Rapid analysis techniques for ultimate strength predictions of aluminum structures

Rapid low-cost whole-genome sequencing (WGS) is revolutionizing microbiology; however, complementary advances in accessible, reproducible, and rapid analysis techniques are required to realize the potential of these data. Here, investigations of the genusNeisseriaillustrated the gene-by-gene conceptual approach to the organization and analysis of WGS data. Using the gene and its link to phenotype as a starting point, the BIGSdb database, which powers the PubMLST databases, enables the assembly of large open-access collections of annotated genomes that provide insight into the evolution of theNeisseria, the epidemiology of meningococcal and gonococcal disease, and mechanisms ofNeisseriapathogenicity.

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Rapid analysis techniques in food microbiology

LWT ◽

10.1016/0023-6438(95)90031-4 ◽

1995 ◽

Vol 28 (4) ◽

pp. 449

Author(s):

A. Baumgartner

Keyword(s):

Rapid Analysis ◽

Food Microbiology ◽

Analysis Techniques

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An example of spectrum imaging used for comparison of EELS quantitative analysis techniques on Al-Li

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010008794x ◽

1991 ◽

Vol 49 ◽

pp. 726-727

Author(s):

John A. Hunt

Keyword(s):

Quantitative Analysis ◽

Large Data ◽

Difference Spectrum ◽

Large Data Sets ◽

Foil Thickness ◽

Data Sets ◽

Analysis Techniques ◽

Spectrum Imaging ◽

Normal Spectrum ◽

Electron Energy Loss

Spectrum-imaging is a useful technique for comparing different processing methods on very large data sets which are identical for each method. This paper is concerned with comparing methods of electron energy-loss spectroscopy (EELS) quantitative analysis on the Al-Li system. The spectrum-image analyzed here was obtained from an Al-10at%Li foil aged to produce δ' precipitates that can span the foil thickness. Two 1024 channel EELS spectra offset in energy by 1 eV were recorded and stored at each pixel in the 80x80 spectrum-image (25 Mbytes). An energy range of 39-89eV (20 channels/eV) are represented. During processing the spectra are either subtracted to create an artifact corrected difference spectrum, or the energy offset is numerically removed and the spectra are added to create a normal spectrum. The spectrum-images are processed into 2D floating-point images using methods and software described in [1].

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Dissociated Σ=27 boundaries in silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100105187 ◽

1988 ◽

Vol 46 ◽

pp. 624-625

Author(s):

A. Garg ◽

W.A.T. Clark ◽

J.P. Hirth

Keyword(s):

Electron Diffraction ◽

Local Minimum ◽

Boundary Energy ◽

Coincidence Site Lattice ◽

Boundary Plane ◽

Low Energy ◽

Theoretical Understanding ◽

Site Lattice ◽

Kikuchi Pattern ◽

Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

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