scholarly journals Extended Finite Element Method with Simplified Spherical Harmonics Approximation for the Forward Model of Optical Molecular Imaging

2012 ◽  
Vol 2012 ◽  
pp. 1-10 ◽  
Author(s):  
Wei Li ◽  
Huangjian Yi ◽  
Qitan Zhang ◽  
Duofang Chen ◽  
Jimin Liang

An extended finite element method (XFEM) for the forward model of 3D optical molecular imaging is developed with simplified spherical harmonics approximation (SPN). In XFEM scheme ofSPNequations, the signed distance function is employed to accurately represent the internal tissue boundary, and then it is used to construct the enriched basis function of the finite element scheme. Therefore, the finite element calculation can be carried out without the time-consuming internal boundary mesh generation. Moreover, the required overly fine mesh conforming to the complex tissue boundary which leads to excess time cost can be avoided. XFEM conveniences its application to tissues with complex internal structure and improves the computational efficiency. Phantom and digital mouse experiments were carried out to validate the efficiency of the proposed method. Compared with standard finite element method and classical Monte Carlo (MC) method, the validation results show the merits and potential of the XFEM for optical imaging.

Author(s):  
Elena Benvenuti ◽  
Nicola Orlando

AbstractWe propose a formulation for tracking general crack paths in elastodamaging materials without mesh adaptivity and broadening of the damage band. The idea is to treat in a unified way both the damaging process and the development of displacement discontinuities by means of the regularized finite element method. With respect to previous authors’ contributions, a novel damage evolution law and an original crack tracking framework are proposed. We face the issue of mesh objectivity through several two-dimensional tests, obtaining smooth crack paths and reliable structural results.


Mathematics ◽  
2021 ◽  
Vol 9 (5) ◽  
pp. 507
Author(s):  
K. Yakoubi ◽  
S. Montassir ◽  
Hassane Moustabchir ◽  
A. Elkhalfi ◽  
Catalin Iulian Pruncu ◽  
...  

The work investigates the importance of the K-T approach in the modelling of pressure cracked structures. T-stress is the constant in the second term of the Williams expression; it is often negligible, but recent literature has shown that there are cases where T-stress plays the role of opening the crack, also T-stress improves elastic modeling at the point of crack. In this research study, the most important effects of the T-stress are collected and analyzed. A numerical analysis was carried out by the extended finite element method (X-FEM) to analyze T-stress in an arc with external notch under internal pressure. The different stress method (SDM) is employed to calculate T-stress. Moreover, the influence of the geometry of the notch on the biaxiality is also examined. The biaxiality gave us a view on the initiation of the crack. The results are extended with a comparison to previous literature to validate the promising investigations.


Author(s):  
Do-Jun Shim ◽  
Mohammed Uddin ◽  
Sureshkumar Kalyanam ◽  
Frederick Brust ◽  
Bruce Young

The extended finite element method (XFEM) is an extension of the conventional finite element method based on the concept of partition of unity. In this method, the presence of a crack is ensured by the special enriched functions in conjunction with additional degrees of freedom. This approach also removes the requirement for explicitly defining the crack front or specifying the virtual crack extension direction when evaluating the contour integral. In this paper, stress intensity factors (SIF) for various crack types in plates and pipes were calculated using the XFEM embedded in ABAQUS. These results were compared against handbook solutions, results from conventional finite element method, and results obtained from finite element alternating method (FEAM). Based on these results, applicability of the ABAQUS XFEM to stress intensity factor calculations was investigated. Discussions are provided on the advantages and limitations of the XFEM.


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