Electronic Properties of a Single-Walled Carbon Nanotube/150mer-Porphyrin System Measured by Point-Contact Current Imaging Atomic Force Microscopy

2006 ◽  
Vol 6 (6) ◽  
pp. 1644-1648 ◽  
Author(s):  
Hirofumi Tanaka ◽  
Takashi Yajima ◽  
Masahiro Kawao ◽  
Takuji Ogawa
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Electronic Properties ◽  
Point Contact ◽  
Single Walled Carbon Nanotube ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force

scholarly journals Controlling conducting channels of single-walled carbon nanotube array with atomic force microscopy

2017 ◽  
Vol 7 (8) ◽  
pp. 759-764 ◽  
Author(s):  
Jean Pierre Nshimiyimana ◽  
Jian Zhang ◽  
Xiao Hu ◽  
Xiannian Chi ◽  
Pei Wu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Nanotube Array ◽  
Single Walled Carbon Nanotube ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Carbon Nanotube Array ◽  
Atomic Force

Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3707-3710 ◽  
Author(s):  
Nami Choi ◽  
Takayuki Uchihashi ◽  
Hidehiro Nishijima ◽  
Takao Ishida ◽  
Wataru Mizutani ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Walled Carbon Nanotubes

Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects

2012 ◽  
Vol 23 (30) ◽  
pp. 305707 ◽  
Author(s):  
A Schulze ◽  
T Hantschel ◽  
A Dathe ◽  
P Eyben ◽  
X Ke ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Electrical Tomography ◽  
Force Microscopy ◽  
Atomic Force
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