Test Framework Architectures for Model-Based Embedded System Testing

Author(s):  
Stephen Masticola ◽  
Michael Gall
2021 ◽  
Vol 10 (1) ◽  
pp. 20
Author(s):  
Walter Tiberti ◽  
Dajana Cassioli ◽  
Antinisca Di Marco ◽  
Luigi Pomante ◽  
Marco Santic

Advances in technology call for a parallel evolution in the software. New techniques are needed to support this dynamism, to track and guide its evolution process. This applies especially in the field of embedded systems, and certainly in Wireless Sensor Networks (WSNs), where hardware platforms and software environments change very quickly. Commonly, operating systems play a key role in the development process of any application. The most used operating system in WSNs is TinyOS, currently at its TinyOS 2.1.2 version. The evolution from TinyOS 1.x and TinyOS 2.x made the applications developed on TinyOS 1.x obsolete. In other words, these applications are not compatible out-of-the-box with TinyOS 2.x and require a porting action. In this paper, we discuss on the porting of embedded system (i.e., Wireless Sensor Networks) applications in response to operating systems’ evolution. In particular, using a model-based approach, we report the porting we did of Agilla, a Mobile-Agent Middleware (MAMW) for WSNs, on TinyOS 2.x, which we refer to as Agilla 2. We also provide a comparative analysis about the characteristics of Agilla 2 versus Agilla. The proposed Agilla 2 is compatible with TinyOS 2.x, has full capabilities and provides new features, as shown by the maintainability and performance measurement presented in this paper. An additional valuable result is the architectural modeling of Agilla and Agilla 2, missing before, which extends its documentation and improves its maintainability.


Author(s):  
Justyna Zander ◽  
Ina Schieferdecker

The purpose of this chapter is to introduce the test methods applied for embedded systems addressing selected problems in the automotive domain. Model-based test approaches are reviewed and categorized. Weak points are identified and a novel test method is proposed. It is called model-in-the-loop for embedded system test (MiLEST) and is realized in MATLAB®/Simulink®/Stateflow® environment. Its main contribution refers to functional black-box testing based on the system and test models. It is contrasted with the test methods currently applied in the industry that form dedicated solutions, usually specialized in a concrete testing context. The developed signal-feature-oriented paradigm developed herewith allows the abstract description of signals and their properties. It addresses the problem of missing reference signal flows and allows for a systematic and automatic test data selection. Processing of both discrete and continuous signals is possible, so that the hybrid behavior of embedded systems can be handled.


Author(s):  
Kengo MASUMI ◽  
Shinji Tsuzuki ◽  
Masashi Sugimoto ◽  
Hitoshi Yoshimura ◽  

2009 ◽  
Vol 42 (3) ◽  
pp. 263-266
Author(s):  
CHEN Heping ◽  
WANG Jincun ◽  
CHEN Bin ◽  
LI Xiaohui

Author(s):  
Nicolas Hili ◽  
Christian Fabre ◽  
Ivan Llopard ◽  
Sophie Dupuy Chessa ◽  
Dominique Rieu

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