Impact of Fringe Effect on Measuring Accuracy of Planar Capacitive Sensors

2011 ◽  
Vol 9 (4) ◽  
pp. 1458-1461 ◽  
Author(s):  
Wen Wang ◽  
Yaohua Wen ◽  
Jianping Yu ◽  
Zichen Chen
2020 ◽  
pp. 2000079
Author(s):  
Sara Rachel Arussy Ruth ◽  
Vivian Rachel Feig ◽  
Min-gu Kim ◽  
Yasser Khan ◽  
Jason Khoi Phong ◽  
...  

2015 ◽  
Vol 135 (4) ◽  
pp. 142-143 ◽  
Author(s):  
Daisuke Yamane ◽  
Toshifumi Konishi ◽  
Takaaki Matsushima ◽  
Shota Kamei ◽  
Kazuya Masu ◽  
...  

2017 ◽  
Vol 992 (4) ◽  
pp. 32-38 ◽  
Author(s):  
E.G. Voronin

The article opens a cycle of three consecutive publications dedicated to the phenomenon of the displacement of the same points in overlapping scans obtained adjacent CCD matrices with opto-electronic imagery. This phenomenon was noticed by other authors, but the proposed explanation for the origin of displacements and the resulting estimates are insufficient, and developed their solutions seem controversial from the point of view of recovery of the measuring accuracy of opticalelectronic space images, determined by the physical laws of their formation. In the first article the mathematical modeling of the expected displacements based on the design features of a scanning opto-electronic imaging equipment. It is shown that actual bias cannot be forecast, because they include additional terms, which may be gross, systematic and random values. The proposed algorithm for computing the most probable values of the additional displacement and ways to address some of the systematic components of these displacements in a mathematical model of optical-electronic remote sensing.


2021 ◽  
pp. 2008267
Author(s):  
Jing Qin ◽  
Li‐Juan Yin ◽  
Ya‐Nan Hao ◽  
Shao‐Long Zhong ◽  
Dong‐Li Zhang ◽  
...  
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