In-Situ Electrical Addressing of One-Dimensional Gold Nanoparticle Assemblies

2008 ◽  
Vol 8 (1) ◽  
pp. 461-465 ◽  
Author(s):  
Kerstin Blech ◽  
Michael Noyong ◽  
Frederic Juillerat ◽  
Tomonobu Nakayama ◽  
Heinrich Hofmann ◽  
...  
Keyword(s):  
Gold Nanoparticle ◽  
Extreme Ultraviolet ◽  
Measuring Method ◽  
Interference Lithography ◽  
One Dimensional ◽  
Nanoscale Structures ◽  
Low Dimensional ◽  
Nanoparticle Chains ◽  
Scanning Electron

Substrates with 1-dimensional nanosize grooves were prepared using extreme-ultraviolet interference lithography (EUV-IL), wherein gold nanoparticles were self-assembled to form 1-dimensional structures. To measure the electrical properties of gold nanoparticle chains we introduce a novel in-situ measuring method based on nanomanipulator system in a scanning electron microscope. This method comprises enormous versatility for the precisely electrical addressing of low-dimensional nanoscale structures and may even be applied to routinely addressing of structures in the sub-10 nm range.

scholarly journals Hybrid One-Dimensional Nanostructures: One-Pot Preparation of Nanoparticle Chains via Directed Self-Assembly of in Situ Synthesized Discrete Au Nanoparticles

Langmuir ◽  
2012 ◽  
Vol 28 (14) ◽  
pp. 5947-5955 ◽  
Author(s):  
Marie V. Walter ◽  
Nicolas Cheval ◽  
Olimpia Liszka ◽  
Michael Malkoch ◽  
Amir Fahmi
Keyword(s):  
Self Assembly ◽  
Au Nanoparticles ◽  
One Pot ◽  
One Dimensional ◽  
Nanoparticle Chains ◽  
One Dimensional Nanostructures

Plasmon heating of one-dimensional gold nanoparticle chains

Solar Energy ◽  
2018 ◽  
Vol 173 ◽  
pp. 665-674 ◽  
Author(s):  
Xin Yan ◽  
Guohua Liu ◽  
Jinliang Xu ◽  
Shuai Wang
Keyword(s):  
Gold Nanoparticle ◽  
One Dimensional ◽  
Nanoparticle Chains

Nanoscale Measurements of Coupled Mechanical Electrical and Thermal Properties Using a Novel Characterization Tool

2005 ◽  
Author(s):  
Utkarsha Singh ◽  
Alexis Abramson ◽  
Vikas Prakash
Keyword(s):  
Thermal Properties ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Environmental Scanning ◽  
One Dimensional ◽  
Nanoscale Measurements ◽  
One Dimensional Nanostructures ◽  
Displacement Measurements ◽  
Scanning Electron

This paper presents the design and development of a nano-mechanical, electrical and thermal (NMET) characterization tool for coupled measurements of one-dimensional nanostructures. The device is designed to operate inside an environmental scanning electron microscope (ESEM) to facilitate in-situ imaging, positioning and testing. The design includes a custom nanomanipulator system, which assists in controlled placement of individual one-dimensional nanostructures (specimens) between two probes. Sample straining and unique direct force and displacement measurements are achieved by the use of a commercially available actuator. The “next generation” tool is also discussed.

MBE Growth of IV-VI Nanowires on a Self-organized Template

2010 ◽  
Vol 1258 ◽  
Author(s):  
Lee Andrew Elizondo ◽  
Patrick McCann ◽  
Joel Keay ◽  
Matthew Johnson
Keyword(s):  
Quantum Wires ◽  
High Energy ◽  
Ex Situ ◽  
Mbe Growth ◽  
One Dimensional ◽  
Force Microscopy ◽  
Self Organized ◽  
Atomic Force ◽  
Low Dimensional

AbstractWe present the experimental results for the first known molecular beam epitaxy (MBE) growth of quasi-one-dimensional PbSe wires on technologically relevant silicon.In this work, we describe the growth and characterization of low-dimensional IV-VI semiconductors as they evolve from one-dimensional dot/dot-chains to one-dimensional structures on a self-organized template epitaxially grown on Si(110). In situ and ex situ characterization were performed at various stages throughout growth by reflection high energy electron diffraction, scanning electron microscopy, and non-contact atomic force microscopy. Initial growths resulted in some preferential alignment of the PbSe dot-chains parallel to the self-organized template in the [-110] direction. By reducing the substrate temperature and increasing the supplemental Se flux, the morphology of dot-chains extend into lengthened one-dimensional structures. This is an important milestone in the fabrication of PbSe quantum wires on technologically relevant silicon.

In situ template synthesis of one-dimensional gold nanoparticle arrays in organic nanowires

RSC Advances ◽  
2013 ◽  
Vol 3 (37) ◽  
pp. 16243 ◽  
Author(s):  
Taro Matsushita ◽  
Yurina Fukumoto ◽  
Takaya Kawakami ◽  
Takaaki Tsuruoka ◽  
Takashi Murashima ◽  
...  
Keyword(s):  
Gold Nanoparticle ◽  
Template Synthesis ◽  
Nanoparticle Arrays ◽  
One Dimensional

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Dynamics of Nanoparticle Chain Aggregates of Carbon Under Tension

2003 ◽  
Vol 778 ◽  
Author(s):  
Rajdip Bandyopadhyaya ◽  
Weizhi Rong ◽  
Yong J. Suh ◽  
Sheldon K. Friedlander
Keyword(s):  
Mechanical Properties ◽  
Carbon Black ◽  
Polymer Film ◽  
Elastic Behavior ◽  
Small Strains ◽  
Transmission Electron ◽  
Chain Aggregates ◽  
Nanoparticle Chains ◽  
Reinforcing Filler

AbstractCarbon black in the form of nanoparticle chains is used as a reinforcing filler in elastomers. However, the dynamics of the filler particles under tension and their role in the improvement of the mechanical properties of rubber are not well understood. We have studied experimentally the dynamics of isolated nanoparticle chain aggregates (NCAs) of carbon made by laser ablation, and also that of carbon black embedded in a polymer film. In situ studies of stretching and contraction of such chains in the transmission electron microscope (TEM) were conducted under different maximum values of strain. Stretching causes initially folded NCA to reorganize into a straight, taut configuration. Further stretching leads to either plastic deformation and breakage (at 37.4% strain) or to a partial elastic behavior of the chain at small strains (e.g. 2.3% strain). For all cases the chains were very flexible under tension. Similar reorientation and stretching was observed for carbon black chains embedded in a polymer film. Such flexible and elastic nature of NCAs point towards a possible mechanism of reinforcement of rubber by carbon black fillers.

High-Resolution Resistance Mapping in SEM

2018 ◽  
Author(s):  
Grigore Moldovan ◽  
Wolfgang Joachimi ◽  
Guillaume Boetsch ◽  
Jörg Jatzkowski ◽  
Frank Altman
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Reference Structure ◽  
Total Resistance ◽  
Embedded Electronics ◽  
Improved Performance ◽  
Mapping Techniques ◽  
Scanning Electron

Abstract This work presents advanced resistance mapping techniques based on Scanning Electron Microscopy (SEM) with nanoprobing systems and the related embedded electronics. Focus is placed on recent advances to reduce noise and increase speed, such as integration of dedicated in situ electronics into the nanoprobing platform, as well as an important transition from current-sensitive to voltagesensitive amplification. We show that it is now possible to record resistance maps with a resistance sensitivity in the 10W range, even when the total resistance of the mapped structures is in the range of 100W. A reference structure is used to illustrate the improved performance, and a lowresistance failure case is presented as an example of analysis made possible by these developments.

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