scholarly journals Thin Film Heater for Removable Volatile Protecting Coatings

2013 ◽  
Vol 2013 ◽  
pp. 1-3
Author(s):  
Abid Karim
Keyword(s):  
Thin Film ◽  
Aluminum Surface ◽  
Space Astronomy ◽  
Far Ultraviolet

Freshly coated aluminum mirrors have excellent reflectivity at far ultraviolet wavelengths. However, reflectivity rapidly degrades when the mirror surfaces are exposed to atmosphere. In order to avoid this problem, freshly coated aluminum surface can be protected by over-coating of a removable volatile protecting coating. This protecting coating can be re-evaporated by controlled heating or by some other methods when required. This type of removable coating has immediate application in UV space astronomy. The purpose of this paper is to demonstrate the feasibility of re-evaporation of removable volatile Zn protecting coating using a NiCr thin film heater without affecting the reflection properties of Al mirror surfaces.

Optical properties and quantum efficiency of thin-film alkali halides in the far ultraviolet

2002 ◽  
Vol 41 (13) ◽  
pp. 2532 ◽  
Author(s):  
Juan I. Larruquert ◽  
José A. Méndez ◽  
José A. Aznárez ◽  
Anton S. Tremsin ◽  
Oswald H. W. Siegmund
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Quantum Efficiency ◽  
Alkali Halides ◽  
Far Ultraviolet

Multilayer thin-film design as far-ultraviolet quarterwave retarders

1993 ◽  
Author(s):  
Jongmin Kim ◽  
Muamer Zukic ◽  
Douglas G. Torr ◽  
Michele W. McColgan
Keyword(s):  
Thin Film ◽  
Multilayer Thin Film ◽  
Far Ultraviolet

Rapid low-temperature processing of metal-oxide thin film transistors with combined far ultraviolet and thermal annealing

2014 ◽  
Vol 105 (11) ◽  
pp. 113514 ◽  
Author(s):  
J. Leppäniemi ◽  
K. Ojanperä ◽  
T. Kololuoma ◽  
O.-H. Huttunen ◽  
J. Dahl ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Metal Oxide ◽  
Thermal Annealing ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Low Temperature Processing ◽  
Metal Oxide Thin Film ◽  
Far Ultraviolet

Multilayer thin-film design as far-ultraviolet polarizers

1993 ◽  
Author(s):  
Jongmin Kim ◽  
Muamer Zukic ◽  
Douglas G. Torr
Keyword(s):  
Thin Film ◽  
Multilayer Thin Film ◽  
Far Ultraviolet

AFM Studies on the Effect of Crystalline Interphase on Adhesion of Polyurethane Thin Film to Al Substrate

2010 ◽  
Vol 658 ◽  
pp. 65-68
Author(s):  
Jang Soon Kim ◽  
Ok Hyoung Lee ◽  
Yun Soo Lim
Keyword(s):  
Thin Film ◽  
Bond Strength ◽  
Early Stage ◽  
Aluminum Substrate ◽  
Aluminum Surface ◽  
Crystallite Shape ◽  
Specific Shape ◽  
High Bond ◽  
High Bond Strength ◽  
Spherulite Formation

Polyurethanes crystallized at the aluminum surface, but the crystalline interphase varied with polyol OH number. Early stage of spherulite formation was characterized using AFM after removing amorphous polyurethane. The crystallite shapes of polyurethanes were correlated with the bond strength measured from indentation debonding. Interestingly, the samples involving non-specific shape of crystallites displayed high bond strength, while the polyurethanes with rod-like crystallite poorly adhered to aluminum substrate. Although crystallite shape did not unequivocally relate to bond strength, the results propose that there is a probable correlation.

Clean Electron Microscope Substrate Films Used for Micrometeorite Collection and Study

1967 ◽  
Vol 25 ◽  
pp. 366-367
Author(s):  
D. M. Davies ◽  
R. Kemner ◽  
E. F. Fullam
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
High Altitude ◽  
Amyl Acetate ◽  
Temperature Variations ◽  
Film Forming ◽  
Film Specimen ◽  
Particulate Contaminants

All serious electron microscopists at one time or another have been concerned with the cleanliness and freedom from artifacts of thin film specimen support substrates. This is particularly important where there are relatively few particles of a sample to be found for study, as in the case of micrometeorite collections. For the deposition of such celestial garbage through the use of balloons, rockets, and aircraft, the thin film substrates must have not only all the attributes necessary for use in the electron microscope, but also be able to withstand rather wide temperature variations at high altitude, vibration and shock inherent in the collection vehicle's operation and occasionally an unscheduled violent landing.Nitrocellulose has been selected as a film forming material that meets these requirements yet lends itself to a relatively simple clean-up procedure to remove particulate contaminants. A 1% nitrocellulose solution is prepared by dissolving “Parlodion” in redistilled amyl acetate from which all moisture has been removed.

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