S.I.D.O.M. Detector, Surface Imaging Detector of Matter

2016 ◽  
Vol 5 (1) ◽  
pp. 49-54
Author(s):  
Domenico Bassani ◽  
Daniele Schito
Keyword(s):  
Surface Imaging ◽  
Imaging Detector ◽  
Detector Surface

Point-projection imaging of biological objects

1988 ◽  
Vol 46 ◽  
pp. 440-441
Author(s):  
J. A. Panitz
Keyword(s):  
Counter Electrode ◽  
Imaging Modality ◽  
Charged Particles ◽  
Specimen Surface ◽  
Surface Imaging ◽  
Lateral Velocity ◽  
Biological Objects ◽  
Imaging Detector ◽  
Detector Surface ◽  
Point Projection

Point-projection microscopy is an attractive surface imaging modality. High magnification, resolution, and contrast are easily achieved by radially projecting charged particles from a specimen mounted several centimeters in front of an imaging detector within a vacuum environment. Stigmation, drift and alignment problems are negligible, or nonexistent. The trick is to generate charged particles at or near the surface of the specimen that must coincide with the surface of a smoothly curved, conducting electrode of radius R. A potential difference applied between this electrode and a counter electrode, coincident with the detector surface, accelerates the charged particles radially into space. When the charged particles reach the detector they will have magnified their point of origin at the specimen surface by ∼D/R, where D is the separation of the electrodes. For D ∼10 cm and R ∼100 nm, the magnification is ∼106. If the particles have a forward velocity much greater than their lateral velocity (and a small DeBroglie wavelength), a highly resolved image of the specimen surface will appear at the detector.

High Resolution Low Loss Microscopy of Crystalline Surfaces

1980 ◽  
Vol 38 ◽  
pp. 162-163
Author(s):  
William Krakow ◽  
Alec N. Broers
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Surface Topography ◽  
Secondary Electron ◽  
Objective Lens ◽  
Surface Imaging ◽  
Low Loss ◽  
Fine Grained ◽  
Scanning Electron ◽  
Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

Measurement of the parameters of a linear CCD structure as a one-dimensional X-ray imaging detector

1983 ◽  
Vol 208 (1-3) ◽  
pp. 427-433 ◽  
Author(s):  
M.G. Fedotov ◽  
E.A. Kuper ◽  
V.N. Litvinenko ◽  
V.E. Panchenko ◽  
V.A. Ushakov
Keyword(s):  
One Dimensional ◽  
X Ray ◽  
Linear Ccd ◽  
X Ray Imaging ◽  
Imaging Detector

scholarly journals Novel spirometry based on optical surface imaging

2015 ◽  
Vol 42 (4) ◽  
pp. 1690-1697 ◽  
Author(s):  
Guang Li ◽  
Hailiang Huang ◽  
Jie Wei ◽  
Diana G. Li ◽  
Qing Chen ◽  
...  
Keyword(s):  
Surface Imaging ◽  
Optical Surface

Frameless, Real-time, Surface Imaging Guided Radiosurgery (SIG-RS): Clinical Outcomes for Brain Metastases

2012 ◽  
Vol 84 (3) ◽  
pp. S290-S291
Author(s):  
H. Pan ◽  
L.I. Cerviño ◽  
T. Pawlicki ◽  
S.B. Jiang ◽  
J. Alksne ◽  
...  
Keyword(s):  
Brain Metastases ◽  
Real Time ◽  
Clinical Outcomes ◽  
Surface Imaging
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