X-Ray Reflectivity Analysis of Titanium Dioxide Thin Films Grown by Cathodic Arc Deposition

2014 ◽  
Vol 14 (5) ◽  
pp. 3902-3909 ◽  
Author(s):  
A. Kleiman ◽  
D. G. Lamas ◽  
A. F. Craievich ◽  
A. Márquez
2009 ◽  
Vol 61 (8) ◽  
pp. 789-792 ◽  
Author(s):  
Christoph Adelhelm ◽  
Thomas Pickert ◽  
Martin Balden ◽  
Marcin Rasinski ◽  
Tomasz Plocinski ◽  
...  

2003 ◽  
Vol 254-256 ◽  
pp. 463-466 ◽  
Author(s):  
B. Kepenek ◽  
U.Ö.Ş. Seker ◽  
A.F. Çakır ◽  
M. Ürgen ◽  
C. Tamerler

2009 ◽  
Vol 517 (5) ◽  
pp. 1567-1571 ◽  
Author(s):  
T. Saito ◽  
R. Horie ◽  
T. Den ◽  
A. Bendavid ◽  
E. Preston ◽  
...  

2016 ◽  
Vol 2 (02) ◽  
pp. 61
Author(s):  
Mukhtar Effendi ◽  
Bilalodin B

<span>Iron (Fe) doped titanium dioxide (TiO<span>2<span>) thin films have been successfully deposited by <span>using spin coating technique. X-ray diffraction (XRD) and Scanning Electron Microscope <span>(SEM) were employed to characterize the microstructure and crystallite morphology of the <span>films. It was indicated that the rutile crystal orientation appears due to increasing annealing <span>temperature of the thin films. Furthermore, increasing annealing temperature of the thin <span>films yielded an increasing of porosity value which is related to the application on gas <span>sensor films.</span></span></span></span></span></span><br /></span></span></span>


2005 ◽  
Vol 277 (1-4) ◽  
pp. 422-427 ◽  
Author(s):  
A.P. Huang ◽  
Ricky K.Y. Fu ◽  
Paul K. Chu ◽  
L. Wang ◽  
W.Y. Cheung ◽  
...  

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