Stress effects on nuclide transport in fractured rocks: A numerical study

2011 ◽  
Vol 38 (2) ◽  
pp. 113-126 ◽  
Author(s):  
Zhihong Zhao ◽  
Lanru Jing ◽  
Ivars Neretnieks ◽  
Luis Moreno

2021 ◽  
Vol 41 (1) ◽  
Author(s):  
Mourad Nahal ◽  
Abdelaziz Lakehal ◽  
Rabia Khelif

Numerical model of a corroded weld joint connecting pipe to flange using a finite element method was developed, and coupled with usual stress models. The structure material has been characterized experimentally. Monte Carlo simulations, FORM and SORM methods have been applied for estimating reliability and failure probability under corrosion and residual stress effects. A numerical case with various corrosion rates was conducted to determine the reliability of the welded connection pipe to flange. The obtained results show that the heat affected zone is very sensitive to corrosion effects due to the welding process.


2002 ◽  
Vol 151 (2) ◽  
pp. 452-468 ◽  
Author(s):  
Xing Zhang ◽  
David J. Sanderson ◽  
Andrew J. Barker

2004 ◽  
Author(s):  
Oliver S. Krüger ◽  
Erik H. Saenger ◽  
Stefan Buske ◽  
Serge A. Shapiro

1999 ◽  
Vol 14 (12) ◽  
pp. 4508-4513 ◽  
Author(s):  
T. J. Delph ◽  
M-T. Lin

We report here on the results of a numerical study on the effects of intrinsic stress on the growth of SiO2 thin films. In accordance with a widely accepted model of stress effects upon silicon oxidation, we assume that the intrinsic stress affects only the oxidant diffusion rate. We examine several different models of stress-assisted diffusion. In the first of these models, the diffusivity is taken to be an exponential function of the stress, whereas in the second, the stress gradient appears as an additional term in the standard diffusion equation. Intrinsic stress effects result in deviations of up to 18% in expected layer thickness, depending upon the mode of oxidation and the diffusion model adopted. The implications of these results for the measurement of diffusion coefficients in SiO2 films are discussed.


2019 ◽  
Vol 124 (11) ◽  
pp. 11705-11727 ◽  
Author(s):  
Nicolás D. Barbosa ◽  
Jürg Hunziker ◽  
Simón Lissa ◽  
Erik H. Saenger ◽  
Matteo Lupi

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