Phosphorescence and Transmission Measurements for Chemical Quantification with Consumer Optoelectronic Products

2015 ◽  
Vol 13 (8) ◽  
pp. 674-678
Author(s):  
Satya Achanta ◽  
Sanghan Park ◽  
Chang-Soo Kim
Keyword(s):  
Transmission Measurements ◽  
Chemical Quantification

scholarly journals Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Prashanth Gopalan ◽  
Yunshan Wang ◽  
Berardi Sensale-Rodriguez
Keyword(s):  
Optical Transmission ◽  
Terahertz Spectroscopy ◽  
Design Guidelines ◽  
Two Dimensional ◽  
Highly Sensitive ◽  
Transmission Measurements ◽  
Metal Gratings ◽  
Low Sensitivity ◽  
Non Destructive

AbstractWhile terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs <  < 1 mS, remains elusive. This is primarily due to the low sensitivity of direct transmission measurements to such small sheet conductivity levels. In this work, we discuss harnessing the extraordinary optical transmission through gratings consisting of metallic stripes to characterize such low-conductive two-dimensional layers. We analyze the geometric tradeoffs in these structures and provide physical insights, ultimately leading to general design guidelines for experiments enabling non-contact, non-destructive, highly sensitive characterization of such layers.

scholarly journals Light transmission measurements and phototherapy eyepatches.

1991 ◽  
Vol 66 (1 Spec No) ◽  
pp. 59-61 ◽  
Author(s):  
J Robinson ◽  
M J Moseley ◽  
A R Fielder ◽  
S C Bayliss
Keyword(s):  
Light Transmission ◽  
Transmission Measurements

scholarly journals Chemical Quantification of Atomic-Scale EDS Maps under Thin Specimen Conditions

2014 ◽  
Vol 20 (6) ◽  
pp. 1782-1790 ◽  
Author(s):  
Ping Lu ◽  
Eric Romero ◽  
Shinbuhm Lee ◽  
Judith L. MacManus-Driscoll ◽  
Quanxi Jia
Keyword(s):  
Atomic Scale ◽  
Specimen Thickness ◽  
Peak Width ◽  
Thin Specimen ◽  
Gaussian Peak ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
The Relationship ◽  
Chemical Quantification

AbstractWe report our effort to quantify atomic-scale chemical maps obtained by collecting energy-dispersive X-ray spectra (EDS) using scanning transmission electron microscopy (STEM) (STEM-EDS). With thin specimen conditions and localized EDS scattering potential, the X-ray counts from atomic columns can be properly counted by fitting Gaussian peaks at the atomic columns, and can then be used for site-by-site chemical quantification. The effects of specimen thickness and X-ray energy on the Gaussian peak width are investigated using SrTiO3 (STO) as a model specimen. The relationship between the peak width and spatial resolution of an EDS map is also studied. Furthermore, the method developed by this work is applied to study cation occupancy in a Sm-doped STO thin film and antiphase boundaries (APBs) present within the STO film. We find that Sm atoms occupy both Sr and Ti sites but preferably the Sr sites, and Sm atoms are relatively depleted at the APBs likely owing to the effect of strain.

Sign in / Sign up

Export Citation Format

Share Document