scholarly journals Fast Texture Measurements Using a Position Sensitive Detector

1989 ◽  
Vol 10 (4) ◽  
pp. 361-373 ◽  
Author(s):  
Dorte Juul Jensen ◽  
Torben Leffers

A technique for fast texture determination by neutron diffraction is described. With the technique a complete texture analysis requires from 15 to 45 minutes measuring time and the kinetics of the development in single texture components can be studied with a time resolution of the order of seconds. It is shown how these two measuring principles can be used for in-situ kinetic investigations of recrystallization. Independent of speed, texture measurement by neutron diffraction has an advantage in improved statistics which is examplified by a series of measurements on the early stage of texture development in copper and brass.

1983 ◽  
Vol 5 (4) ◽  
pp. 239-251 ◽  
Author(s):  
D. Juul Jensen ◽  
J. K. Kjems

A new apparatus for dynamical texture measurements using neutron diffraction has been developed. A variable wavelength neutron spectrometer has been modified to incorporate a linear position-sensitive detector. The sample is orientated by a fully automatic Euler goniometer, and it can be heated by a stream of hot air at rates up to 200℃/min. A quarter of a complete pole figure can be recorded in 14 minutes with an accuracy, determined by counting statistics, of 2–3%. The experimental set-up is described in the present paper and the performance, including sources of systematical errors, is discussed. Finally the viability of this apparatus is demonstrated by studies of the recrystallization kinetics of 95% cold rolled copper.


2021 ◽  
Vol 5 (2) ◽  
pp. 11
Author(s):  
Pingguang Xu ◽  
Klaus-Dieter Liss

In contrast to conventional angle dispersive neutron diffractometers with a single-tube detector or a small-size linear position-sensitive detector, the WOMBAT diffractometer of the Australian Nuclear Science and Technology Organisation (ANSTO) is equipped with a large-area curved position-sensitive detector, spanning 120° for the scattering angle 2θ and 15° for the azimuth η, respectively. Here, WOMBAT was employed in establishing a texture measurement environment for complex textured samples, through measuring neutron diffractograms at two selected wavelengths on a typical reference sample of martensite–austenite multilayered steel sheet. All neutron patterns were simultaneously Rietveld analyzed using the software, Materials Analysis Using Diffraction (MAUD). The shorter wavelength (λ1 = 1.54 Å, k1 = 4.08 Å−1) enabled collecting the martensite reflections α-110, α-200, α-211, α-220, α-310, and α-222, as well as the austenite peaks γ-111, γ-200, γ-220, γ-311, γ-222, and γ-331 simultaneously, by pre-setting the detector range to 2θ = 30~150°. The longer wavelength (λ2 = 2.41 Å, k2 = 2.61 Å−1) enabled separating the overlapping strong martensite α-110 and austenite γ-111 Laue–Bragg interferences more reliably. Moreover, the detector panel division along the vertical direction has a good stereographic coverage in the azimuthal angle η. Such a combination of multiple-wavelength neutron diffraction combined with simultaneous Rietveld texture analysis was confirmed as being very valuable for realizing high precision measurements for complex textured samples at an orientation distribution graticule of 5°, and in a much shorter beam time than the conventional angle dispersive method.


1999 ◽  
Vol 06 (06) ◽  
pp. 1053-1060 ◽  
Author(s):  
N. TABET ◽  
J. AL-SADAH ◽  
M. SALIM

X-ray Photoelectron Spectroscopy (XPS) has been used to investigate the oxidation of (011) Ge substrates. The sample surfaces were CP4-etched, then annealed in situ, at different temperatures, for various durations. Dry and wet atmospheres were used. The oxidation rate during the early stage was increased by the presence of moisture in the atmosphere. A simple model was used to define and determine an apparent thickness of the oxide film from XPS measurements. The time dependence of the apparent thickness is consistent with a partial coverage of the surface by oxide islands. The growth kinetics of the oxide islands obeys a nearly cubic law.


2002 ◽  
Vol 334 (1-2) ◽  
pp. 267-276 ◽  
Author(s):  
M. Latroche ◽  
Y. Chabre ◽  
B. Decamps ◽  
A. Percheron-Guégan ◽  
D. Noreus

1996 ◽  
Vol 11 (3) ◽  
pp. 209-217 ◽  
Author(s):  
H. J. Bunge ◽  
N. J. Park

Error quantities, defined earlier to estimate the accuracy of texture measurement, are used to define a probability criterion for correct indexing of powder diffraction diagrams. The criterion is based on the compatibility of pole density distribution functions of different (hkl) depending on the directions {θ,γ}(hkl) of the reciprocal lattice vectors r*(hkl). The criterion was applied to permutation of the indices and variation of the angles {θ,γ}(hkl) in the vicinity of the correct values. In fortunate case, these angles can be determined within a few degrees by minimizing the error quantities. The method works very well with strong textures but it is still applicable if only weak textures can be achieved. The method was tested with different crystal symmetries including cubic, hexagonal, orthorhombic, and monoclinic. It is concluded that the criterion can be successfully applied to all crystal symmetries. If a measuring technique based on a position sensitive detector is used, even multifold peak superpositions in tilted sample orientations can be resolved. The method can also be applied if some (hkl) cannot be separated experimentally.


2019 ◽  
Vol 790 ◽  
pp. 502-508 ◽  
Author(s):  
Michele Catti ◽  
Oscar Fabelo ◽  
Alessandra Filabozzi ◽  
Antonino Pietropaolo ◽  
Alessia Santucci ◽  
...  

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