scholarly journals Investigation on the Optical and Surface Morphology of Conjugated Polymer MEH-PPV:ZnO Nanocomposite Thin Films

2012 ◽  
Vol 2012 ◽  
pp. 1-4 ◽  
Author(s):  
Nurul Zayana Yahya ◽  
Mohamad Rusop
Keyword(s):  
Thin Films ◽  
Zno Nanoparticles ◽  
Conjugated Polymer ◽  
Weight Percent ◽  
Phenylene Vinylene ◽  
Sem Images ◽  
X Ray ◽  
Glass Substrates ◽  
Red Color ◽  
Nanocomposite Thin Films

Thin films of red color poly(2-methoxy-5(2′-ethylhexyloxy)-phenylene vinylene) (MEH-PPV) containing different weight percent of ZnO nanoparticles were obtained by spin-coating techniques. The MEH-PPV:ZnO solutions were spin coated onto silicon and glass substrates. The spun MEH-PPV:ZnO thin films were then used to investigate optical properties by using ultraviolet-visible spectrometer (UV-Vis) and photoluminescence spectrophotometer (PL). The morphologies were investigated by using field emission scanning electron microscopy (FESEM), while the identification of ZnO in the final product was determined by using energy-dispersive X-ray spectroscopy (EDS). The UV-Vis absorption band increases, while the optical bandgap decreases when the amount of ZnO nanoparticles increases. ZnO nanoparticles apparently have no effect on the conjugation segments of MEH-PPV. PL spectra show that the emission peak increases and slightly red shift as ZnO concentration increases. Based on SEM images of MEH-PPV:ZnO nanocomposite thin films, ZnO nanoparticles form agglomerated regions.

Optical and Structural Properties of MEH-PPV: ZnO Nanocomposites

2011 ◽  
Vol 364 ◽  
pp. 124-128
Author(s):  
Zayana Yahya Nurul ◽  
Mohamad Rusop Mahmood
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
Zno Nanoparticles ◽  
Blue Shift ◽  
Weight Percent ◽  
Absorption Bands ◽  
Sem Images ◽  
Glass Substrates ◽  
Red Color ◽  
Slight Blue Shift

Thin films of conducting unsaturated polymer of red color poly [2-methoxy-5(2’-ethyl hexyloxy)-phenylene vinylene] (MEH-PPV) containing different weight percent of ZnO nanoparticles were deposited by spin coating techniques. The MEH-PPV: ZnO solutions were spin coated onto 2 × 2 cm glass substrates. The spun MEH-PPV: ZnO thin films were used for investigating the optical properties by using Ultraviolet-Visible Spectrometer (UV-Vis). The structural properties of the thin films were investigated by Scanning Electron Microscopy (SEM). For MEH-PPV: ZnO nanocomposites, the UV-Vis absorption bands increases and showing slight blue shift compared to the pure MEH-PPV. The optical bandgap of MEH-PPV: ZnO nanocomposites slightly decrease when the amount of ZnO nanoparticles increase. ZnO nanoparticles apparently no effect on conjugation segments of MEH-PPV. From the SEM images of MEH-PPV: ZnO nanocomposites, it can be seen that ZnO nanoparticles form agglomerated regions.

scholarly journals Synthesis of ZnO thin film by chemical spray pyrolysis using its nano powder

2021 ◽  
Vol 49 (1) ◽  
Author(s):  
Reem S. Khaleel ◽  
◽  
Mustafa Sh. Hashim ◽  
Samer Gh. Majeed ◽  
◽  
...  
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Chemical Spray Pyrolysis ◽  
Sem Images ◽  
X Ray ◽  
Spray Process ◽  
Glass Substrates ◽  
Chemical Spray ◽  
Zno Powders ◽  
Deposited Films

The deposition of metal oxides powder faces several problems, including poor adhesion to the bases deposited on them, the presence of many cracks, poor thickness control, and other disadvantages. The current study gives a new and simple idea to deposit thin films using two ZnO powders with nano and microparticle sizes on glass substrates. This was done by transforming the powders to Zinc acetate and then using chemical spray pyrolysis to deposit ZnO thin films. Scanning electron microscope (SEM) images showed that the prepared film from the nanopowder (ZnONano) lost the independence of powder’s nanoparticles and became a homogeneous film with nano projections. But the deposited one from the micro powder (ZnOMicro) had both nanorods and nanoplates. The different shapes and sizes of ZnO particles in ZnOMicro powder were disappeared after the Spray process. The two deposited films were homogeneous, crack-free and there were controllable thicknesses during the deposition. X-ray spectroscopy (EDS) was used to measure weights and atomic percentages of elements for the deposited films. The structures of the deposited films were approximately identical as the X-ray diffraction (XRD) technique showed. The optical properties of these two films were studied and their parameters were measured and calculated.

scholarly journals Titanium-Doped P-Type WO3 Thin Films for Liquefied Petroleum Gas Detection

Nanomaterials ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 727 ◽  
Author(s):  
Yuzhenghan He ◽  
Xiaoyan Shi ◽  
Kyle Chen ◽  
Xiaohong Yang ◽  
Jun Chen
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Hole Concentration ◽  
Liquefied Petroleum Gas ◽  
Sem Images ◽  
X Ray ◽  
Glass Substrates ◽  
P Type ◽  
Wo3 Thin Films

Gas sensors are an important part of smart homes in the era of the Internet of Things. In this work, we studied Ti-doped P-type WO3 thin films for liquefied petroleum gas (LPG) sensors. Ti-doped tungsten oxide films were deposited on glass substrates by direct current reactive magnetron sputtering from a W-Ti alloy target at room temperature. After annealing at 450 °C in N2 ambient for 60 min, p-type Ti-doped WO3 was achieved for the first time. The measurement of the room temperature Hall-effect shows that the film has a resistivity of 5.223 × 103 Ωcm, a hole concentration of 9.227 × 1012 cm−3, and mobility of 1.295 × 102 cm2V−1s−1. X-Ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) analyses reveal that the substitution of W6+ with Ti4+ resulted in p-type conductance. The scanning electron microscope (SEM) images show that the films consist of densely packed nanoparticles. The transmittance of the p-type films is between 72% and 84% in the visible spectra and the optical bandgap is 3.28 eV. The resistance increased when the films were exposed to the reducing gas of liquefied petroleum gas, further confirming the p-type conduction of the films. The p-type films have a quick response and recovery behavior to LPG.

Multilayer Synthesized CuInSi Composite Film by Magnetron Sputtering

2011 ◽  
Vol 383-390 ◽  
pp. 2770-2773
Author(s):  
Jian Sheng Xie ◽  
Ping Luan ◽  
Jin Hua Li
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Composite Film ◽  
Film Surface ◽  
Nanocomposite Films ◽  
Crystal Phase ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Nanocomposite Thin Films

Using magnetron sputtering technology, the CuInSi nanocomposite thin films were prepared by multilayer synthesized method. The structure of CuInSi nanocomposite films was detected by X-ray diffraction (XRD), the peak of main crystal phase is at 2θ=42.180°; the morphology of the film surface was studied by SEM. The SEM images show that the crystalline of the film prepared by multilayer synthesized method was granulated, differed from the needle shape which was the morphology of the CuInSi film prepared by magnetron co-sputtering.

Study of microstructural, morphological and optical properties of sprayed vanadium doped ZnO nanoparticles

2019 ◽  
Vol 87 (1) ◽  
pp. 10301 ◽  
Author(s):  
Hajar Ftouhi ◽  
Zouhair El Jouad ◽  
Mohammed Jbilou ◽  
Mustafa Diani ◽  
Mohammed Addou
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Low Cost ◽  
Band Gap Energy ◽  
Visible Range ◽  
Sem Images ◽  
Optical Window ◽  
X Ray ◽  
Glass Substrates ◽  
Average Transmittance

In this paper, transparent conducting thin films based on both undoped and vanadium (V) doped zinc oxide Zn1−xVx O (x = 3, 5, 7 at.%), were studied. The thin films were prepared using a simple low cost deposition technique called spray pyrolysis (SP). The layers were deposited onto preheated glass substrates at 450 °C. The effect of vanadium on the microstructural, the morphological and the optical properties of ZnO material was carried out using X-ray diffractometer (XRD), micro Raman spectroscope, scanning electron microscope (SEM), energy dispersive analysis by X-ray (EDX) and UV-Vis-NIR spectrophotometer. We have demonstrated that doping with 3 at.% of V enhances the crystallinity of the films by estimating the grain size value, the dislocation density and the residual stress. Also, the SEM images have demonstrated that the vanadium concentrations do effect in the thin films morphology, from hexagonal-shaped grains to rounded crystals for higher doping concentrations. The optical analysis revealed that doping with 3 at.% of vanadium shows a remarkable enhancement in the average transmittance in the visible range 89% and in the band gap energy (3.3 eV). Moreover, the disorder inside the samples was estimated using Urbach equation. Therefore, the microstructural, the morphological and the optical results approve that doping with 3 at.% of V in ZnO lattices gives interesting results for the optical window material for solar cells application.

scholarly journals Morphological, Structural, and Optical Bandgap Characterization of Extracted ZnO Nanoparticles from Commercial Paste

2021 ◽  
Vol 2021 ◽  
pp. 1-7
Author(s):  
Mahmoud Nabil ◽  
I. V. Perez-Quintana ◽  
M. Acosta ◽  
J. A. Mendez-Gamboa ◽  
R. Castro-Rodriguez
Keyword(s):  
Zno Nanoparticles ◽  
Average Crystallite Size ◽  
Hexagonal Wurtzite Structure ◽  
Xrd Analysis ◽  
Zno Nps ◽  
Sem Images ◽  
Visible Absorption ◽  
X Ray ◽  
Glass Substrates ◽  
Crystal Volume

ZnO nanoparticles (NPs) were extracted from a commercial paste in both colloidal and precipitate forms. The Zetasizer analysis performed on the colloid showed ZnO NPs ranging from ∼30 nm to ∼100 nm. Thin films of ZnO were deposited on glass substrates by spin-coating technique from a mixture of the extracted colloid and precipitate. The scanning electron microscope (SEM) images showed uniformly arranged, mesoporous, and nanostructured ZnO particles of different shapes, with an estimated film thickness of 0.67 μm. Analysis by energy dispersive X-ray spectroscopy (EDS) and X-ray diffraction analysis (XRD) confirmed the presence of ZnO in the films, with no impurities or remnants of other materials. The XRD analysis showed a polycrystalline nature of the films and identified a pure phase formation of the hexagonal wurtzite structure. The average crystallite size calculated from the diffraction peaks is ∼43.25 nm. The calculated crystal tensile strain is 1.954 × 10−3, which increases the crystal volume by 0.728% compared with the crystal volume of standard ZnO. The calculated crystal parameters are a = b = 3.258 Å and c = 5.217 Å. The calculated dislocation density (d) and bond length Zn–O (L) are 5.35 × 10−4 nm−2 and 2.695 Å, respectively. Ultraviolet-visible absorption spectra showed an optical band gap of ∼3.80 eV.

X- ray diffraction and dielectric properties of PbSe thin films

2019 ◽  
Vol 15 (34) ◽  
pp. 1-14
Author(s):  
Bushra A. Hasan
Keyword(s):  
Thin Films ◽  
Thermal Activation ◽  
Thermal Evaporation ◽  
Thermal Activation Energy ◽  
Dielectric Constants ◽  
Conductivity Measurements ◽  
X Ray Diffraction ◽  
Thermal Evaporation Method ◽  
X Ray ◽  
Glass Substrates

Lead selenide PbSe thin films of different thicknesses (300, 500, and 700 nm) were deposited under vacuum using thermal evaporation method on glass substrates. X-ray diffraction measurements showed that increasing of thickness lead to well crystallize the prepared samples, such that the crystallite size increases while the dislocation density decreases with thickness increasing. A.C conductivity, dielectric constants, and loss tangent are studied as function to thickness, frequency (10kHz-10MHz) and temperatures (293K-493K). The conductivity measurements confirm confirmed that hopping is the mechanism responsible for the conduction process. Increasing of thickness decreases the thermal activation energy estimated from Arhinus equation is found to decrease with thickness increasing. The increase of thickness lead to reduce the polarizability α while the increasing of temperature lead to increase α.

Phase configuration, nanostructure, and mechanical behaviors in Ti-B-C-N thin films

2009 ◽  
Vol 24 (8) ◽  
pp. 2520-2527 ◽  
Author(s):  
Yonghao Lu ◽  
Junping Wang ◽  
Yaogen Shen ◽  
Dongbai Sun
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Solid Solution Hardening ◽  
Mechanical Behaviors ◽  
Additional Increase ◽  
N Content ◽  
X Ray ◽  
Nanocomposite Thin Films ◽  
The Cost ◽  
Nano Grains

A series of Ti-B-C-N thin films were deposited on Si (100) at 500 °C by incorporation of different amounts of N into Ti-B-C using reactive unbalanced dc magnetron sputtering in an Ar-N2 gas mixture. The effect of N content on phase configuration, nanostructure evolution, and mechanical behaviors was studied by x-ray diffraction, x-ray photoelectron spectroscopy, Raman spectroscopy, high-resolution transmission electron microscopy, and microindentation. It was found that the pure Ti-B-C was two-phased quasi-amorphous thin films comprising TiCx and TiB2. Incorporation of a small amount of N not only dissolved into TiCx but also promoted growth of TiCx nano-grains. As a result, nanocomposite thin films of nanocrystalline (nc-) TiCx(Ny) (x + y < 1) embedded into amorphous (a-) TiB2 were observed until nitrogen fully filled all carbon vacancy lattice (at that time x + y = 1). Additional increase of N content promoted formation of a-BN at the cost of TiB2, which produced nanocomposite thin films of nc-Ti(Cx,N1-x) embedded into a-(TiB2, BN). Formation of BN also decreased nanocrystalline size. Both microhardness and elastic modulus values were increased with an increase of N content and got their maximums at nanocomposite thin films consisting of nc-Ti(Cx,N1-x) and a-TiB2. Both values were decreased after formation of BN. Residual compressive stress value was successively decreased with an increase of N content. Enhancement of hardness was attributed to formation of nanocomposite structure and solid solution hardening.

scholarly journals Reactive Dual Magnetron Sputtering: A Fast Method for Preparing Stoichiometric Microcrystalline ZnWO4 Thin Films

Surfaces ◽  
2021 ◽  
Vol 4 (2) ◽  
pp. 106-114
Author(s):  
Yannick Hermans ◽  
Faraz Mehmood ◽  
Kerstin Lakus-Wollny ◽  
Jan P. Hofmann ◽  
Thomas Mayer ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Fast Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Post Annealing ◽  
Rf Signal ◽  
First Time

Thin films of ZnWO4, a promising photocatalytic and scintillator material, were deposited for the first time using a reactive dual magnetron sputtering procedure. A ZnO target was operated using an RF signal, and a W target was operated using a DC signal. The power on the ZnO target was changed so that it would match the sputtering rate of the W target operated at 25 W. The effects of the process parameters were characterized using optical spectroscopy, X-ray diffraction, and scanning electron microscopy, including energy dispersive X-ray spectroscopy as well as X-ray photoelectron spectroscopy. It was found that stoichiometric microcrystalline ZnWO4 thin films could be obtained, by operating the ZnO target during the sputtering procedure at a power of 55 W and by post-annealing the resulting thin films for at least 10 h at 600 °C. As FTO coated glass substrates were used, annealing led as well to the incorporation of Na, resulting in n+ doped ZnWO4 thin films.

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