scholarly journals Properties of Natural Rubber-Based Composites Containing Fullerene

2012 ◽  
Vol 2012 ◽  
pp. 1-8 ◽  
Author(s):  
Omar A. Al-Hartomy ◽  
Ahmed A. Al-Ghamdi ◽  
Falleh Al-Salamy ◽  
Nikolay Dishovsky ◽  
Desislava Slavcheva ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dielectric Properties ◽  
Natural Rubber ◽  
Elastomeric Matrix ◽  
Transmission Electron ◽  
Aging Resistance ◽  
Filler Dispersion ◽  
Scanning Electron

In this study the influence of fullerenes in concentrations from 0.5 to 1.5 phr on both the vulcanization characteristics of the compounds and physicomechanical, dynamic, and dielectric properties and thermal aging resistance of nanocomposites on the basis of natural rubber has been investigated. The effect of the filler dispersion in the elastomeric matrix has been also investigated. Neat fullerene and the composites comprising it have been studied and characterized by scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

STUDY OF HYDROTHERMAL SYNTHESIS AND PROPERTIES OF Bi2Fe4O9

2010 ◽  
Vol 03 (03) ◽  
pp. 173-176 ◽  
Author(s):  
YIBO WANG ◽  
HUAJUN SUN ◽  
JING ZHOU ◽  
BO LI ◽  
CHENGYONG ZHANG ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Transformation ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Impedance Analyzer ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Highly oriented Bi2Fe4O9 nanosheets can be fabricated with Fe(NO3)3 ⋅ 9H2O and Bi(NO3)3 ⋅ 5H2O using the low-temperature hydrothermal method. The as-prepared powders are characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM) and high-resolution transmission electron microscopy (HRTEM), which exhibit an excellent orientation along the (00l) planes. The leakage current density and dielectric properties of the nanosheet samples are measured by Radiant Precision Workstation and HP4291B Impedance Analyzer, respectively. The effects of NaOH concentration on the phase transformation, sheet size and morphologies of the Bi2Fe4O9 crystallites are studied in this paper.

Study of Structural, Surface Morphological and Dielectric Properties of Cu-Doped Tin Oxide Nanoparticles

2015 ◽  
Vol 34 ◽  
pp. 91-97 ◽  
Author(s):  
Suresh Sagadevan
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dielectric Properties ◽  
Wavelength Region ◽  
Average Crystalline Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Cu doped SnO2nanoparticles were prepared using the chemical precipitation method. The Cu doped SnO2nanoparticles have been characterized by powder X-ray diffraction (XRD) analysis, Scanning electron microscopy (SEM), elemental dispersive X-ray (EDX) analysis, Transmission electron microscopy (TEM), UV-Visible absorption spectrum and Dielectric studies. The average crystalline size of Cu doped SnO2nanoparticles was calculated from the X-ray diffraction (XRD) pattern and found to be 15 nm and it was further confirmed from the transmission electron microscopy (TEM) studies. The scanning electron microscopy (SEM) analysis showed that the nanoparticles agglomerate forming spherical-shaped particles. The elemental composition of Cu doped SnO2nanoparticles was analyzed by Energy Dispersive X-ray (EDX) spectrum. The optical absorption study clearly shows that the absorption edge shift towards the higher wavelength region. The dielectric properties of Cu doped SnO2nanoparticles have been studied in the different frequency at different temperatures. The dielectric constant and dielectric loss of the Cu doped SnO2nanoparticles decreases with increase in frequency. Cu doped SnO2nanoparticles were prepared using the chemical precipitation method. The Cu doped SnO2nanoparticles have been characterized by powder X-ray diffraction (XRD) analysis, Scanning electron microscopy (SEM), elemental dispersive X-ray (EDX) analysis, Transmission electron microscopy (TEM), UV-Visible absorption spectrum and Dielectric studies. The average crystalline size of Cu doped SnO2nanoparticles was calculated from the X-ray diffraction (XRD) pattern and found to be 15 nm and it was further confirmed from the transmission electron microscopy (TEM) studies. The scanning electron microscopy (SEM) analysis showed that the nanoparticles agglomerate forming spherical-shaped particles. The elemental composition of Cu doped SnO2nanoparticles was analyzed by Energy Dispersive X-ray (EDX) spectrum. The optical absorption study clearly shows that the absorption edge shift towards the higher wavelength region. The dielectric properties of Cu doped SnO2nanoparticles have been studied in the different frequency at different temperatures. The dielectric constant and dielectric loss of the Cu doped SnO2nanoparticles decreases with increase in frequency.

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

Comparative Study of the Fine Morphology of Sensory Receptors in Aspidogaster conchicola and Cotylaspis insignis

1972 ◽  
Vol 30 ◽  
pp. 150-151
Author(s):  
Venita F. Allison ◽  
J. E. Ubelaker ◽  
J. H. Martin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Nervous System ◽  
Osmic Acid ◽  
Sensory Receptors ◽  
Transmission Electron ◽  
Sensory Structures ◽  
Fine Morphology ◽  
Scanning Electron

It has been suggested that parasitism results in a reduction of sensory structures which concomitantly reflects a reduction in the complexity of the nervous system. The present study tests this hypothesis by examining the fine morphology and the distribution of sensory receptors for two species of aspidogastrid trematodes by transmission and scanning electron microscopy. The species chosen are an ectoparasite, Cotylaspis insignis and an endoparasite, Aspidogaster conchicola.Aspidogaster conchicola and Cotylaspis insignis were obtained from natural infections of clams, Anodonta corpulenta and Proptera purpurata. The specimens were fixed for transmission electron microscopy in phosphate buffered paraformaldehyde followed by osmic acid in the same buffer, dehydrated in an ascending series of ethanol solutions and embedded in Epon 812.

Anisotropic Membranes as Substrates for Sem

1976 ◽  
Vol 34 ◽  
pp. 444-445
Author(s):  
Thomas P. Turnbull ◽  
W. F. Bowers
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Flow ◽  
Polymer Chemistry ◽  
Surface Porosity ◽  
Transmission Electron ◽  
Pore Texture ◽  
Spongy Layer ◽  
Scanning Electron

Until recently the prime purposes of filters have been to produce clear filtrates or to collect particles from solution and then remove the filter medium and examine the particles by transmission electron microscopy. These filters have not had the best characteristics for scanning electron microscopy due to the size of the pores or the surface topography. Advances in polymer chemistry and membrane technology resulted in membranes whose characteristics make them versatile substrates for many scanning electron microscope applications. These polysulphone type membranes are anisotropic, consisting of a very thin (0.1 to 1.5 μm) dense skin of extremely fine, controlled pore texture upon a much thicker (50 to 250μm), spongy layer of the same polymer. Apparent pore diameters can be controlled in the range of 10 to 40 A. The high flow ultrafilters which we are describing have a surface porosity in the range of 15 to 25 angstrom units (0.0015-0.0025μm).

Digital imaging: When should one take the plunge?

1996 ◽  
Vol 54 ◽  
pp. 602-603
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
New Instrument ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.

scholarly journals Digital Imaging: When Should One Take The Plunge?

1997 ◽  
Vol 5 (4) ◽  
pp. 14-15
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
High Quality ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quality positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).

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