scholarly journals Rare Earth-Doped BiFeO3Thin Films: Relationship between Structural and Magnetic Properties

2015 ◽  
Vol 2015 ◽  
pp. 1-5 ◽  
Author(s):  
Ngo Thu Huong ◽  
Seunghun Lee ◽  
Timur Sh. Atabaev ◽  
Makio Kurisu ◽  
Nguyen Hoa Hong

Rare Earth- (RE-) doped BiFeO3(BFO) thin films were grown on LaAlO3substrates by using pulsed laser deposition technique. All of BFO films doped with 10% of RE show a single phase of rhombohedral structure. The saturated magnetization in the Ho- and Sm-doped films is much larger than those reported in literature and was observed at a quite low field as of 0.2 T. As for Pr- and Nd-doped BFO films, Fe2+amount is not dominant; thus, ferromagnetism is not favored. As the RE concentration goes up to 20%, all compounds have drastically gone through a structural transition. The RE-doped BFO films have changed from rhombohedral to either pure orthorhombic phase (for Ho, Sm), or a mixed phase of orthorhombic and tetragonal (for Pr, Nd), or pure tetragonal (for Eu). We observed magnetic properties of RE-doped BFO films have significantly changed. While 20% Ho/Sm-doped BFO films have ferromagnetism degraded in comparison with the 10% doping case, the 20% Pr/Nd-doped BFO thin films, whose structure is a mixed phase, have magnetic ordering improved due to the fact that the Fe2+amount has become greater. It seems that one can control the magnetic properties of BFO films by using appropriate RE dopants and concentrations.

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 724
Author(s):  
Sara Massardo ◽  
Alessandro Cingolani ◽  
Cristina Artini

Rare earth-doped ceria thin films are currently thoroughly studied to be used in miniaturized solid oxide cells, memristive devices and gas sensors. The employment in such different application fields derives from the most remarkable property of this material, namely ionic conductivity, occurring through the mobility of oxygen ions above a certain threshold temperature. This feature is in turn limited by the association of defects, which hinders the movement of ions through the lattice. In addition to these issues, ionic conductivity in thin films is dominated by the presence of the film/substrate interface, where a strain can arise as a consequence of lattice mismatch. A tensile strain, in particular, when not released through the occurrence of dislocations, enhances ionic conduction through the reduction of activation energy. Within this complex framework, high pressure X-ray diffraction investigations performed on the bulk material are of great help in estimating the bulk modulus of the material, and hence its compressibility, namely its tolerance toward the application of a compressive/tensile stress. In this review, an overview is given about the correlation between structure and transport properties in rare earth-doped ceria films, and the role of high pressure X-ray diffraction studies in the selection of the most proper compositions for the design of thin films.


2016 ◽  
Vol 52 (9) ◽  
pp. 932-938 ◽  
Author(s):  
G. V. Bazuev ◽  
O. I. Gyrdasova ◽  
S. I. Novikov ◽  
A. Yu. Kuznetsov

2013 ◽  
Vol 88 (9) ◽  
Author(s):  
K. I. Doig ◽  
F. Aguesse ◽  
A. K. Axelsson ◽  
N. M. Alford ◽  
S. Nawaz ◽  
...  

2002 ◽  
Vol 91 (10) ◽  
pp. 8180 ◽  
Author(s):  
V. Neu ◽  
U. Hannemann ◽  
S. Fähler ◽  
B. Holzapfel ◽  
L. Schultz

2014 ◽  
Vol 117 (1) ◽  
pp. 197-205 ◽  
Author(s):  
O. G. Pompilian ◽  
G. Dascalu ◽  
I. Mihaila ◽  
S. Gurlui ◽  
M. Olivier ◽  
...  

2014 ◽  
Vol 34 (16) ◽  
pp. 4457-4462 ◽  
Author(s):  
Mario Borlaf ◽  
María T. Colomer ◽  
Rodrigo Moreno ◽  
Angel L. Ortiz

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