Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution

2014 ◽  
pp. 13-22
1999 ◽  
Vol 96 (9) ◽  
pp. 1335-1339 ◽  
Author(s):  
ALAN E. VAN GIESSEN, DIRK JAN BUKMAN, B.

2022 ◽  
Vol 354 ◽  
pp. 131219
Author(s):  
Siyuan Lv ◽  
Yueying Zhang ◽  
Li Jiang ◽  
Lianjing Zhao ◽  
Jing Wang ◽  
...  

2005 ◽  
Vol 141 (2) ◽  
pp. 211-215 ◽  
Author(s):  
Fangyan Xie ◽  
Zhiqun Tian ◽  
Hui Meng ◽  
Pei Kang Shen

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