Monte Carlo simulations for the evaluation of various influence factors on projections in computed tomography

2010 ◽  
Vol 25 (2) ◽  
pp. 165-168
Author(s):  
B. Chyba ◽  
M. Mantler ◽  
M. Reiter
Keyword(s):  
Computed Tomography ◽  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
National Laboratory ◽  
Light Yield ◽  
Thin Layers ◽  
Detector Response ◽  
X Rays ◽  
Los Alamos ◽  
X Ray

This paper presents Monte Carlo simulations considering all stages of the creation process of two-dimensional projections in a computed tomography (CT) device: excitation of angle dependent X-ray spectra within the X-ray tube using results from a previous study [Chyba et al. (2008). Powder Diffr. 23, 150–153]; interaction of these X-rays and secondary photoelectrons with a simple inhomogeneous sample; and interaction of X-rays and photoelectrons with the components (thin layers) of a matrix scintillation detector. The simulations were carried out by using custom software running on up to 50 nodes of a computer cluster. Comparative calculations were also made by using the software package MCNP [Booth et al. (2003). MCNP—A general Monte Carlo N-particle transport code, Report LAUR 03-1987, Los Alamos National Laboratory, Los Alamos, NM]. Tube spectra were calculated with algorithms proposed by Ebel [(2006). Adv. X-Ray Anal. 49, 267–273]. Measurements for the chosen setup made with an available CT device were in relatively good agreement with calculated results. It was shown that good knowledge of the tube spectra is of importance, but most differences between resulting projections and measurements are caused by uncertainties concerning detector response due to light yield of the scintillator and to internal scattering effects within the thin detector layers which lead to spreading of a detected point signal within the detector matrix into neighboring matrix elements.

scholarly journals A hydroxyapatite phantom material for the calibration of in vivo x-ray fluorescence systems of bone strontium and lead quantification

2021 ◽  
Author(s):  
Eric Da Silva
Keyword(s):  
Monte Carlo ◽  
Soft Tissue ◽  
Monte Carlo Simulations ◽  
Calibration Procedure ◽  
X Rays ◽  
X Ray ◽  
Total Phosphate Concentration ◽  
High Concentrations ◽  
Phantom Material

A hydroxyaptite [HAp; Ca5(PO4)3OH] phantom material was developed with the goal of improving the calibration protocol of the 125I-induced in vivo X-ray fluorescence (IVXRF) system of bone strontium quantification with further application to other IVXRF bone metal quantification systems, particulary those associated with bone lead quantification. It was found that calcium can be prepared pure of inherent contamination from strontium (and other elements) through a hydroxide precipitation producing pure Ca(OH)2, thereby, allowing for the production of a blank phantom which has not been available previously. The pure Ca(OH)2 can then be used for the preparation of pure CaHPO4 ⋅ 2H2O. A solid state pure HAp phantom can then be prepared by reaction of Ca(OH)2 and CaHPO4 ⋅ 2H2O mixed as to produce a Ca/P mole ratio of 1.67, that in HAp and the mineral phase of bone, in the presence of a setting solution prepared as to raise the total phosphate concentration of the solution by increasing the solubility CaHPO4 ⋅ 2H2O and thereby precipitating HAp. The procedure can only be used to prepare phantoms in which doping with the analyte does not disturb the Ca/P ratio substantially. In cases in which phantoms are to be prepared with high concentrations of strontium, the cement mixture can be modified as to introduce strontium in the form of Sr(OH)2 ⋅ 8H2O as to maintain a (Ca + Sr)/P ratio of 1.67. It was found by both X-ray diffraction spectrometry and Raman spectroscopy studies that strontium substitutes for calcium as in bone when preparing phantoms by this route. The necessity for the blank bone phantoms was assessed through the first blank bone phantom measurement and Monte Carlo simulations. It was found that for the 125I-induced IVXRF system of bone strontium quantification, the source, 125I brachytherapy seeds may be contributing coherently and incoherently scattered zirconium X-rays to the measured spectra, thereby requiring the use of the blank bone phantom as a means of improving the overall quantification methodology. Monte Carlo simulations were employed to evaluate any improvement by the introduction of HAp phantoms into the coherent normalization-based calibration procedure. It was found that HAp phantoms remove the need for a coherent conversion factor (CCF) thereby potentially increasing accuracy of the quantification. Further, it was found that in order for soft tissue attenuation corrections to be possible using spectroscopic information alone, HAp along with a suitable soft tissue surrogate material need to be employed. The HAp phantom material was used for the evaluations of portable X-ray analyzer systems for their potential for IVXRF quantification of lead and strontium with a focus on a comparison between tungsten, silver and rhodium target systems. Silver and rhodium target X-ray tube systems were found to be comparable for this quantification.

scholarly journals Linearly polarized X-ray fluorescence computed tomography based on a Thomson scattering light source: a Monte Carlo study

2020 ◽  
Vol 27 (3) ◽  
pp. 737-745
Author(s):  
Zhijun Chi ◽  
Yingchao Du ◽  
Wenhui Huang ◽  
Chuanxiang Tang
Keyword(s):  
Computed Tomography ◽  
Monte Carlo ◽  
Compton Scattering ◽  
Light Source ◽  
Thomson Scattering ◽  
X Rays ◽  
X Ray ◽  
Pile Up ◽  
Linearly Polarized ◽  
Scattering Light

A Thomson scattering X-ray source can provide quasi-monochromatic, continuously energy-tunable, polarization-controllable and high-brightness X-rays, which makes it an excellent tool for X-ray fluorescence computed tomography (XFCT). In this paper, we examined the suppression of Compton scattering background in XFCT using the linearly polarized X-rays and the implementation feasibility of linearly polarized XFCT based on this type of light source, concerning the influence of phantom attenuation and the sampling strategy, its advantage over K-edge subtraction computed tomography (CT), the imaging time, and the potential pulse pile-up effect by Monte Carlo simulations. A fan beam and pinhole collimator geometry were adopted in the simulation and the phantom was a polymethyl methacrylate cylinder inside which were gadolinium (Gd)-loaded water solutions with Gd concentrations ranging from 0.2 to 4.0 wt%. Compared with the case of vertical polarization, Compton scattering was suppressed by about 1.6 times using horizontal polarization. An accurate image of the Gd-containing phantom was successfully reconstructed with both spatial and quantitative identification, and good linearity between the reconstructed value and the Gd concentration was verified. When the attenuation effect cannot be neglected, one full cycle (360°) sampling and the attenuation correction became necessary. Compared with the results of K-edge subtraction CT, the contrast-to-noise ratio values of XFCT were improved by 2.03 and 1.04 times at low Gd concentrations of 0.2 and 0.5 wt%, respectively. When the flux of a Thomson scattering light source reaches 1013 photons s−1, it is possible to finish the data acquisition of XFCT at the minute or second level without introducing pulse pile-up effects.

Monte Carlo Calculation of X-Rays Deposited Energy in CdZnTe Detector

2007 ◽  
Vol 555 ◽  
pp. 141-146 ◽  
Author(s):  
Srboljub J. Stanković ◽  
M. Petrović ◽  
M. Kovačević ◽  
A. Vasić ◽  
P. Osmokrović ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Calculation ◽  
Absorbed Dose ◽  
Detector Response ◽  
X Rays ◽  
X Ray ◽  
Cdznte Detector ◽  
Deposited Energy ◽  
Photon Direction ◽  
Cdznte Detectors

CdZnTe detectors have been employed in diagnostic X-ray spectroscopy. This paper presents the Monte Carlo calculation of X-ray deposited energy in a CdZnTe detector for different energies of photon beam. In incident photon direction, the distribution of absorbed dose as deposited energy in detector is determined. Based on the dependence of the detector response on the thickness and different Zn fractions, some conclusions about changes of the material characteristics could be drawn. Results of numerical simulation suggest that the CdZnTe detector could be suitable for X-ray low energy.

Monte Carlo Simulation of the X-Ray Fluorescence Spectra from Multielement Homogeneous and Heterogeneous Samples

1986 ◽  
Vol 30 ◽  
pp. 121-132 ◽  
Author(s):  
A. M. Yacout ◽  
R. P. Gardner ◽  
K. Verghese
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Model ◽  
Pulse Height ◽  
Computation Time ◽  
Cubic Splines ◽  
Photon Spectrum ◽  
Detector Response ◽  
X Rays ◽  
Simple Assumption ◽  
X Ray

AbstractA Monte Carlo model that predicts the entire photon, spectrum for energy-dispersive X-ray fluorescence (EDXRF) analyzers excited by radio-isotope sources from multielement homogeneous samples is developed and demonstrated. The components of the photon spectrum include: (1) the and Kα and Kβ characteristic primary, secondary and tertiary X rays from both the unscattered and scattered source photons, (2) the characteristic X rays excited by other characteristic X rays that have been scattered, and (3) the scattered source photons from single, double, and multiple scatters in the sample.The computer code NCSMCXF based on this model has been developed. It is capable of handling up to 20 elements per sample and provides a detailed account of the intensities of the X rays and backscattered source photons per unit source decay as well as a summary of the relative intensities from all elements present in the sample. Cubic splines are used within the code for photoelectric and total scattering cross sections and two-variable cubic splines for angular coherent and incoherent scattering distributions for efficiency in both computation time and storage. The code also provides the pulse-height spectrum of the sample by using the appropriate Si(Li) detector response function. The Monte Carlo predictions for benchmark experimental results on two alloy samples of known composition indicate that the model is very accurate. This approach is capable of replacing most of the experimental work presently required in EDXRF quantitative analysis.A previous Monte Carlo model that uses the simple assumption of spherical homogeneous particles to approximate sample heterogeneities has been modified to improve the computer execution time requirements for the heterogeneous sample case. A new technique for photon tracking in this medium is used and reduces the computation time requirement by half.

Modelling Photoelectron Effects In X-Ray Lithography

1993 ◽  
Vol 306 ◽  
Author(s):  
L. E. Ocola ◽  
F. Cerrina
Keyword(s):  
Monte Carlo ◽  
Spatial Distribution ◽  
Kinetic Energy ◽  
Monte Carlo Simulations ◽  
Energy Range ◽  
X Rays ◽  
X Ray ◽  
Atomic Species ◽  
Energy Dependent ◽  
X Ray Absorption

AbstractThe study of photoelectron effects in X-ray Lithography motivates the need for modeling codes to simulate these effects to have an estimate of the influence of x-ray generated photoelectrons in the exposure of resists. We have performed a series of Monte Carlo simulations to study the spatial distribution of photoelectrons in a resist, PMMA, and parametrized this distribution with a set of energy-dependent gaussians for monochromatic X-rays within an energy range of 0.5 KeV to 2.5 KeV. We discuss the effects of the the redistribution of the photoelectron kinetic energy as a function of the electrons generated by the x-ray absorption in various atomic species.

Secondary Fluorescence Correction for Characteristic and Bremsstrahlung X-Rays Using Monte Carlo X-ray Depth Distributions Applied to Bulk and Multilayer Materials

2019 ◽  
Vol 25 (1) ◽  
pp. 92-104 ◽  
Author(s):  
Yu Yuan ◽  
Hendrix Demers ◽  
Samantha Rudinsky ◽  
Raynald Gauvin
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Hybrid Model ◽  
Analytical Models ◽  
X Rays ◽  
Monte Carlo Program ◽  
X Ray ◽  
Secondary Fluorescence ◽  
Depth Distributions ◽  
Multilayer Materials

AbstractSecondary fluorescence effects are important sources of characteristic X-ray emissions, especially for materials with complicated geometries. Currently, three approaches are used to calculate fluorescence X-ray intensities. One is using Monte Carlo simulations, which are accurate but have drawbacks such as long computation times. The second one is to use analytical models, which are computationally efficient, but limited to specific geometries. The last approach is a hybrid model, which combines Monte Carlo simulations and analytical calculations. In this article, a program is developed by combining Monte Carlo simulations for X-ray depth distributions and an analytical model to calculate the secondary fluorescence. The X-ray depth distribution curves of both the characteristic and bremsstrahlung X-rays obtained from Monte Carlo program MC X-ray allow us to quickly calculate the total fluorescence X-ray intensities. The fluorescence correction program can be applied to both bulk and multilayer materials. Examples for both cases are shown. Simulated results of our program are compared with both experimental data from the literature and simulation data from PENEPMA and DTSA-II. The practical application of the hybrid model is presented by comparing with the complete Monte Carlo program.

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