scholarly journals Truncated Life Test Plans for Economic Reliability Based on Four-Parametric Burr Distribution

2013 ◽  
Vol 2013 ◽  
pp. 1-6
Author(s):  
Ramkumar Balan ◽  
Sajana Kunjunni

Burr distribution is considered as a probability model for the lifetime of products. Reliability test plans are those sampling plans in which items from a lot are put to test to make conclusions on the estimate of life, and hence acceptance or rejection of the submitted lot is done. A test plan designs the termination time of the experiment and the termination number for a given sample size and producer’s risk. Tables and graphs were provided for certain specific values of designs, and it is useful to verify the optimum reliability test plan realized by Burr distributions.

2016 ◽  
Vol 40 (3) ◽  
Author(s):  
G. Srinivasa Rao

In this paper, double acceptance sampling plans are developed for a truncated life test, when the lifetime of an item follows the Marshall-Olkin extended exponential distribution. The probability of acceptance is calculated for different consumer’s confidence levels fixing the producer’s risk at 0.05. The probability of acceptance and the producer’s risk are explained by means of examples.


Author(s):  
Bander Al-Zahrani

Apart from other probability models, Dagum distribution is also an effective probability distribution that can be considered for studying the lifetime of a product/material. Reliability test plans deal with sampling procedures in which items are put to test to decide from the life of the items to accept or reject a submitted lot. In the present study, a reliability test plan is proposed to determine the termination time of the experiment for a given sample size, producers risk and termination number when the quantity of interest follows Dagum distribution. In addition to that, a comparison between the proposed and the existing reliability test plans is carried out with respect to time of the experiment. In the end, an example illustrates the results of the proposed plan.


2006 ◽  
Vol 49 (2) ◽  
pp. 93-103
Author(s):  
Jianxiong Chen ◽  
Wenzhen Yan

Reliability tests are mandatory to evaluate new products prior to their release. The proper determination of a reliability test plan is crucial because an erroneous test plan can be very costly and misleading. This paper describes a probability-based method of designing a reliability demonstration test plan using both field customer usage and historical bench life test data. Statistical distribution analysis, Monte Carlo simulation (MCS) technique, and zero-failure test method are integrated into the probability-based method to create test plans that can more accurately evaluate product reliabilities for the required product service life using a small number of test samples.


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