Improved Reliability of InGaN-Based Light-Emitting Diodes by HfO2 Passivation Layer
2016 ◽
Vol 16
(2)
◽
pp. 1765-1767
2019 ◽
Vol 66
(10)
◽
pp. 4211-4215
◽
2006 ◽
Vol 45
(7)
◽
pp. 5970-5973
◽
2019 ◽
Vol 66
(1)
◽
pp. 505-511
◽
Keyword(s):
Keyword(s):
2007 ◽
Vol 127
(2)
◽
pp. 441-445
◽