A Quantum Automatic Controlled Method for Storage Test Coverage

2010 ◽  
pp. 195-205
Keyword(s):  
Test Coverage ◽  
Storage Test

A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Extend ATPG Diagnostic Resolution in Localizing Faults

2019 ◽  
Author(s):  
Rommel Estores ◽  
Karo Vander Gucht
Keyword(s):  
Fault Injection ◽  
Fault Simulation ◽  
Fault Localization ◽  
Pattern Generation ◽  
Test Coverage ◽  
Actual Case ◽  
Electrical Failure ◽  
Starting Point ◽  
Diagnostic Resolution ◽  
Diagnosis Approach

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.

scholarly journals Statistical test coverage for Linux-based next-generation autonomous safety-related systems

IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Imanol Allende ◽  
Nicholas Mc Guire ◽  
Jon Perez-Cerrolaza ◽  
Lisandro G. Monsalve ◽  
Jens Petersohn ◽  
...  
Keyword(s):  
Statistical Test ◽  
Test Coverage ◽  
Next Generation

Layout-Based Test Coverage Verification for High-Reliability Devices

2017 ◽  
Vol 30 (4) ◽  
pp. 317-322 ◽  
Author(s):  
Yoshikazu Nagamura ◽  
Kenji Shiozawa ◽  
Toru Koyama ◽  
Jun Matsushima ◽  
Kazuhiro Tomonaga ◽  
...  
Keyword(s):  
High Reliability ◽  
Test Coverage
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