scholarly journals Structural, Thermal, Optical, Electrical, and Adhesive Characteristics of FePdB Thin Films

2015 ◽  
Vol 2015 ◽  
pp. 1-5
Author(s):  
Yuan-Tsung Chen
Keyword(s):  
Thin Films ◽  
Activation Energy ◽  
Room Temperature ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Adhesive Properties ◽  
X Ray ◽  
Face Centered ◽  
Xrd Patterns

To study the structural, thermal, electrical, optical, and adhesive properties of magnetic FePdB thin films, 25–200-Å-thick Fe40Pd40B20and Fe60Pd20B20films were deposited on a glass substrate by direct current (DC) magnetron sputtering at room temperature (RT). X-ray diffraction (XRD) patterns indicated that the 25–75-Å-thick Fe40Pd40B20and Fe60Pd20B20films were amorphous, whereas the 100–200-Å-thick Fe40Pd40B20and Fe60Pd20B20films were crystalline, with a face-centered cubic (FCC) FePd (111) textured structure. The activation energy of the Fe40Pd40B20and Fe60Pd20B20thin films decreased as thickness was increased. The 25-Å-thick Fe40Pd40B20film exhibited the highest resistivity, whereas the 200-Å-thick Fe60Pd20B20film exhibited the lowest resistivity. Increasing the thickness and crystallization reduced transmission. The Fe40Pd40B20thin films exhibited higher surface energy and stronger adhesion than did Fe60Pd20B20thin films.

Controlling Aspect Ratio of Copper Group Nanowire Arrays by Electrochemical Deposition in the Nanopores of AAO

2011 ◽  
Vol 335-336 ◽  
pp. 429-432 ◽  
Author(s):  
Xiu Yu Sun ◽  
Fa Qiang Xu
Keyword(s):  
Aspect Ratio ◽  
Nanowire Arrays ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Anodic Aluminum ◽  
Au Nanowire ◽  
The Face ◽  
Face Centered ◽  
Xrd Patterns

Highly ordered Cu, Ag and Au nanowire arrays with high aspect ratio and highly dense self-supporting nanowire patterns of copper group were successfully prepared using cyclic voltammetry with the assistance of anodic aluminum oxide (AAO) template. The X-ray diffraction (XRD) patterns of the metal nanowries were indexed to the face-centered cubic structure. The field emission scanning electron microscope (FE-SEM) results demonstrated that the length of nanowire could be controlled by changing the electrodepositon conditions. The aspect ratio of nanowire arrays can be tuned.

Transparent Conducting TGZO Thin Films Deposited by DC Magnetron Sputtering at Room Temperature

2010 ◽  
Vol 663-665 ◽  
pp. 1041-1044
Author(s):  
Han Fa Liu ◽  
Hua Fu Zhang
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Room Temperature ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
X Ray ◽  
Transparent Conducting ◽  
Average Transmittance ◽  
Co Doped

Transparent conducting Ti-Ga co-doped zinc oxide (TGZO) thin films with high transmittance, low resistivity were firstly prepared on glass substrate by direct current (DC) magnetron sputtering at room temperature. X-ray diffraction (XRD) and scanning electron microscopy (SEM) show that the TGZO films are polycrystalline with a hexagonal structure and have a preferred orientation along the c-axis perpendicular to the substrate. The lowest resistivity obtained in our experiment is 3.95×10-4Ω⋅cm. The average transmittance of the films is over 92% in the range of 400~760 nm.

scholarly journals The Rolling Texture of Cu3Au

Texture ◽  
1974 ◽  
Vol 1 (3) ◽  
pp. 143-150 ◽  
Author(s):  
R. A. Vandermeer ◽  
J. C. Ogle
Keyword(s):  
Room Temperature ◽  
Pure Copper ◽  
Rolling Texture ◽  
Wire Drawing ◽  
Face Centered Cubic ◽  
Long Range Order ◽  
X Ray Diffraction ◽  
X Ray ◽  
Partial Dislocations ◽  
Face Centered

The rolling texture of Cu3Au has been investigated by X-ray diffraction. At room temperature, independently of the degree of long-range order, Cu3Au developed a mixed or “hybrid” texture; it consisted of elements of each of the prototype face-centered cubic textures characterized by pure copper and 70/30 brass. However, on rolling at 77 K the alloy in the disordered state was significantly more “brass-like” than when it was fully ordered. This result may be explained by a stacking fault energy texture reversal analogous to that observed in wire drawing at low SFE. The lack of twinning (or other deformation mechanism such as slip by partial dislocations) in the ordered alloy could be responsible for this reversal.

scholarly journals Cation Distribution in Natural Chromites from Oman

1996 ◽  
Vol 1 (1) ◽  
pp. 55
Author(s):  
Z. Al-Alawi ◽  
A.M. Gismelseed ◽  
A.A. Yousif ◽  
M.A. Worthing ◽  
H.H. Sutherland ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Room Temperature ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Atomic Concentration ◽  
X Ray ◽  
Diffraction Patterns ◽  
Face Centered ◽  
Mössbauer Analysis ◽  
Scanning Electron

Two specimens or natural chromite from the Oman ophiolite were studied using Mossbauer Spectroscopy (MS), X-ray Diffraction (XRD). and Scanning Electron Microscopy (SEM). The diffraction patterns obtained at room temperature showed that the two specimens have a face-centered cubic spinal structure. Their Mossbauer spectra at 295 K. 160 K and 78 K have been fitted to three doublets. assigned to two Fe 2+ at the tetrahedral (A1+,A2) sites and one Fe1+ at the octahedral (B) site. The ferrous-ferric ratio obtained from the Mossbauer analysis together with the atomic concentration derived from the microprobe data are used to derive the chemical formulae for the two specimens. The data also supports also supports  a model of ordered caution distribution in the specimens examined.

Effect of Temperature on Cu-doped p-ZnTe Thin-Films

2015 ◽  
Vol 10 (1) ◽  
pp. 2560-2565
Author(s):  
G. Lastra ◽  
A. Olivas ◽  
J.I. Mejía ◽  
M.A. Quevedo-López
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Effect Of Temperature ◽  
Orthorhombic Structure ◽  
X Ray Diffraction ◽  
Electrical Parameters ◽  
X Ray ◽  
Active Layers ◽  
Xrd Patterns ◽  
Znte Thin Films

In this paper we study the effect of temperature in 150 (±5) and 80 (±5) nm p-ZnTe thin- films immersed in 60 mg Cu(NO3)2-3H2O/150 ml (H2O) for 1 minute, and heated at 200 and 300 °C for 30 minutes. Active layers were deposited by pulsed-laser deposition (PLD) at room temperature. Electrical parameters in un-doped films were around 108 ̶ 109 Ω and these values decreased to ~ 103Ω when the films were immersed in a Cu solution. The Cu-doped samples heated at 300 °C showed a completely homogeneous doping. X-ray diffraction (XRD) patterns showed the orthorhombic structure at 200 and 300 °C.

Effects of thermal annealing on the texture of La0.67Sr0.33MnO3 thin films

2001 ◽  
Vol 16 (7) ◽  
pp. 1887-1889 ◽  
Author(s):  
Lamartine Meda ◽  
LaQuita Kennon ◽  
Cristiane Bacaltchuk ◽  
Hamid Garmestani ◽  
Klaus H. Dahmen
Keyword(s):  
Thin Films ◽  
Vapor Deposition ◽  
Metalorganic Chemical Vapor Deposition ◽  
Chemical Vapor ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Simple Cubic ◽  
Heat Treated ◽  
Face Centered

Thin films of La0.67Sr0.33MnO3 (LSMO) were prepared at 670 °C on LaAlO3 (LAO) and SrTiO3 (STO) substrates by liquid-delivery metalorganic chemical vapor deposition. X-ray diffraction analysis 2¸/¸ and pole figure scans showed that the films are epitaxial with (001)LSMO//(001)LAO and (001)LSMO//(001)STO. The crystal structure of LSMO/LAO was indexed as face-centered cubic with a double cell and LSMO/STO as simple cubic. Electron microscopy revealed square facets and elongated grain features. Films heat-treated between 700 and 800 °C on LAO resulted in a structural change, while those on STO showed an increase in texture.

Thermal Expansions of the Beta and Gamma Phases in a Co–Ni–Fe Superalloy Determined by X-ray Diffraction

2000 ◽  
Vol 15 (8) ◽  
pp. 1719-1723 ◽  
Author(s):  
M. S. Seehra ◽  
C. Cionca ◽  
A. Manivannan
Keyword(s):  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Relative Temperature ◽  
X Ray ◽  
Β Phase ◽  
Abrupt Jump ◽  
Initial Magnetic Susceptibility ◽  
Face Centered ◽  
Two Phases ◽  
Xrd Patterns

Commercially useful multiphase alloy Inconel 783 is made up of Ni(28%), Fe(25%), and Co(35%) with smaller amounts of Cr, Al, Nb, Mo, Ti, C, and Si. In this work, relative temperature variations of the lattice constants a(T)/a0 of the gamma (face-centered-cubic) and beta (body-centered-cubic) phases of this alloy are determined from 97 to 773 K using analyses of their x-ray diffraction (XRD) patterns. Plots of a(T)/a0 for the two phases vary from 1.0 at 97 K to 1.012 at 773 K and show that (i) for T = 500 K, thermal expansion of the β phase is larger than that of the = phase; and (ii) an abrupt jump is observed near 300 K. The appearance of new lines above 700 K in XRD representing Co2CrO4 and CoCr2O4 is interpreted in terms of the oxidation of the γ phase, whereas the β phase is oxidation resistant. The anomalous change in a(T)/a0, observed near 300 K and accompanied by a similar change in the temperature variation of the initial magnetic susceptibility, is not well understood. A brief discussion on the implications of these results is presented.

scholarly journals Effects of Perpendicular Magnetic Field Annealing on the Structural and Magnetic Properties of [Co/Ni]2/PtMn Thin Films

2021 ◽  
Vol 7 (3) ◽  
pp. 38
Author(s):  
Roshni Yadav ◽  
Chun-Hsien Wu ◽  
I-Fen Huang ◽  
Xu Li ◽  
Te-Ho Wu ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Films ◽  
Magnetic Properties ◽  
Photoelectron Spectroscopy ◽  
Perpendicular Magnetic Field ◽  
Face Centered Cubic ◽  
Lattice Image ◽  
X Ray ◽  
Field Annealing ◽  
Face Centered

In this study, [Co/Ni]2/PtMn thin films with different PtMn thicknesses (2.7 to 32.4 nm) were prepared on Si/SiO2 substrates. The post-deposition perpendicular magnetic field annealing (MFA) processes were carried out to modify the structures and magnetic properties. The MFA process also induced strong interlayer diffusion, rendering a less sharp interface between Co and Ni and PtMn layers. The transmission electron microscopy (TEM) lattice image analysis has shown that the films consisted of face-centered tetragonal (fct) PtMn (ordered by MFA), body-centered cubic (bcc) NiMn (due to intermixing), in addition to face-centered cubic (fcc) Co, Ni, and PtMn phases. The peak shift (2-theta from 39.9° to 40.3°) in X-ray diffraction spectra also confirmed the structural transition from fcc PtMn to fct PtMn after MFA, in agreement with those obtained by lattice images in TEM. The interdiffusion induced by MFA was also evidenced by the depth profile of X-ray photoelectron spectroscopy (XPS). Further, the magnetic properties measured by vibrating sample magnetometry (VSM) have shown an increased coercivity in MFA-treated samples. This is attributed to the presence of ordered fct PtMn, and NiMn phases exchange coupled to the ferromagnetic [Co/Ni]2 layers. The vertical shift (Mshift = −0.03 memu) of the hysteresis loops is ascribed to the pinned spins resulting from perpendicular MFA processes.

Structure and Conductivity of Iodine-Doped C60 Thin Films

1994 ◽  
Vol 359 ◽  
Author(s):  
Jun Chen ◽  
Haiyan Zhang ◽  
Baoqiong Chen ◽  
Shaoqi Peng ◽  
Ning Ke ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Room Temperature ◽  
Conductivity Measurements ◽  
X Ray Diffraction ◽  
Temperature Conductivity ◽  
Room Temperature Conductivity ◽  
X Ray ◽  
Thermally Activated ◽  
Order Of Magnitude

ABSTRACTWe report here the results of our study on the properties of iodine-doped C60 thin films by IR and optical absorption, X-ray diffraction, and electrical conductivity measurements. The results show that there is no apparent structural change in the iodine-doped samples at room temperature in comparison with that of the undoped films. However, in the electrical conductivity measurements, an increase of more that one order of magnitude in the room temperature conductivity has been observed in the iodine-doped samples. In addition, while the conductivity of the undoped films shows thermally activated temperature dependence, the conductivity of the iodine-doped films was found to be constant over a fairly wide temperature range (from 20°C to 70°C) exhibiting a metallic feature.

Stacking Faults in a High Nitrogen Face-Centered-Cubic Phase Formed on Nitrogen-Modified Austenitic Stainless Steel

2008 ◽  
Vol 373-374 ◽  
pp. 318-321
Author(s):  
J. Liang ◽  
M.K. Lei
Keyword(s):  
Stainless Steel ◽  
Plasma Source ◽  
Peak Shift ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
High Nitrogen ◽  
X Ray ◽  
Peak Asymmetry ◽  
Face Centered

Effects of stacking faults in a high nitrogen face-centered-cubic phase (γΝ) formed on plasma source ion nitrided 1Cr18Ni9Ti (18-8 type) austenitic stainless steel on peak shift and peak asymmetry of x-ray diffraction were investigated based on Warren’s theory and Wagner’s method, respectively. The peak shift from peak position of the γΝ phase is ascribed to the deformation faults density α, while the peak asymmetry of the γΝ phase is characterized by deviation of the center of gravity of a peak from the peak maximum (Δ C.G.) due to the twin faults density β. The calculated peak positions of x-ray diffraction patterns are consistent with that measured for plasma source ion nitrided 1Cr18Ni9Ti stainless steel.

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