Rietveld refinement of ternary compound Gd117Fe52Ge112

2007 ◽  
Vol 22 (4) ◽  
pp. 312-315 ◽  
Author(s):  
Wei He ◽  
Jiliang Zhang ◽  
Lingmin Zeng
Keyword(s):  
Rietveld Refinement ◽  
Ternary Compound ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Figure Of Merit ◽  
Rietveld Method ◽  
Lattice Parameter ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray

A new ternary compound Gd117Fe52Ge112 has been successfully synthesized and studied by means of X-ray powder diffraction technique. Gd117Fe52Ge112 crystallizes in a cubic Tb117Fe52Ge112-type structure with space group Fm3m(#225) and lattice parameter a=28.7680(1) Å. Crystal structure of Gd117Fe52Ge112 has been successfully refined using the Rietveld method from X-ray diffraction data. The R-factors for the Rietveld refinement are Rp=0.099 and Rwp=0.128. X-ray powder diffraction data with the figure of merit F30 of 80.4(30) are also reported.

Crystal Structure of the New Compound TbCo0.67Ga1.33

2015 ◽  
Vol 1089 ◽  
pp. 102-106
Author(s):  
Liu Qing Liang ◽  
Wen Jun Shen ◽  
Ling Min Zeng ◽  
Cai Min Huang
Keyword(s):  
Crystal Structure ◽  
Rietveld Refinement ◽  
Ternary Compound ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Type ◽  
Powder Diffraction Data ◽  
Space Group ◽  
X Ray

A new ternary compound TbCo0.67Ga1.33 was discovered and studied by means of X-ray powder diffraction technique. The crystal structure of the new compound was refined by using Rietveld method from X-ray powder diffraction data. This compound crystallizes in the orthorhombic with the CeCu2 structure type( space group Imma, a = 0.43384(6) nm, b = 0.70193(1) nm, c = 0.75617(1) nm, Z = 4, and Dcalc = 8.512 g/cm3 ). The Rietveld refinement results were Rp = 0.0996, Rwp = 0.1277.

Rietveld Refinement of the BaTiO3 from X-Ray Powder Diffraction

2009 ◽  
Vol 79-82 ◽  
pp. 593-596
Author(s):  
Feng Sun ◽  
Yan Sheng Yin
Keyword(s):  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structural Parameters ◽  
Ferroelectric Ceramic ◽  
Powder Diffraction Data ◽  
Ceramic Powders ◽  
Space Group ◽  
X Ray

The ferroelectric ceramic BaTiO3 was synthesized at 1000 °C for 5 h. The structure of the system under study was refined on the basis of X-ray powder diffraction data using the Rietveld method. The system crystallizes in the space group P4mm（99）. The refinement of instrumental and structural parameters led to reliable values for the Rp, Rwp and Rexp.We use the TOPAS software of Bruker AXS to refine this ceramic powders and show its conformation

Structure Refinements of the Layered Intergrowth Phases SbIIISbV x A 1−x TiO6 (x≃0, A = Ta, Nb) Using Synchrotron X-ray Powder Diffraction Data

1997 ◽  
Vol 53 (6) ◽  
pp. 861-869 ◽  
Author(s):  
C. D. Ling ◽  
J. G. Thompson ◽  
S. Schmid ◽  
D. J. Cookson ◽  
R. L. Withers
Keyword(s):  
Single Crystal ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Homologous Series ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
Synchrotron Source ◽  
X Ray ◽  
The Family

The structures of the layered intergrowth phases SbIIISb^{\rm V}_xAl-xTiO6 (x \simeq 0, A = Ta, Nb) have been refined by the Rietveld method, using X-ray diffraction data obtained using a synchrotron source. The starting models for these structures were derived from those of Sb^{\rm III}_3Sb^{\rm V}_xA 3−xTiO14 (x = 1.26, A = Ta and x = 0.89, A = Nb), previously solved by single-crystal X-ray diffraction. There were no significant differences between the derived models and the final structures, validating the approach used to obtain the models and confirming that the n = 1 and n = 3 members of the family, Sb^{\rm III}_nSb^{\rm V}_xA n−xTiO4n+2 are part of a structurally homologous series.

X-Ray Powder Diffraction Data and Crystal Refinement of Ternary Compound Ti4ZrSi3

2020 ◽  
Vol 841 ◽  
pp. 99-102
Author(s):  
Liu Qing Liang ◽  
Yan Ying Wei ◽  
De Gui Li
Keyword(s):  
Ternary Compound ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Structure Type ◽  
Hexagonal Structure ◽  
Powder Diffraction Data ◽  
Tungsten Electrode ◽  
X Ray

Ternary compound Ti4ZrSi3 was prepared by arc melting using a non-consumable tungsten electrode under argon atmosphere, then annealed at 1023K for 30 days, the X-ray powder diffraction data of Ti4ZrSi3 was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed and structure refinement by using Rietveld method indicate that the Ti4ZrSi3 compound crystallizes in the hexagonal structure, space group P6/mcm (No.193) with Mn5Si3 structure type, a=b=7.5759(3) Ǻ, c=5.2162(2) Ǻ, V=259.28Ǻ3, Z=2, ρx=4.779g cm-3, the Smith–Snyder FOM F30=148.7(0.0064, 46) and the intensity ratio RIR=1.37. The Rietveld refinement results were Rp = 0.0836, Rwp= 0.1092.

X-ray powder diffraction data for compound DyNiSn

1997 ◽  
Vol 12 (3) ◽  
pp. 134-135
Author(s):  
Liangqin Nong ◽  
Lingmin Zeng ◽  
Jianmin Hao
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Figure Of Merit ◽  
Room Temperature ◽  
Unit Cell ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
Space Group ◽  
X Ray ◽  
Diffraction Patterns

The compound DyNiSn has been studied by X-ray powder diffraction. The X-ray diffraction patterns for this compound at room temperature are reported. DyNiSn is orthorhombic with lattice parameters a=7.1018(1) Å, b=7.6599(2) Å, c=4.4461(2) Å, space group Pna21 and 4 formula units of DyNiSn in unit cell. The Smith and Snyder Figure-of-Merit F30 for this powder pattern is 26.7(0.0178,63).

Powder X-ray diffraction study of synthetic PdSn

2006 ◽  
Vol 21 (4) ◽  
pp. 307-309 ◽  
Author(s):  
František Laufek ◽  
Anna Vymazalová ◽  
František Laufek ◽  
Jakub Plášil
Keyword(s):  
Diffraction Study ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Crystallographic Data ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray

Improved X-ray powder diffraction data for synthetic PdSn are reported. Powder diffraction data were collected with a laboratory X-ray source (CuKα) for Rietveld refinement. Refined crystallographic data for PdSn (orthorhombic, Pnma) are a=6.1388(4), b=3.89226(3), c=6.3377(4) Å, V=151.43(2) Å3, Z=4, and Dx=9.87 g∕cm3.

Rietveld Structure Refinement of the Apophyllite Crystals from Deccan Basalt Plateau Using X-ray Powder Diffraction Data

2020 ◽  
Vol 70 (12) ◽  
pp. 4248-4254
Keyword(s):  
Crystal Structure ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
X Rays ◽  
Powder Diffraction Data ◽  
Deccan Basalt ◽  
X Ray ◽  
Basalt Plateau

The crystal structure of a rare sample of natroapophyllite from Pune district (western India) located in the Deccan Basalt Plateau has been refined using X-Ray powder diffraction data and the Rietveld method. The Rietveld refinement was carried out using the computer program Diffracplus TOPAS 4.1. The pseudo-Voigt (pV) profile function was used for the fit of the peaks. The Rietveld refinement of the analyzed sample in space group Pnnm (No.58): a=8.94771 Å, b=8.98013 Å, c=15.78878 Å, Z=2, confirm the basic natroapophyllite structure. The chemical composition of the apophyllite crystals from Pune region (India) was determined by EDX analysis. The paper presents a new set of the unit cell parameters and fractional coordinates that define the natroapophyllite crystal structure. The quality of the sample analyzed was pristine, the sample being collected from an association of apophyllite-stilbite crystals of centimetric dimensions. Keywords: natroapophyllite, crystal structure, X-rays diffraction, EDX, Rietveld method

Rietveld refinement of the ranciéite structure using synchrotron powder diffraction data

2008 ◽  
Vol 23 (1) ◽  
pp. 10-14 ◽  
Author(s):  
Jeffrey E. Post ◽  
Peter J. Heaney ◽  
Andreas Ertl
Keyword(s):  
Crystal Structure ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
Octahedral Sheet ◽  
X Ray ◽  
Synchrotron Powder Diffraction ◽  
The Mean

Rietveld refinement using synchrotron powder X-ray diffraction data of the ranciéite, Ca0.19K0.01(Mn4+0.91◻0.09)O2⋅0.63H2O, crystal structure reveals significant differences from that reported previously. The interlayer H2O molecules occupy sites halfway between the Mn,O octahedral sheets. The Mn sites in the octahedral sheets have 10% vacancies, and the mean Mn–O distance indicates that all Mn is tetravalent (Mn4+). The interlayer Ca cations are located above and below the Mn vacancies and are octahedrally coordinated to three O2 atoms in the octahedral sheet and three H2O molecules in the interlayer.

Rietveld refinement of the crystal structure of α-CoSO4

1993 ◽  
Vol 8 (1) ◽  
pp. 54-56 ◽  
Author(s):  
Peter C. Burns ◽  
Frank C. Hawthorne
Keyword(s):  
Crystal Structure ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
Orthorhombic Space Group ◽  
Space Group ◽  
X Ray

The crystal structure of α-CoSO4 has been refined by the Rietveld method from X-ray powder diffraction data. The structure is orthorhombic, space group Pnma, a = 8.6127(4), b = 6.7058(3), c = 4.7399(2) Å, V = 273.75(3) Å3. Final RB = 2.41%, RP = 5.24%, RWP=6.66%, RWP (expected) =5.74% (WP =weighted profile). The structure consists of edge-sharing octahedral chains parallel to [010] interconnected by SO4 tetrahedra.

Crystallographic study of ternary ordered skutterudite IrGe1.5Se1.5

2010 ◽  
Vol 25 (3) ◽  
pp. 247-252 ◽  
Author(s):  
F. Laufek ◽  
J. Návrátil
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Crystallographic Data ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Crystallographic Study ◽  
Related Phase ◽  
The Ideal

The crystal structure of skutterudite-related phase IrGe1.5Se1.5 has been refined by the Rietveld method from laboratory X-ray powder diffraction data. Refined crystallographic data for IrGe1.5Se1.5 are a=12.0890(2) Å, c=14.8796(3) Å, V=1883.23(6) Å3, space group R3 (No. 148), Z=24, and Dc=8.87 g/cm3. Its crystal structure can be derived from the ideal skutterudite structure (CoAs3), where Se and Ge atoms are ordered in layers perpendicular to the [111] direction of the original skutterudite cell. Weak distortions of the anion and cation sublattices were also observed.

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