scholarly journals Neutron Diffraction Texture Analysis Using a 2θ-Position Sensitive Detector

1982 ◽  
Vol 5 (3) ◽  
pp. 153-170 ◽  
Author(s):  
H. J. Bunge ◽  
H. R. Wenk ◽  
J. Pannetier
Keyword(s):  
Neutron Diffraction ◽  
Independent Method ◽  
Position Sensitive Detector ◽  
Diffraction Spectrum ◽  
Sensitive Detector ◽  
Peak Separation ◽  
Large Lattice ◽  
Sample Position ◽  
Position Sensitive ◽  
Overlapping Peaks

A method for pole figure measurements in textured samples using neutron diffraction and a position sensitive detector is described. The position sensitive detector allows one to record the whole 2ϑ-spectrum of one sample position simultaneously, i.e. in reasonable time. The availability of the complete 2ϑ spectrum allows separation of overlapping peaks by a deconvolution process. A second independent method of peak separation is based on the crystallographic relations between peaks of various indices (hkl). The method allows extraction of the maximum possible information about the texture out of a polycrystal diffraction spectrum. It is thus especially suited to texture studies in materials having complex diffraction spectra with overlapping peaks, i.e. materials with low crystal symmetry and large lattice parameters as they are frequently encountered in geology.

X-Ray Texture Measurement Using a Position Sensitive Detector

1991 ◽  
Vol 35 (A) ◽  
pp. 309-319 ◽  
Author(s):  
L. Wcislak ◽  
H.J. Bunge ◽  
M. Haase ◽  
C. Nauer-Gerhardt
Keyword(s):  
Practical Method ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Diffraction Vector ◽  
Texture Measurement ◽  
Peak Overlap ◽  
Peak Separation ◽  
Peak Broadening ◽  
Sample Orientation ◽  
Position Sensitive

AbstractFor pole figure measurement the flat sample has to be tilted which leads to peak broadening and peak overlap in peak-reach diffraction spectra. Using a linear position sensitive detector /PSD/, complete diffraction spectra can be obtained in each sample orientation. Peak separation can then be done by Gaussian fitting. When measuring with a PSD, each diffraction peak corresponds to a particular diffraction vector. This has to be taken into consideration by a coordinate transformation. The PSD-method is the only practical method of texture measurement for materials with complex diffraction spectra.

A position-sensitive detector for neutron diffraction topography

1988 ◽  
Vol 21 (1) ◽  
pp. 28-33 ◽  
Author(s):  
J. Baruchel ◽  
K. Kuroda ◽  
P. Liaud ◽  
A. Michalowicz ◽  
D. Sillou
Keyword(s):  
Neutron Diffraction ◽  
Thermal Neutron ◽  
Spatial Resolution ◽  
Detection Efficiency ◽  
Position Sensitive Detector ◽  
Sensitive Area ◽  
Sensitive Detector ◽  
Position Sensitive

The first test of a position-sensitive photomultiplier in a thermal neutron diffraction topography experiment is reported: a spatial resolution was obtained of ≃200 μm in FWHM over a sensitive area of size ≃8 × 8 mm (≃1600 pixels) and a detection efficiency of the order of 15% when using a 0.25 mm thick ZnS–LiF (NE 426) scintillator. The advantages of this detector, its foreseeable improvements, and the scientific problems it could help to solve are discussed.

scholarly journals Apparatus for Dynamical Texture Measurements by Neutron Diffraction Using a Position Sensitive- Detector

1983 ◽  
Vol 5 (4) ◽  
pp. 239-251 ◽  
Author(s):  
D. Juul Jensen ◽  
J. K. Kjems
Keyword(s):  
Neutron Diffraction ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Neutron Spectrometer ◽  
Hot Air ◽  
New Apparatus ◽  
Position Sensitive ◽  
Set Up ◽  
Counting Statistics ◽  
Kinetics Of

A new apparatus for dynamical texture measurements using neutron diffraction has been developed. A variable wavelength neutron spectrometer has been modified to incorporate a linear position-sensitive detector. The sample is orientated by a fully automatic Euler goniometer, and it can be heated by a stream of hot air at rates up to 200℃/min. A quarter of a complete pole figure can be recorded in 14 minutes with an accuracy, determined by counting statistics, of 2–3%. The experimental set-up is described in the present paper and the performance, including sources of systematical errors, is discussed. Finally the viability of this apparatus is demonstrated by studies of the recrystallization kinetics of 95% cold rolled copper.

scholarly journals Texture Analysis by Neutron Diffraction Using a Linear Position Sensitive Detector

1989 ◽  
Vol 10 (4) ◽  
pp. 375-387 ◽  
Author(s):  
G. Will ◽  
W. Schäfer ◽  
P. Merz
Keyword(s):  
Neutron Diffraction ◽  
Texture Analysis ◽  
Profile Analysis ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
Position Sensitive ◽  
Hematite Ore ◽  
Position Sensitive Detectors ◽  
Low Symmetry

Neutron diffraction in connection with a position-sensitive detector is a most powerful technique in texture analysis comparable in time with conventional X-ray laboratory technique. Neutrons measure the global texture of the sample allowing volumes up to several cm3. By using position-sensitive detectors and applying the mathematical procedures of profile analysis multiphase and low symmetry materials can be investigated without serious difficulties. Neutron diffraction experiments operating in transmission record complete diffraction profiles; overlapping lines are unscrambled by profile analysis. Technical and physical specifications of the dedicated detector JULIOS, installed on the texture diffractometer of Bonn University, are given. A hematite ore has been studied by this technique and the results are given.

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