluster sampling

Current estimators of variance for the k nearest neighbours (kNN) technique are designed for estimates of population totals. Their efficiency in small-area estimation problems can be poor. In this study, we propose a modified balanced repeated replication estimator of variance (BRR) of a kNN total that performs well in small-area estimation problems and under both simple random and cluster sampling. The BRR estimate of variance is the sum of variances and covariances of unit-level kNN estimates in the area of interest. In Monte Carlo simulations of simple random and cluster sampling from seven artificial populations with real and simulated forest inventory data, the agreement between averages of BRR estimates of variance and Monte Carlo sampling variances was good both for population and for small-area totals. The modified BRR estimator is currently limited to sample sizes no larger than 1984. An accurate approximation to the proposed BRR estimator allows significant savings in computing time.

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Outbursts of comet Schwassmann-Wachmann 1, and the cloud of interplanetary boulders

International Astronomical Union Colloquium ◽

10.1017/s0252921100034035 ◽

1974 ◽

Vol 22 ◽

pp. 307 ◽

Cited By ~ 3

Author(s):

Zdenek Sekanina

Keyword(s):

Monte Carlo ◽

Monte Carlo Method ◽

Interplanetary Space ◽

Porous Matrix ◽

Maximum Diameter ◽

Expansion Velocity ◽

Solid Constituent ◽

Meteoric Material ◽

Periodic Comet

AbstractIt is suggested that the outbursts of Periodic Comet Schwassmann-Wachmann 1 are triggered by impacts of interplanetary boulders on the surface of the comet’s nucleus. The existence of a cloud of such boulders in interplanetary space was predicted by Harwit (1967). We have used the hypothesis to calculate the characteristics of the outbursts – such as their mean rate, optically important dimensions of ejected debris, expansion velocity of the ejecta, maximum diameter of the expanding cloud before it fades out, and the magnitude of the accompanying orbital impulse – and found them reasonably consistent with observations, if the solid constituent of the comet is assumed in the form of a porous matrix of lowstrength meteoric material. A Monte Carlo method was applied to simulate the distributions of impacts, their directions and impact velocities.

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Monte Carlo Algorithms for Moments of Transition Arrays

International Astronomical Union Colloquium ◽

10.1017/s0252921100107468 ◽

1988 ◽

Vol 102 ◽

pp. 79-81

Author(s):

A. Goldberg ◽

S.D. Bloom

Keyword(s):

Monte Carlo ◽

State Vector ◽

Basis Vector ◽

Collective State ◽

Dispersion Characteristics ◽

Dipole Strength ◽

The Third ◽

Monte Carlo Algorithms ◽

Third Moment ◽

Very High

AbstractClosed expressions for the first, second, and (in some cases) the third moment of atomic transition arrays now exist. Recently a method has been developed for getting to very high moments (up to the 12th and beyond) in cases where a “collective” state-vector (i.e. a state-vector containing the entire electric dipole strength) can be created from each eigenstate in the parent configuration. Both of these approaches give exact results. Herein we describe astatistical(or Monte Carlo) approach which requires onlyonerepresentative state-vector |RV> for the entire parent manifold to get estimates of transition moments of high order. The representation is achieved through the random amplitudes associated with each basis vector making up |RV>. This also gives rise to the dispersion characterizing the method, which has been applied to a system (in the M shell) with≈250,000 lines where we have calculated up to the 5th moment. It turns out that the dispersion in the moments decreases with the size of the manifold, making its application to very big systems statistically advantageous. A discussion of the method and these dispersion characteristics will be presented.

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Electron Scattering in Solids

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133618 ◽

1990 ◽

Vol 48 (2) ◽

pp. 4-5

Author(s):

Ryuichi Shimizu ◽

Ze-Jun Ding

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Angular Distribution ◽

Elastic Scattering ◽

Electron Scattering ◽

Cross Sections ◽

Expansion Method ◽

Electron Excitation ◽

Partial Wave Expansion ◽

Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

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Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100134922 ◽

1990 ◽

Vol 48 (2) ◽

pp. 264-265

Author(s):

D. R. Liu ◽

S. S. Shinozaki ◽

R. J. Baird

Keyword(s):

Thin Film ◽

Thin Films ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Compound Semiconductors ◽

Energy Dispersive Analysis ◽

X Ray ◽

Metastable Alloys ◽

Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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Structures and crystallization of vacuum-deposited amorphous Se and Sb films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100173832 ◽

1990 ◽

Vol 48 (4) ◽

pp. 140-141

Author(s):

Makoto Shiojiri ◽

Toshiyuki Isshiki ◽

Tetsuya Fudaba ◽

Yoshihiro Hirota

Keyword(s):

Monte Carlo ◽

Electron Microscope ◽

Monte Carlo Method ◽

Computer Program ◽

Radial Distribution ◽

Film Formation ◽

Amorphous State ◽

Two Dimensional ◽

Amorphous Films ◽

Binding Condition

In hexagonal Se crystal each atom is covalently bound to two others to form an endless spiral chain, and in Sb crystal each atom to three others to form an extended puckered sheet. Such chains and sheets may be regarded as one- and two- dimensional molecules, respectively. In this paper we investigate the structures in amorphous state of these elements and the crystallization.HRTEM and ED images of vacuum-deposited amorphous Se and Sb films were taken with a JEM-200CX electron microscope (Cs=1.2 mm). The structure models of amorphous films were constructed on a computer by Monte Carlo method. Generated atoms were subsequently deposited on a space of 2 nm×2 nm as they fulfiled the binding condition, to form a film 5 nm thick (Fig. 1a-1c). An improvement on a previous computer program has been made as to realize the actual film formation. Radial distribution fuction (RDF) curves, ED intensities and HRTEM images for the constructed structure models were calculated, and compared with the observed ones.

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