Focused gaussian beams for seismic imaging

Author(s):  
Robert L. Nowack
2011 ◽  
Vol 2011 ◽  
pp. 1-8 ◽  
Author(s):  
Robert L. Nowack

An initial study is performed in which dynamically focused Gaussian beams are investigated for seismic imaging. Focused Gaussian beams away from the source and receiver plane allow the narrowest and planar portions of the beams to occur at the depth of a specific target structure. To match the seismic data, quadratic phase corrections are required for the local slant stacks of the surface data. To provide additional control of the imaging process, dynamic focusing is investigated where all subsurface points are specified to have the same planar beam fronts. This gives the effect of using nondiffracting beams, but actually results from the use of multiple focusing depths for each Gaussian beam. However, now different local slant stacks must be performed depending on the position of the subsurface scattering point. To speed up the process, slant stacking of the local data windows is varied to match the focusing depths along individual beams when tracked back into the medium. The approach is tested with a simple model of 5-point scatterers which are then imaged with the data, and then to the imaging of a single dynamically focused beam for one shot gather computed from the Sigsbee2A model.


2001 ◽  
Vol 48 (2) ◽  
pp. 371-377
Author(s):  
Baida Lü ◽  
Shirong Luo ◽  
Xiaoling Ji

2012 ◽  
Vol 182 (4) ◽  
pp. 442 ◽  
Author(s):  
Vladimir G. Volostnikov
Keyword(s):  

2002 ◽  
Vol 728 ◽  
Author(s):  
Munir H. Nayfeh

AbstractWe dispersed electrochemically etched Si into ultrabright ultrasmall nanoparticles, with brightness higher than fluorescein or rhodamine. The emission from single particles is readily detectable. Aggregates or films of the particles exhibit emission with highly nonlinear characteristics. We observe directed blue beams at ∼ 410 nm between faces of aggregates excited by femtosecond radiation at 780 nm; and at ∼ 610 nm from aggregates of red luminescent Si nanoparticles excited by radiation at 550-570 nm from a mercury lamp. Intense directed Gaussian beams, a pumping threshold, spectral line narrowing, and speckle patterns manifest the emission. The results are analyzed in terms of population inversion and stimulated emission in quantum confinement-induced Si-Si dimer phase, found only on ultrasmall Si nanoparticles. This microlasing constitutes an important step towards the realization of a laser on a chip.


2007 ◽  
Author(s):  
James Keggin ◽  
Walter Rietveld ◽  
Mark Benson ◽  
Ted Manning ◽  
Peter Cook ◽  
...  
Keyword(s):  

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