F-33 Filtered Two Color X-ray Microbeams for Enhancement in Sensitivity of Light Elements

2009 ◽  
Vol 24 (2) ◽  
pp. 168-168
Author(s):  
S. Hayakawa ◽  
K. Izawa ◽  
T. Hirokawa
Keyword(s):  
Light Elements ◽  
X Ray ◽  
F 33

scholarly journals Possible Pitfalls in the Analysis of Minerals and Loose Materials by Portable XRF, and How to Overcome Them

Minerals ◽  
2020 ◽  
Vol 11 (1) ◽  
pp. 33
Author(s):  
Valérie Laperche ◽  
Bruno Lemière
Keyword(s):  
Fluorescence Spectroscopy ◽  
Laboratory Data ◽  
Data Sets ◽  
Light Elements ◽  
Portable Xrf ◽  
X Ray ◽  
Protective Films ◽  
The Matrix ◽  
Valuable Complement ◽  
Physical Effects

Portable X-ray fluorescence spectroscopy is now widely used in almost any field of geoscience. Handheld XRF analysers are easy to use, and results are available in almost real time anywhere. However, the results do not always match laboratory analyses, and this may deter users. Rather than analytical issues, the bias often results from sample preparation differences. Instrument setup and analysis conditions need to be fully understood to avoid reporting erroneous results. The technique’s limitations must be kept in mind. We describe a number of issues and potential pitfalls observed from our experience and described in the literature. This includes the analytical mode and parameters; protective films; sample geometry and density, especially for light elements; analytical interferences between elements; physical effects of the matrix and sample condition, and more. Nevertheless, portable X-ray fluorescence spectroscopy (pXRF) results gathered with sufficient care by experienced users are both precise and reliable, if not fully accurate, and they can constitute robust data sets. Rather than being a substitute for laboratory analyses, pXRF measurements are a valuable complement to those. pXRF improves the quality and relevance of laboratory data sets.

HIGH-RESOLUTION PIXE USING BRAGG’S SPECTROMETER

1991 ◽  
Vol 01 (03) ◽  
pp. 251-258 ◽  
Author(s):  
M. TERASAWA
Keyword(s):  
High Resolution ◽  
Heavy Ions ◽  
X Rays ◽  
Light Elements ◽  
Element Analysis ◽  
X Ray ◽  
Peak Intensity ◽  
Moderate Energy ◽  
Practical Analysis ◽  
Wavelength Selectivity

K, L, and M X-rays in the wavelengths between 6Å and 130Å generated by the bombardment of 200 keV protons and other heavy ions were measured by means of a wavelength dispersive Bragg’s spectrometer. The X-ray peak intensity was fairly high in general, while the background was very low. The technique was favorably applied to a practical analysis of several light elements (Be, B, C, N, O, and F). Use of moderate-energy heavy ions considering the wavelength selectivity in X-ray generation was effective for the element analysis. The high-resolution spectrometry in the analytical application of ion-induced X-ray generation was found to be useful for the study of fine electronic structure, e.g. satellite and hypersatellite X-ray study, and of the chemical state of materials.

Heterogeneity Effects in X-Ray Analysis*

1961 ◽  
Vol 5 ◽  
pp. 335-354 ◽  
Author(s):  
Fernand Claisse ◽  
Claude Samson
Keyword(s):  
Grain Size ◽  
Size Effect ◽  
Mathematical Treatment ◽  
Grain Size Effect ◽  
Light Elements ◽  
X Ray Diffraction ◽  
Limited Region ◽  
X Ray ◽  
Grain Sizes ◽  
Heterogeneity Effects

AbstractA fundamental quantitative treatment of the heterogeneity effects in X-ray fluorescence has been made. The theory predicts that the grain-size effect appears only in a limited region of grain sizes which depends on the wavelength of the primary radiation and the nature of the compounds in the mixture. With monochromatic radiation, the fluorescence intensity showed increase or decrease by a factor of a few units as grain size is decreased, A factor as large as 12, the theoretical value, has been observed in one particular experiment. Usually the grain-size effect can be eliminated by intensive grinding. For the light elements fine grinding is disastrous if long wavelengths are used. By an appropriate choice of the wavelength it is possible to eliminate the effect even without grinding. The mathematical treatment also predicts, but less rigorously, a grain-size effect in X-ray diffraction.The effect on the fluorescence intensities by changes in the chemical composition of the grains that contain the fluorescent element is predicted by the theory.These findings are discussed in relation to the analysis of elements when polychromatic beams are used.

Production of light elements on a low-mass secondary in a soft X-ray transient

2008 ◽  
Author(s):  
Shin-ichiro Fujimoto ◽  
Ryuichi Matsuba ◽  
Kenzo Arai ◽  
Takuma Suda ◽  
Takaya Nozawa ◽  
...  
Keyword(s):  
Light Elements ◽  
X Ray ◽  
Low Mass

Novel Features Incorporated in a New Automatic X-Ray Fluorescence Spectrometer

1960 ◽  
Vol 4 ◽  
pp. 538-546
Author(s):  
Peter B. Whitcomb
Keyword(s):  
Angular Velocity ◽  
Scintillation Counter ◽  
Light Elements ◽  
Strip Chart Recorder ◽  
Correct Position ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Chart Recorder ◽  
Continuous Scanning ◽  
Fluorescence Spectrometer

AbstractA flat-crystal spectrometer is described that is fully evacuated to permit analysis of light elements. A uniselector in conjunction with a programing unit allows the crystal to be moved to any series of angles with stopping intervals as close as 0.01°. Detectors are a scintillation counter and a flow proportional counter driven at twice the angular velocity of the crystal to maintain them in correct position, A further detector is used to monitor the primary X-ray beam. Programing is achieved by means of a patchboard, and each board allows up to 20 elements to be measured at one time and in a sequence as desired, Pinal results appear in tabular forrn on an electric typewriter. Provisions are also provided for continuous scanning, the X-ray spectrum being plotted on a strip chart recorder. The sample is brought into position with a slide arranged so that the spectrometer may be kept continually evacuated and only a small pocket of air need be pumped. Alternately, helium may be used with resultant low consumption per sample.

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