Advanced Magnetic Force Microscopy for High Resolution Magnetic Imaging

2012 ◽  
Vol 4 (6) ◽  
pp. 628-633 ◽  
Author(s):  
M. Ranjbar ◽  
S. N. Piramanayagam ◽  
R. Sbiaa ◽  
T. C. Chong ◽  
I. Okamoto
Keyword(s):  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Magnetic Imaging

A comparison of domain images obtained for nanophase alloys by magnetic force microscopy and high resolution Lorentz electron microscopy

1995 ◽  
Vol 31 (6) ◽  
pp. 3349-3351 ◽  
Author(s):  
M.R.J. Gibbs ◽  
M.A. Al-Khafaji ◽  
W.M. Rainforth ◽  
H.A. Davies ◽  
K. Babcock ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake
Keyword(s):  
Magnetic Material ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Force Microscopy ◽  
High Magnetic Moment ◽  
Tip Radius ◽  
Better Than ◽  
Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

scholarly journals High resolution magnetic force microscopy using focused ion beam modified tips

2002 ◽  
Vol 81 (5) ◽  
pp. 865-867 ◽  
Author(s):  
G. N. Phillips ◽  
M. Siekman ◽  
L. Abelmann ◽  
J. C. Lodder
Keyword(s):  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Force Microscopy

scholarly journals Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images

2004 ◽  
Vol 40 (4) ◽  
pp. 2194-2196 ◽  
Author(s):  
L. Gao ◽  
L.P. Yue ◽  
T. Yokota ◽  
R. Skomski ◽  
S.H. Liou ◽  
...  
Keyword(s):  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Force Microscopy

Perforated tips for high-resolution in-plane magnetic force microscopy

2000 ◽  
Vol 76 (7) ◽  
pp. 909-911 ◽  
Author(s):  
L. Folks ◽  
M. E. Best ◽  
P. M. Rice ◽  
B. D. Terris ◽  
D. Weller ◽  
...  
Keyword(s):  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy
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