scholarly journals National survey on intra-laboratory turnaround time for some most common routine and stat laboratory analyses in 479 laboratories in China

2015 ◽  
Vol 25 (2) ◽  
pp. 213-221 ◽  
Author(s):  
Yang Fei ◽  
Rong Zeng ◽  
Wei Wang ◽  
Falin He ◽  
Kun Zhong ◽  
...  
Keyword(s):  
National Survey ◽  
Turnaround Time ◽  
Stat Laboratory

scholarly journals Additional technician tasks and turnaround time in the clinical Stat laboratory

2016 ◽  
pp. 243-247 ◽  
Author(s):  
Maria Salinas ◽  
Maite López-Garrigós ◽  
Emilio Flores ◽  
Maria Leiva-Salinas ◽  
Rosa Lillo ◽  
...  
Keyword(s):  
Turnaround Time ◽  
Stat Laboratory

scholarly journals National survey on turnaround time of clinical biochemistry tests in 738 laboratories in China

2017 ◽  
Vol 32 (2) ◽  
pp. e22251
Author(s):  
Xiaoyan Zhang ◽  
Yang Fei ◽  
Wei Wang ◽  
Haijian Zhao ◽  
Minqi Wang ◽  
...  
Keyword(s):  
National Survey ◽  
Clinical Biochemistry ◽  
Turnaround Time

scholarly journals Evaluation and Improvement Strategy of Analytical Turnaround Time in the Stat Laboratory

2007 ◽  
Vol 106 (7) ◽  
pp. 558-564 ◽  
Author(s):  
Tzu-I Chien ◽  
Jin-Ying Lu ◽  
Jau-Tsuen Kao ◽  
Ya-Chih Cheng ◽  
Ya-Fen Lee
Keyword(s):  
Turnaround Time ◽  
Improvement Strategy ◽  
Stat Laboratory

Advanced TEM sample preparation techniques for submicron Si devices

1995 ◽  
Vol 53 ◽  
pp. 516-517 ◽  
Author(s):  
P. B. Basham ◽  
H. L. Tsai
Keyword(s):  
Sample Preparation ◽  
Process Development ◽  
Light Transmission ◽  
Specific Area ◽  
Turnaround Time ◽  
Small Hole ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Polished Side ◽  
Preparation Techniques

The use of transmission electron microscopy (TEM) to support process development of advanced microelectronic devices is often challenged by a large amount of samples submitted from wafer fabrication areas and specific-spot analysis. Improving the TEM sample preparation techniques for a fast turnaround time is critical in order to provide a timely support for customers and improve the utilization of TEM. For the specific-area sample preparation, a technique which can be easily prepared with the least amount of effort is preferred. For these reasons, we have developed several techniques which have greatly facilitated the TEM sample preparation.For specific-area analysis, the use of a copper grid with a small hole is found to be very useful. With this small-hole grid technique, TEM sample preparation can be proceeded by well-established conventional methods. The sample is first polished to the area of interest, which is then carefully positioned inside the hole. This polished side is placed against the grid by epoxy Fig. 1 is an optical image of a TEM cross-section after dimpling to light transmission.

Outcomes Measurement and Management: Collection of Data in University Clinics: A National Survey

2003 ◽  
Vol 13 (3) ◽  
pp. 13-15
Author(s):  
Karen Bailey-Jones ◽  
Rosemary B. Lubinski ◽  
D. Jeffery Higginbotham
Keyword(s):  
National Survey ◽  
Outcomes Measurement

A national survey of epidural practice

Anaesthesia ◽  
2001 ◽  
Vol 56 (10) ◽  
pp. 1021-1021 ◽  
Author(s):  
L. Bannon ◽  
M. Alexander-Williams ◽  
D. Lutman
Keyword(s):  
National Survey
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