D-58 Nanostructure Analysis of Metallic Materials by Coherent X-ray Diffraction Microscopy

2008 ◽  
Vol 23 (2) ◽  
pp. 177-177
Author(s):  
Y. Takahashi ◽  
H. Furukawa ◽  
H. Kubo ◽  
K. Yamauchi ◽  
Y. Nishino ◽  
...  
Keyword(s):  
Metallic Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy

Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

1994 ◽  
Vol 376 ◽  
Author(s):  
M. Vrána ◽  
P. Klimanek ◽  
T. Kschidock ◽  
P. Lukáš ◽  
P. Mikula
Keyword(s):  
High Resolution ◽  
Neutron Diffraction ◽  
Stacking Faults ◽  
Metallic Materials ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Neutron Diffractometer ◽  
Residual Strains ◽  
Good Agreement

ABSTRACTInvestigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

Methods for obtaining superresolution images in coherent x-ray diffraction microscopy

2007 ◽  
Vol 76 (3) ◽  
Author(s):  
Yukio Takahashi ◽  
Yoshinori Nishino ◽  
Tetsuya Ishikawa
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy

X-Ray Diffraction Microscopy by an Electronic Streak Camera System

1988 ◽  
Vol 27 (Part 1, No. 7) ◽  
pp. 1331-1334 ◽  
Author(s):  
Takahiro Kojima ◽  
Toshiyuki Noguchi ◽  
Tomoya Ogawa
Keyword(s):  
Streak Camera ◽  
X Ray Diffraction ◽  
Camera System ◽  
X Ray ◽  
Diffraction Microscopy
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