Simulations of a Dielectric Slot Tip for Scanning Near-Field Microwave Microscope

2011 ◽  
Vol 8 (8) ◽  
pp. 1556-1563 ◽  
Author(s):  
Patrick Leidenberger ◽  
Philipp Schönle ◽  
Christian Hafner
Keyword(s):  
Near Field ◽  
Microwave Microscope

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

A proof of concept of a non-resonant near-field microwave microscope based on a high impedance reflectometer

2013 ◽  
Vol 5 (3) ◽  
pp. 301-308
Author(s):  
David Glay ◽  
Adelhatif El Fellahi ◽  
Tuami Lasri
Keyword(s):  
Near Field ◽  
Metal Plate ◽  
Microwave Circuit ◽  
Proof Of Concept ◽  
Capacitance Measurements ◽  
High Impedance ◽  
Microwave Microscope ◽  
Lumped Elements

In this paper, we present a non-resonant high impedance reflectometer with a reference impedance close to one of the tip probe of a near-field microwave microscope. We show that for an apex of the tip probe of 100 µm there is an optimum reference impedance close to 1 kΩ. To validate this approach a microwave circuit that makes use of lumped elements has been fabricated. A proof of concept is also explored for capacitance measurements between the tip probe and a metal plate.

Magnetic permeability imaging of metals with a scanning near-field microwave microscope

2000 ◽  
Vol 77 (26) ◽  
pp. 4404-4406 ◽  
Author(s):  
Sheng-Chiang Lee ◽  
C. P. Vlahacos ◽  
B. J. Feenstra ◽  
Andrew Schwartz ◽  
D. E. Steinhauer ◽  
...  
Keyword(s):  
Magnetic Permeability ◽  
Near Field ◽  
Microwave Microscope

scholarly journals Surface resistance imaging with a scanning near-field microwave microscope

1997 ◽  
Vol 71 (12) ◽  
pp. 1736-1738 ◽  
Author(s):  
D. E. Steinhauer ◽  
C. P. Vlahacos ◽  
S. K. Dutta ◽  
F. C. Wellstood ◽  
Steven M. Anlage
Keyword(s):  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope

Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope

2009 ◽  
Vol 109 (8) ◽  
pp. 958-962 ◽  
Author(s):  
Jongchel Kim ◽  
Arsen Babajanyan ◽  
Tigran Sargsyan ◽  
Harutyun Melikyan ◽  
Seungwan Kim ◽  
...  
Keyword(s):  
Solar Cells ◽  
Near Field ◽  
Silicon Solar Cells ◽  
Microwave Microscope ◽  
Near Field Scanning
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