A Unified View of Methods to Resolve the Inverse Problem of Texture Goniometry

H. Schaeben

doi:10.1155/tsm.25.171

A Unified View of Methods to Resolve the Inverse Problem of Texture Goniometry

Textures and Microstructures ◽

10.1155/tsm.25.171 ◽

1996 ◽

Vol 25 (2-4) ◽

pp. 171-181 ◽

Cited By ~ 8

Author(s):

H. Schaeben

Keyword(s):

Inverse Problem ◽

Projection Operator ◽

Unified View ◽

Novel Approaches ◽

Tomographic Projection

Invariants of the tomographic projection operator of texture goniometry and counterexamples provide a unified view of existing methods to resolve the corresponding inverse problem and may be instructive to develop novel approaches.

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Evaluation measures for hierarchical classification: a unified view and novel approaches

Data Mining and Knowledge Discovery ◽

10.1007/s10618-014-0382-x ◽

2014 ◽

Vol 29 (3) ◽

pp. 820-865 ◽

Cited By ~ 43

Author(s):

Aris Kosmopoulos ◽

Ioannis Partalas ◽

Eric Gaussier ◽

Georgios Paliouras ◽

Ion Androutsopoulos

Keyword(s):

Hierarchical Classification ◽

Evaluation Measures ◽

Unified View ◽

Novel Approaches

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Plasticity of the neural coding metaphor: An unnoticed rhetoric in scientific discourse

Behavioral and Brain Sciences ◽

10.1017/s0140525x1900133x ◽

2019 ◽

Vol 42 ◽

Author(s):

Giulia Frezza ◽

Pierluigi Zoccolotti

Keyword(s):

Discourse Analysis ◽

Neural Coding ◽

Scientific Discourse ◽

Convincing Argument ◽

Unified View ◽

Brain Behavior

Abstract The convincing argument that Brette makes for the neural coding metaphor as imposing one view of brain behavior can be further explained through discourse analysis. Instead of a unified view, we argue, the coding metaphor's plasticity, versatility, and robustness throughout time explain its success and conventionalization to the point that its rhetoric became overlooked.

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Novel Approaches to Low-Voltage Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180586 ◽

1990 ◽

Vol 48 (1) ◽

pp. 366-367

Author(s):

Arthur V. Jones

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Electron Optics ◽

Current Interest ◽

New Concepts ◽

Opportune Time ◽

Novel Approaches ◽

Voltage Scanning ◽

Scanning Electron

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.

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