TELLURIC ANOMALIES CAUSED BY SHALLOW STRUCTURES: ELLIPSOIDAL APPROXIMATIONS
Keyword(s):
An analytical solution for the electric field near an ellipsoid immersed in a semiinfinite medium is obtained to estimate the effect of shallow structures on telluric measurements. The determinant J of the Jacobean, which transforms telluric field from base to roving stations, may change across the boundary of different media by a factor equal to their resistivity ratio. At distances beyond one length of the intermediate axis from the edge of the ellipsoid, both the J-anomaly and the polarization of the normalized telluric field become negligible.
Keyword(s):
2002 ◽
Vol 09
(05n06)
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pp. 1827-1830
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2012 ◽
Vol 232
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pp. 117-121
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2019 ◽
Vol 30
(5)
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pp. 778-786
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1993 ◽
Vol 41
(1)
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pp. 129-135
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