Tuning of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration Using Current Source Mode

2011 ◽  
Vol 11 (7) ◽  
pp. 6266-6270 ◽  
Author(s):  
Kazutoshi Takiya ◽  
Yusuke Tomoda ◽  
Watari Kume ◽  
Shunsuke Ueno ◽  
Takato Watanabe ◽  
...  
Keyword(s):  
Field Emission ◽  
Current Source ◽  
Tunnel Resistance

Simultaneous tuning of tunnel resistance of integrated nanogaps by field-emission-induced electromigration

2011 ◽  
Author(s):  
Mitsuki Ito ◽  
Shunsuke Ueno ◽  
Takato Watanabe ◽  
Shunsuke Akimoto ◽  
Jun-ichi Shirakashi
Keyword(s):  
Field Emission ◽  
Tunnel Resistance

Control of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration

2007 ◽  
Vol 46 (No. 37) ◽  
pp. L907-L909 ◽  
Author(s):  
Sho Kayashima ◽  
Keisuke Takahashi ◽  
Motoaki Motoyama ◽  
Jun-ichi Shirakashi
Keyword(s):  
Field Emission ◽  
Tunnel Resistance

A newly investigated approach for the control of tunnel resistance of nanogaps using field-emission-induced electromigration

2012 ◽  
Vol 258 (6) ◽  
pp. 2029-2033 ◽  
Author(s):  
Kazutoshi Takiya ◽  
Yusuke Tomoda ◽  
Watari Kume ◽  
Shunsuke Ueno ◽  
Takato Watanabe ◽  
...  
Keyword(s):  
Field Emission ◽  
Tunnel Resistance

Study on the Driving Circuit of Carbon Nanotube Field Emission Display Based on Luminance Control

2014 ◽  
Vol 635-637 ◽  
pp. 1109-1113
Author(s):  
Qiao Ping Liu ◽  
Yan Ning Yang ◽  
Wei Xia Li
Keyword(s):  
Carbon Nanotube ◽  
Field Emission ◽  
Pulse Width Modulation ◽  
Current Source ◽  
Constant Current ◽  
Display Device ◽  
Si Substrate ◽  
Field Emission Display ◽  
Constant Current Source ◽  
Driving Circuit

Carbon nanotube field emission display (CNT-FED) is one of the most significant subjects due to its unique qualities and perfect performance. But there are still some problems in FED, for example, the modulation of each pixel unit of field emission display device is discrete, and the traditional voltage pulse-width modulation driving mode cannot solve luminance non-uniformity and non-linearity of FED. So a novel driving circuit based on cathode current source is proposed. The current driving circuit can be fabricated on Si substrate in advance, and then carbon nanotube is grown at room temperature, carbon nanotube and constant current source circuits are integrated on the same Si substrate. Current source circuit and cathode emission part are integrated together, which not only can solve the FED luminance problem, but also can meet FED thin design.

Observation of Phase Contrast Images in STEM and CTEM Modes by Using 100 kV Field Emission Electron Gun

1974 ◽  
Vol 32 ◽  
pp. 390-391
Author(s):  
Y. Harada ◽  
T. Goto ◽  
H. Koike ◽  
T. Someya
Keyword(s):  
Field Emission ◽  
Phase Contrast ◽  
Image Formation ◽  
Fresnel Diffraction ◽  
Experimental Results ◽  
Electron Gun ◽  
Scanning Microscopy ◽  
Emission Electron ◽  
Lattice Images

Since phase contrasts of STEM images, that is, Fresnel diffraction fringes or lattice images, manifest themselves in field emission scanning microscopy, the mechanism for image formation in the STEM mode has been investigated and compared with that in CTEM mode, resulting in the theory of reciprocity. It reveals that contrast in STEM images exhibits the same properties as contrast in CTEM images. However, it appears that the validity of the reciprocity theory, especially on the details of phase contrast, has not yet been fully proven by the experiments. In this work, we shall investigate the phase contrast images obtained in both the STEM and CTEM modes of a field emission microscope (100kV), and evaluate the validity of the reciprocity theory by comparing the experimental results.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

Observation of Atom Rows in Thorium Pyromellitate Using a Field Emission STEM

1977 ◽  
Vol 35 ◽  
pp. 80-81
Author(s):  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Field Emission ◽  
Amorphous Carbon ◽  
Carbon Film ◽  
Dark Field Image ◽  
Dark Field ◽  
Amorphous Carbon Film ◽  
Atomic Size ◽  
Wide Range ◽  
A Chain

It is interesting to observe polymers at atomic size resolution. Some works have been reported for thorium pyromellitate by using a STEM (1), or a CTEM (2,3). The results showed that this polymer forms a chain in which thorium atoms are arranged. However, the distance between adjacent thorium atoms varies over a wide range (0.4-1.3nm) according to the different authors.The present authors have also observed thorium pyromellitate specimens by means of a field emission STEM, described in reference 4. The specimen was prepared by placing a drop of thorium pyromellitate in 10-3 CH3OH solution onto an amorphous carbon film about 2nm thick. The dark field image is shown in Fig. 1A. Thorium atoms are clearly observed as regular atom rows having a spacing of 0.85nm. This lattice gradually deteriorated by successive observations. The image changed to granular structures, as shown in Fig. 1B, which was taken after four scanning frames.

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