Ground roll attenuation by robust complex polarization analysis

2010 ◽  
Author(s):  
Chen Haifeng ◽  
Luo Guoan ◽  
Hou Aiyuan ◽  
Zhao Gulling ◽  
Lei Na
Keyword(s):  
Polarization Analysis ◽  
Ground Roll ◽  
Complex Polarization

Robust adaptive polarization analysis method for eliminating ground roll in 3C land seismics

2013 ◽  
Vol 10 (3) ◽  
pp. 295-304 ◽  
Author(s):  
Hai-Feng Chen ◽  
Xiang-Yang Li ◽  
Zhong-Ping Qian ◽  
Gui-Ling Zhao
Keyword(s):  
Polarization Analysis ◽  
Analysis Method ◽  
Ground Roll ◽  
Robust Adaptive

Applications of seismic polarization analysis

Geophysics ◽  
1994 ◽  
Vol 59 (1) ◽  
pp. 119-130 ◽  
Author(s):  
Azik I. Perelberg ◽  
Scott C. Hornbostel
Keyword(s):  
Data Analysis ◽  
Seismic Wave ◽  
Covariance Matrices ◽  
Polarization Analysis ◽  
Wave Type ◽  
Weighting Functions ◽  
Type Selection ◽  
Out Of Plane ◽  
Seismic Recording ◽  
Ground Roll

Multicomponent seismic recording contains a wealth of information. A major challenge is to distill this information into something manageable. Polarization analysis is a technique for simplifying the situation by extracting two simple measures: ellipticity and directionality. These measures can be obtained quickly from the data covariance matrices and are sufficient for data analysis or for the design of weighting functions for seismic wave‐type selection. Data analysis using these measures may include the study of ellipticity to discern anisotropy and the use of ellipticity and directionality for a quick survey of the various wave types in the data. Applications of the related weighting functions include the removal of ground roll, the separation of converted waves or refractions, and the removal of out‐of‐plane arrivals.

Complex Polarization Analysis Based on Windowed Hilbert Transform and Its Application

2005 ◽  
Vol 48 (4) ◽  
pp. 960-967 ◽  
Author(s):  
Yun CHEN ◽  
Zhong-Jie ZHANG ◽  
Xiao-Bo TIAN
Keyword(s):  
Hilbert Transform ◽  
Polarization Analysis ◽  
Complex Polarization

Imaging magnetic microstructure with SEMPA

1993 ◽  
Vol 51 ◽  
pp. 1032-1033
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Sandwich Structure ◽  
Magnetic Coupling ◽  
Polarization Analysis ◽  
Secondary Electrons ◽  
Magnetic Microstructure ◽  
Escape Depth ◽  
Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

POLARIZATION ANALYSIS OF THE MAGNETIC DIFFUSE SCATTERING OF Na3Cr2P3O12

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-199-C8-200
Author(s):  
N. Fanjat ◽  
O. Schaerpf ◽  
J. L. Soubeyroux ◽  
A. J. Dianoux ◽  
G. Lucazeau
Keyword(s):  
Diffuse Scattering ◽  
Polarization Analysis
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