Collection and Preservation of Evidence

2011 ◽  
pp. 605-616
Keyword(s):  
Preservation Of Evidence

On epistemic and ontological interpretations of intuitionistic and paraconsistent paradigms

2020 ◽  
Author(s):  
Walter Carnielli ◽  
Abilio Rodrigues
Keyword(s):  
Intuitionistic Logic ◽  
Classical Logic ◽  
Point Of View ◽  
Constructive Proof ◽  
Technical Point ◽  
Preservation Of Evidence ◽  
Epistemic Approach ◽  
Epistemic Interpretation ◽  
Excluded Middle

Abstract From the technical point of view, philosophically neutral, the duality between a paraconsistent and a paracomplete logic (for example intuitionistic logic) lies in the fact that explosion does not hold in the former and excluded middle does not hold in the latter. From the point of view of the motivations for rejecting explosion and excluded middle, this duality can be interpreted either ontologically or epistemically. An ontological interpretation of intuitionistic logic is Brouwer’s idealism; of paraconsistency is dialetheism. The epistemic interpretation of intuitionistic logic is in terms of preservation of constructive proof; of paraconsistency is in terms of preservation of evidence. In this paper, we explain and defend the epistemic approach to paraconsistency. We argue that it is more plausible than dialetheism and allows a peaceful and fruitful coexistence with classical logic.

Preserving Evidence for Root Cause Investigations with Halogen-Free Microwave Induced Plasma

2018 ◽  
Author(s):  
C. Odegard ◽  
Andy Burnett ◽  
J. Tang ◽  
J. Wang
Keyword(s):  
Integrated Circuit ◽  
Microwave Induced Plasma ◽  
Root Cause ◽  
Physical Evidence ◽  
Die Surface ◽  
Preservation Of Evidence ◽  
Evidence Gathering ◽  
Customer Returns ◽  
Halogen Free

Abstract Accurate root cause determination of integrated circuit devices necessitates the preservation of evidence during failure analysis. Identifying the cause of systemic defects requires capturing physical evidence provided by very few customer returns. Each piece of physical evidence is valuable due to the scarcity of returns in most cases less than 1 ppm. Harvesting infrequent physical evidence requires that each attempt to decapsulate a fail unit has a high probability of retaining the material that caused the defect. A measured method that retains the critical evidence is the fastest way to solve a defect driven systemic failure mechanism because one gathers the evidence more efficiently. This paper presents two case studies of improved evidence gathering using halogen-free microwave induced plasma (MIP) decapsulation during the root cause investigations. This relatively new method of decapsulation enabled us to preserve evidence, including any changes to the metal and die surface structures along with the presence of contaminants or by-products of failure mechanisms.

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