Study of YBa2Cu3O7−x reaction kinetics by Rietveld method

2001 ◽  
Vol 16 (1) ◽  
pp. 25-29
Author(s):  
Maria Cristina Comunian Ferraz ◽  
Heitor Cury Basso ◽  
Yvonne P. Mascarenhas
Keyword(s):  
Reaction Kinetics ◽  
Powder Diffraction ◽  
Rietveld Method ◽  
Analysis Procedure ◽  
Powder Diffraction Data ◽  
Phase Determination ◽  
Reaction Route ◽  
Formation Reaction ◽  
X Ray

Using a recent proposed analysis procedure for quantitative phase determination by X-ray powder diffraction, YBa2Cu3O7−x solid state formation reaction kinetics at 900 °C was studied. Although there was the presence of partial amorphous components, it was possible to determine a reaction route for the synthesis of the title compound from X-ray powder diffraction data collected at various stages of the thermal treatment and using the Rietveld method for the quantitative determination of the phase composition

Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data

2004 ◽  
Vol 37 (2) ◽  
pp. 288-294 ◽  
Author(s):  
Nongnuj Muangsin ◽  
Malee Prajuabsook ◽  
Pitiporn Chimsook ◽  
Nuanphun Chantarasiri ◽  
Krisana Siraleartmukul ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Single Crystal ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Structure Determination ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Chitosan Matrix

The structure determination of diclofenac embedded in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data is demonstrated. It reveals that sodium diclofenac, the starting material in the preparation of a controlled-release diclofenac-containing chitosan matrix, changes to diclofenac acid in space groupC2/cin the matrix. Simple methods were employed for handling the sample to obtain X-ray powder diffraction data of sufficiently high quality for the determination of the crystal structure of diclofenac embedded in chitosan. These involved grinding and sieving several times through a micro-mesh sieve to obtain a suitable particle size and a uniformly spherical particle shape. A traditional technique for structure solution from X-ray powder diffraction data was applied. The X-ray diffraction intensities were extracted using Le Bail's method. The structure was solved by direct methods from the extracted powder data and refined using the Rietveld method. For comparison, the single-crystal structure of the same drug was also determined. The result shows that the crystal structure solved from conventional X-ray powder diffraction data is in good agreement with that of the single crystal. The deviations of the differences in bond lengths and angles are of the order of 0.030 Å and 0.639°, respectively.

Crystal structure determination of molecular compounds from conventional powder diffraction data: Trimeric silver(I) 3,5-dimethylpyrazolate

1998 ◽  
Vol 13 (1) ◽  
pp. 35-40 ◽  
Author(s):  
N. Masciocchi ◽  
P. Cairati ◽  
A. Sironi
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Rietveld Method ◽  
Laboratory Data ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Difference Fourier ◽  
Molecular Compounds ◽  
Bidentate Mode

In the absence of single crystals, silver(I) 3,5-dimethylpyrazolate, [Ag(dmpz)]3, has been structurally characterized by ab initio X-ray powder diffraction, using conventional laboratory data. Its crystals are triclinic, P1¯, with a=8.0876(10), b=11.1204(13), c=11.6136(16) Å, α=68.293(6), β=78.350(7), and γ=81.243(6)°. The structure has been solved by Patterson, difference Fourier, and geometrical modeling, and ultimately refined by the Rietveld method down to Rp=0.068, Rwp=0.085, and RF=0.055, for 4300 observations in the 17<2θ<103° range. Each molecule consists of a cyclic, trimeric assembly of Ag(dmpz) fragments, with the dmpz ligand bridging, in the exo-bidentate mode, nonbonded Ag…Ag edges.

Crystallographic study of ternary ordered skutterudite IrGe1.5Se1.5

2010 ◽  
Vol 25 (3) ◽  
pp. 247-252 ◽  
Author(s):  
F. Laufek ◽  
J. Návrátil
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Crystallographic Data ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Crystallographic Study ◽  
Related Phase ◽  
The Ideal

The crystal structure of skutterudite-related phase IrGe1.5Se1.5 has been refined by the Rietveld method from laboratory X-ray powder diffraction data. Refined crystallographic data for IrGe1.5Se1.5 are a=12.0890(2) Å, c=14.8796(3) Å, V=1883.23(6) Å3, space group R3 (No. 148), Z=24, and Dc=8.87 g/cm3. Its crystal structure can be derived from the ideal skutterudite structure (CoAs3), where Se and Ge atoms are ordered in layers perpendicular to the [111] direction of the original skutterudite cell. Weak distortions of the anion and cation sublattices were also observed.

Rietveld Refinement of the BaTiO3 from X-Ray Powder Diffraction

2009 ◽  
Vol 79-82 ◽  
pp. 593-596
Author(s):  
Feng Sun ◽  
Yan Sheng Yin
Keyword(s):  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structural Parameters ◽  
Ferroelectric Ceramic ◽  
Powder Diffraction Data ◽  
Ceramic Powders ◽  
Space Group ◽  
X Ray

The ferroelectric ceramic BaTiO3 was synthesized at 1000 °C for 5 h. The structure of the system under study was refined on the basis of X-ray powder diffraction data using the Rietveld method. The system crystallizes in the space group P4mm（99）. The refinement of instrumental and structural parameters led to reliable values for the Rp, Rwp and Rexp.We use the TOPAS software of Bruker AXS to refine this ceramic powders and show its conformation

Structure Refinements of the Layered Intergrowth Phases SbIIISbV x A 1−x TiO6 (x≃0, A = Ta, Nb) Using Synchrotron X-ray Powder Diffraction Data

1997 ◽  
Vol 53 (6) ◽  
pp. 861-869 ◽  
Author(s):  
C. D. Ling ◽  
J. G. Thompson ◽  
S. Schmid ◽  
D. J. Cookson ◽  
R. L. Withers
Keyword(s):  
Single Crystal ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Homologous Series ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
Synchrotron Source ◽  
X Ray ◽  
The Family

The structures of the layered intergrowth phases SbIIISb^{\rm V}_xAl-xTiO6 (x \simeq 0, A = Ta, Nb) have been refined by the Rietveld method, using X-ray diffraction data obtained using a synchrotron source. The starting models for these structures were derived from those of Sb^{\rm III}_3Sb^{\rm V}_xA 3−xTiO14 (x = 1.26, A = Ta and x = 0.89, A = Nb), previously solved by single-crystal X-ray diffraction. There were no significant differences between the derived models and the final structures, validating the approach used to obtain the models and confirming that the n = 1 and n = 3 members of the family, Sb^{\rm III}_nSb^{\rm V}_xA n−xTiO4n+2 are part of a structurally homologous series.

scholarly journals Pressing the Limits of Rietveld Refinement

1988 ◽  
Vol 41 (2) ◽  
pp. 297 ◽  
Author(s):  
RA Young
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Structure Refinement ◽  
Site Occupancy ◽  
The Other ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Neutron Powder Diffraction Data ◽  
Refinement Method

Two examples are given, one with X-ray data and one with netltron data, of the determination of structural detail which appear to be at the edge of current possibility for the Rietveld structure-refinement method. In the first example, 2�2 wt% Sb substituted in CalO(P04)6F2 was located. X-ray powder diffraction data collected with special attention to intensity precision and scale constancy were used. The problem was solved through comparison of intra-sample site-occupancy ratios between Sb-doped and undoped samples. In the second example, high quality, high resolution neutron powder diffraction data were required. The problem was to distinguish between two subtly different models of kaolinite for which the R-weighted-pattern values differed only by 2 or 3 units in the third digit and, particularly, to understand the basis for the consistent programmatic choice of one of the models (PI) over the other. The answer was found in the calculated and 'observed' intensities for (h+ k)-odd reflections; although they were very small, less than 1% of the intensities of the main reflections, many of them were distinctly nonzero. Even though these reflections were not separately observable, because of overlap and small size, they nonetheless correlated with one model sufficiently better than the other to produce the consistent choice.

scholarly journals Quantitative Phase Analysis of Skarn Rocks by the Rietveld Method Using X-ray Powder Diffraction Data

Minerals ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 894
Author(s):  
Yana Tzvetanova ◽  
Ognyan Petrov ◽  
Thomas Kerestedjian ◽  
Mihail Tarassov
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Rietveld Analysis ◽  
Quantitative Phase Analysis ◽  
Chemical Compositions ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Fine Grained ◽  
Variable Chemical

The Rietveld method using X-ray powder diffraction data was applied to selected skarn samples for quantitative determination of the present minerals. The specimens include garnet, clinopyroxene–garnet, plagioclase–clinopyroxene–wollastonite–garnet, plagioclase–clinopyroxene–wollastonite, plagioclase–clinopyroxene–wollastonite–epidote, and plagioclase–clinopyroxene skarns. The rocks are coarse- to fine-grained and characterized by an uneven distribution of the constituent minerals. The traditional methods for quantitative analysis (point-counting and norm calculations) are not applicable for such inhomogeneous samples containing minerals with highly variable chemical compositions. Up to eight individual mineral phases have been measured in each sample. To obtain the mineral quantities in the skarn rocks preliminary optical microscopy and chemical investigation by electron probe microanalysis (EPMA) were performed for the identification of some starting components for the Rietveld analysis and to make comparison with the Rietveld X-ray powder diffraction results. All of the refinements are acceptable, as can be judged by the standard indices of agreement and by the visual fits of the observed and calculated diffraction profiles. A good correlation between the refined mineral compositions and the data of the EPMA measurements was achieved.

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