scholarly journals Synthesis, Characterization, and Electrical Properties of Poly(azophenyleneazo-2,4-diamino-1,5-phenylenes)

2014 ◽  
Vol 2014 ◽  
pp. 1-6
Author(s):  
A. H. Durgaryan ◽  
R. H. Arakelyan ◽  
N. A. Durgaran ◽  
E. E. Matinyan

Poly(azophenyleneazo-2,4-diamino-1,5-phenylenes) were synthesized via diazotization of m- and p-phenylenediamine and azocoupling with m-phenylenediamine. It is found that, simultaneously, dihydrobenztriazolic units were formed as a result of cyclization reaction between amino and azo groups located in ortho position to each other. Oxidation of poly(azo-p-phenyleneazo-2,4-diamino-1,5-phenylene) was carried out and new polymer with benzotriazolic units in the main polymer chain was obtained. The conductivities of obtained polymers doped with iodine were increased with doping levels increase from 10−9–5 × 10−8 S/m to 0,1–0,6 S/m.

2012 ◽  
Vol 50 (15) ◽  
pp. 3030-3038 ◽  
Author(s):  
Stanislaw Penczek ◽  
Krzysztof Kaluzynski ◽  
Julia Pretula

2014 ◽  
Vol 52 (11) ◽  
pp. 1614-1621 ◽  
Author(s):  
Julia Pretula ◽  
Krzysztof Kaluzynski ◽  
Stanislaw Penczek

Polymer ◽  
2010 ◽  
Vol 51 (6) ◽  
pp. 1501-1506 ◽  
Author(s):  
Itaru Natori ◽  
Shizue Natori ◽  
Hiroyuki Sekikawa ◽  
Tomoyuki Takahashi ◽  
Kenji Ogino ◽  
...  

2008 ◽  
Vol 2 (2) ◽  
pp. 105-109
Author(s):  
Nafdey Renuka ◽  
◽  
Kelkar Deepali ◽  

Polyaniline is synthesized chemically under the influence of low magnetic field of intensity 1KGauss. The effect of magnetic field during the synthesis process causes enhancement of electrical conductivity by two orders of magnitude. This increased electrical conductivity depends on the polymer chain ordering, as well as structure and morphology of the reported polymer.


Author(s):  
F. M. Ross ◽  
R. Hull ◽  
D. Bahnck ◽  
J. C. Bean ◽  
L. J. Peticolas ◽  
...  

We describe an investigation of the electrical properties of interfacial dislocations in strained layer heterostructures. We have been measuring both the structural and electrical characteristics of strained layer p-n junction diodes simultaneously in a transmission electron microscope, enabling us to correlate changes in the electrical characteristics of a device with the formation of dislocations.The presence of dislocations within an electronic device is known to degrade the device performance. This degradation is of increasing significance in the design and processing of novel strained layer devices which may require layer thicknesses above the critical thickness (hc), where it is energetically favourable for the layers to relax by the formation of misfit dislocations at the strained interfaces. In order to quantify how device performance is affected when relaxation occurs we have therefore been investigating the electrical properties of dislocations at the p-n junction in Si/GeSi diodes.


Author(s):  
A.M. Letsoalo ◽  
M.E. Lee ◽  
E.O. de Neijs

Semiconductor devices require metal contacts for efficient collection of electrical charge. The physics of these metal/semiconductor contacts assumes perfect, abrupt and continuous interfaces between the layers. However, in practice these layers are neither continuous nor abrupt due to poor nucleation conditions and the formation of interfacial layers. The effects of layer thickness, deposition rate and substrate stoichiometry have been previously reported. In this work we will compare the effects of a single deposition technique and multiple depositions on the morphology of indium layers grown on (100) CdTe substrates. The electrical characteristics and specific resistivities of the indium contacts were measured, and their relationships with indium layer morphologies were established.Semi-insulating (100) CdTe samples were cut from Bridgman grown single crystal ingots. The surface of the as-cut slices were mechanically polished using 5μm, 3μm, 1μm and 0,25μm diamond abrasive respectively. This was followed by two minutes immersion in a 5% bromine-methanol solution.


Author(s):  
J.P.S. Hanjra

Tin mono selenide (SnSe) with an energy gap of about 1 eV is a potential material for photovoltaic applications. Various authors have studied the structure, electronic and photoelectronic properties of thin films of SnSe grown by various deposition techniques. However, for practical photovoltaic junctions the electrical properties of SnSe films need improvement. We have carried out investigations into the properties of flash evaporated SnSe films. In this paper we report our results on the structure, which plays a dominant role on the electrical properties of thin films by TEM, SEM, and electron diffraction (ED).Thin films of SnSe were deposited by flash evaporation of SnSe fine powder prepared from high purity Sn and Se, onto glass, mica and KCl substrates in a vacuum of 2Ø micro Torr. A 15% HF + 2Ø% HNO3 solution was used to detach SnSe film from the glass and mica substrates whereas the film deposited on KCl substrate was floated over an ethanol water mixture by dissolution of KCl. The floating films were picked up on the grids for their EM analysis.


Physica ◽  
1954 ◽  
Vol 3 (7-12) ◽  
pp. 834-844 ◽  
Author(s):  
H FRITZSCHE ◽  
K LARKHOROVITZ

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