Microchannel-Plate Detectors in Atomic Physics Applications

2016 ◽  
pp. 135-164
Keyword(s):  
Atomic Physics ◽  
Microchannel Plate

The Interpretation of Line Profiles

1977 ◽  
Vol 36 ◽  
pp. 191-215
Author(s):  
G.B. Rybicki
Keyword(s):  
Magnetic Fields ◽  
Atomic Physics ◽  
Velocity Fields ◽  
Spectral Lines ◽  
Inhomogeneous Structure ◽  
The Sun ◽  
Line Profiles ◽  
Physical Phenomena

Observations of the shapes and intensities of spectral lines provide a bounty of information about the outer layers of the sun. In order to utilize this information, however, one is faced with a seemingly monumental task. The sun’s chromosphere and corona are extremely complex, and the underlying physical phenomena are far from being understood. Velocity fields, magnetic fields, Inhomogeneous structure, hydromagnetic phenomena – these are some of the complications that must be faced. Other uncertainties involve the atomic physics upon which all of the deductions depend.

Effect of energy filtering on micro-diffraction in the SEM

1994 ◽  
Vol 52 ◽  
pp. 604-605
Author(s):  
James F. Mancuso ◽  
Leo A. Fama ◽  
William B. Maxwell ◽  
Jerry L. Lehman ◽  
Hasso Weiland ◽  
...  
Keyword(s):  
Detection Efficiency ◽  
Ccd Camera ◽  
High Gain ◽  
Microchannel Plate ◽  
Electrostatic Energy ◽  
Energy Filtering ◽  
Electron Channelling ◽  
Low Energy Electrons ◽  
Low Sensitivity ◽  
Angular Field Of View

Micro-diffraction based crystallography is essential to the design and development of many classes of ‘crafted materials’. Although the scanning electron microscope can provide crystallographic information with high spatial resolution, its current utility is severely limited by the low sensitivity of existing diffraction techniques (ref: Dingley). Previously, Joy showed that energy filtering increased contrast and pattern visibility in electron channelling. This present paper discribes the effect of energy filtering on EBSP sensitivity and backscattered SEM imaging.The EBSP detector consisted of an electron energy filter, a microchannel plate detector, a phosphor screen, optical coupler, and a slow scan CCD camera. The electrostatic energy filter used in this experiment was constructed as a cone with 5 coaxial electrodes. The angular field-of-view of the filter was approximately 38°. The microchannel plate, which was the initial sensing component, had high gain and had 50% to 80% detection efficiency for the low energy electrons that passed through the retarding field filter.

Low - Voltage Scanning Electron Microscopy Imaging, Secondary and Backscatter, With Microchannel Plate Detector

1990 ◽  
Vol 48 (1) ◽  
pp. 442-442
Author(s):  
Galen Powers ◽  
Ray Cochran
Keyword(s):  
Low Voltage ◽  
Beam Current ◽  
Microchannel Plate ◽  
Normal Operation ◽  
Microscopy Imaging ◽  
Backscatter Signal ◽  
Vacuum Interface ◽  
Width Measurements ◽  
Working Distance ◽  
Beam Currents

The capability to obtain symmetrical images at voltages as low as 200 eV and beam currents less than 9 pico amps is believed to be advantageous for metrology and study of dielectric or biological samples. Symmetrical images should allow more precise and accurate line width measurements than currently achievable by traditional secondary electron detectors. The low voltage and current capability should allow imaging of samples which traditionally have been difficult because of charging or electron beam damage.The detector system consists of a lens mounted dual anode MicroChannel Plate (MCP) detector, vacuum interface, power supplies, and signal conditioning to interface directly to the video card of the SEM. The detector has been miniaturized so that it does not interfere with normal operation of the SEM sample handling and alternate detector operation. Biasing of the detector collection face will either add secondaries to the backscatter signal or reject secondaries yielding only a backscatter image. The dual anode design allows A−B signal processing to provide topological information as well as symmetrical A+B images.Photomicrographs will show some of the system capabilities. Resolution will be documented with gold on carbon. Variation of voltage, beam current, and working distance on dielectric samples such as glass and photoresist will demonstrate effects of common parameter changes.

Current Trends in Atomic Physics

2019 ◽  
Keyword(s):  
Atomic Physics ◽  
Summer School ◽  
High Energy Physics ◽  
Condensed Matter ◽  
High Energy ◽  
Current Trends ◽  
Energy Physics ◽  
Broad Overview

This volume gathers the lectures notes of Session CVII of the Les Houches summer school of Physics, entitled “Current trends in Atomic Physics”. The school took place in July 2016 and had the goal to give the participants a broad overview of Atomic Physics as a whole, and in particular its connections to other areas of physics, such as condensed-matter and high-energy physics. The book comprises twelve chapters corresponding to lectures delivered at the school.

scholarly journals Advances in atomic physics

2015 ◽  
Vol 6 (5) ◽  
pp. 643-661
Author(s):  
Tharwat M. El-Sherbini
Keyword(s):  
Atomic Physics

scholarly journals High-Sensitivity and Long-Life Microchannel Plate Processed by Atomic Layer Deposition

2019 ◽  
Vol 14 (1) ◽  
Author(s):  
Weiwei Cao ◽  
Bingli Zhu ◽  
Xiaohong Bai ◽  
Peng Xu ◽  
Bo Wang ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
High Sensitivity ◽  
Atomic Layer ◽  
Microchannel Plate ◽  
Layer Deposition ◽  
Long Life
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