Enhanced Field Emission from Compound Emitters of Carbon Nanotubes and ZnO Tetrapods by Electron Beam Bombardment

2011 ◽  
Vol 11 (6) ◽  
pp. 4968-4980
Author(s):  
Lei Wei ◽  
Xiaobing Zhang ◽  
Chaogang Lou ◽  
Zhiwei Zhao ◽  
Chen Jing ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Field Emission

Field Emission Properties of Individual Carbon Nanotubes in Nanorobotic Manipulation and Electron-Beam-Induced Deposition

2004 ◽  
Vol 16 (6) ◽  
pp. 597-603 ◽  
Author(s):  
Fumihito Arai ◽  
◽  
Pou Liu ◽  
Lixin Dong ◽  
Toshio Fukuda ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Field Emission ◽  
Emission Current ◽  
Emission Properties ◽  
Field Emission Properties ◽  
Field Emission Current ◽  
Multi Walled Carbon Nanotubes ◽  
Electron Beam Induced Deposition ◽  
Afm Cantilever

Field emission properties of individual multi-walled carbon nanotubes (MWNTs) were studied in nanorobotic manipulation and electron-beam-induced deposition (EBID). Nanotube emitters are constructed by picking up and assembling individual nanotubes on a commercially available atomic force microscope (AFM) cantilever or a tungsten probe. The relationship between field emission current and interelectrode distance was obtained by changing the distance between the tip of the nanotube emitter and the counterpart anode, which can be potentially applied as the principle for an approaching sensor to detect nanometer scale distance by observing field emission current in real time. Field emission current on a microampere scale from a CNT emitter was shown to be strong enough for EBID without obviously degrading emitters. Deposit topology was related to current density or the emitter shape, suggesting that information on emitter geometry could be obtained from EBID deposits. Energy dispersive X-ray spectrometry (EDS) analysis of deposits from W(CO)6showed that the tungsten mass exceeds 80% on the average among compositions. Much higher voltage may degrade the emitter, and saturated current may be used to adjust the emitter length in a controlled way.

Field Emission of Individual Carbon Nanotubes and its Improvement by Decoration with Ruthenium Dioxide Super-Nanoparticles

2005 ◽  
Vol 17 (4) ◽  
pp. 475-482 ◽  
Author(s):  
Pou Liu ◽  
◽  
Fumihito Arai ◽  
Lixin Dong ◽  
Toshio Fukuda ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Field Emission ◽  
Pure Metal ◽  
Ruthenium Dioxide ◽  
Field Emission Display ◽  
Multiwalled Carbon ◽  
Field Emission Properties ◽  
Reduce Energy Consumption ◽  
Electron Beam Induced Deposition

To reduce energy consumption by carbon nanotubes (CNTs) used as emitters in applications such as field emission display, and electron-beam-induced deposition (EBID), nano-sized metallic super-nanoparticles of ruthenium dioxide are decorated on the surface of CNTs. We studied field emission properties and found that the work voltage is 23% lower than that of as-grown CNT emitters. To obtain conductive nanostructures, electron-beam-induced deposition using an individual multiwalled carbon nanotube (MWNT) emitter decorated with ruthenium dioxide is realized by introducing tungsten hexacarbonyl (W(CO)6) as a precursor. The tungsten mass in deposits is rich at 98.89% as determined by energy x-ray dispersive spectrometer (EDS). We thus obtained nearly pure-metal deposits.

Carbon Nanotube Electrostatic Biprism: Principle of Operation and Proof of Concept

2004 ◽  
Vol 10 (4) ◽  
pp. 420-424 ◽  
Author(s):  
John Cumings ◽  
A. Zettl ◽  
M.R. McCartney
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Carbon Nanotube ◽  
Field Emission ◽  
Proof Of Concept ◽  
Transmission Electron

During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

Electron holography of p-n junctions

1996 ◽  
Vol 54 ◽  
pp. 974-975
Author(s):  
B.G. Frost ◽  
D.C. Joy ◽  
L.F. Allard ◽  
E. Voelkl
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Field Emission ◽  
Ccd Camera ◽  
Image Plane ◽  
Reference Wave ◽  
Field Of View ◽  
Control Mode ◽  
Objective Lens ◽  
Electron Holography

A wide holographic field of view (up to 15 μm in the Hitachi-HF2000) is achieved in a TEM by switching off the objective lens and imaging the sample by the first intermediate lens. Fig.1 shows the corresponding ray diagram for low magnification image plane off-axis holography. A coherent electron beam modulated by the sample in its amplitude and its phase is superimposed on a plane reference wave by a negatively biased Möllenstedt-type biprism.Our holograms are acquired utilizing a Hitachi HF-2000 field emission electron microscope at 200 kV. Essential for holography are a field emission gun and an electron biprism. At low magnification, the excitation of each lens must be appropriately adjusted by the free lens control mode of the microscope. The holograms are acquired by a 1024 by 1024 slow-scan CCD-camera and processed by the “Holoworks” software. The hologram fringes indicate positively and negatively charged areas in a sample by the direction of the fringe bending (Fig.2).

Effect of adsorbates on field emission from flame-synthesized carbon nanotubes

2008 ◽  
Vol 41 (19) ◽  
pp. 195401 ◽  
Author(s):  
Chun Li ◽  
Guojia Fang ◽  
Xiaoxia Yang ◽  
Nishuang Liu ◽  
Yuping Liu ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Field Emission
Sign in / Sign up

Export Citation Format

Share Document